Terotest Systems Ltd.
Established in 1982, Terotest continue to provide totally integrated test solutions using proven, 'off the shelf' Automatic Test Equipment (ATE), customised to suit your needs.
- +44 (0) 1462 742499
- +44 (0) 1462 742497
- info@terotest.com
- Eastgate House
Station Road
Ashwell, Hertfordshire SG7 5LG
United Kingdom of Great Britain and Northern Ireland
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Product
PXI Switching Instrumentation
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3U and 6U PXI switching cards including matrix, multiplexer, and RF multiplexer configurations. All Marvin Test Solutions switch cards feature easy to use, reliable, and integration friendly, D-sub style interface connectors, a feature unique to Marvin Test Solutions PXI switching cards.
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Product
In-Circuit Test
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In-circuit test works by checking all components are fitted correctly to the PCB and are within the correct electrical tolerance. In-circuit testers do this by interfacing to the board via a "bed of nails test fixture" and programs can be generated via CAD data. They offer a quick and easy method of checking the manufacture of the board and also offer a reliable and simple fault report.
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Product
Digital Stimulus Response PXI Card
GX5152
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The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.
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Product
8-Slot, 3U PXI Chassis
GX7800
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The GX7800 is a compact, 8-slot PXI chassis that can accommodate up to 7 instruments as well as an embedded 3-slot PXI controller or an external bus controller such as a MXI interface. The GX7800’s compact 3U form-factor occupies only 9 x 18 inches of bench space, making it ideal for benchtop or space constrained applications.
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Product
Wideband Amplifier PXI Card
GX1222
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The GX1222 is a 3U single-slot, PXI-based wideband power amplifier used for signal amplification purposes. Offering excellent fidelity, the GX1222 amplifies signals from DC to over 20 MHz with a fixed gain of x10. Custom gains are also available without compromising signal purity and amplifier performance.
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Product
PXI FPGA Instrumentation
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User programmable 3U PXI FPGA cards for digital and mixed signal applications. Utilizing Altera FPGAs and incorporating a base board / expansion board architecture, our FPGA products offer users the flexibility to create high performance, customized digital and mixed signal instrumentation for specific applications without requiring the use of external interface cards.
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Product
Digital I/O PXI Card
GX5290
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The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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Product
FPGA PXI Card with 80 Channel TTL Buffer Module
GX3609
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The GX3609 is a 3U PXI FPGA card with 80 TTL differential channels. The GX3609 is comprised of a GX3500 FPGA card and the GX3509, 80 channel, differential TTL expansion card.
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Product
PXI Bus Interfaces
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PXI Bus Expanders and PXI Interface Cards for both PXI and PXI Express interfaces.
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Product
ATE Support
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For the last 30 years, Terotest has offered a range of support services, from standard maintenance and calibration to ATE updates and legacy ATE replacement solutions.We provide, repair and exchange ATE modules, fixtures, adaptors and other hardware, as well as offering full maintenance contracts to our customers.
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Product
Test Services
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From Test Consultancy for new projects, to fixture program development, Terotest offer their experience and support to help you every step of the way. Terotest also offer a range of services to the existing ATE User including calibration and System Service options.
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Product
Digital Functional Test
TS-323
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The TS-323 GENASYS platform is a PXI based test system which is designed to address a broad range of mil-aero and mission-critical products that require performance functional testing. The GENASYS offers best in class digital test capabilities which can effectively address the test needs associated with legacy ATE systems including the Teradyne L200/L300, GenRad 2750 and VXI-based digital systems.
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Product
JTAG/Background Debug Mode Test System PXI Card
NX5300
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The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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Product
Bi-Directional Differential-TTL I/O PXI Card
GX5641
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The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) and can be individually set to operate in either conversion or static I/O modes.
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Product
Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
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The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
