Ametek Process Instruments
AMETEK Process Instruments is a worldwide manufacturer of process analyzers and instrumentation.
- 412-828-9040
- 412-826-0399
- 150 Freeport Road
Pittsburgh, PA 15238
United States of America
Categories
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Chilled Mirror Dew Point Analyzers
Chilled-mirror devices measure moisture (water) and/or hydrocarbon dew point temperatures directly, by accurately recording the temperature at which moisture or hydrocarbon condenses on a temperature-controlled surface in contact with the process gas.
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Moisture Analyzer
2850
Establishing a new standard for clean gas moisture analyzers, the 2850 provides exceptional performance, with virtually no interferences, multi-gas compatibility, and on-board measurement verification. The 2850 uses the most accurate trace moisture measurement technology available to deliver an ultrafast response to both increasing and decreasing moisture levels.
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Moisture Analyzer
5830
The 5830 employs a unique non-equilibrium measurement technique that continuously exposes the gas to wet sample gas followed by dry sample gas, enabling a fast response to both rises and falls in moisture concentration.
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Tunable Diode Laser Absorption Spectroscopy
5100HD TDLAS
Using tunable diode laser absorption spectroscopy (TDLAS) technology, the 5100HD can be configured with one or two absorption cells, providing dual stream analysis and/or the measurement of multiple analytes at the same time.
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X-Ray Transmittance
In x-ray transmission (XRT), a sample is irradiated with high-energy x-rays, which are absorbed by sulfur atoms. Measuring the x-rays that pass through the sample provides a measurement of sulfur concentration.
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Moisture Analyzer Series
3050
The 3050 series of moisture analyzers utilizes AMETEK’s proven, accurate quartz crystal microbalance (QCM) technology. Built-in verification provides operators with increased measurement confidence.
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Quartz Crystal Microbalance
Determining moisture concentration in natural gas, industrial gases or process gas is critical to many applications. QCM and electrolytic analyzers deliver fast, reliable and cost-effective measurements that support these processes.
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Gas Gravitometers
Gas gravitometers provide a simple, reliable method of measuring the specific gravity of a gas or analysis of the composition of the process gas when specific gravity can be correlated to composition.
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Zirconia Oxygen Analyzers
Zirconium oxide is a trusted, industry-proven sensing technology for fast and accurate oxygen analysis in a wide range of applications, particularly combustion processes.
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Tunable Diode Laser Absorption Spectroscopy
5100 TDLAS
The feature-rich 5100 TDLAS offers high-sensitivity, analyte-specific, fast-response measurements for critical industrial applications. It features a single absorption cell and integrated sample system in a compact, cost-effective package.
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Gas Chromatographs
Gas chromatographs provide trace-level analysis and monitoring of impurities in a range of ultra-high-purity gas applications, including bulk gases, environmental and research laboratory applications.
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Sulfur Analyzer
682T-HP
Using x-ray-transmission analysis techniques, the 682T-HP has been developed as a fast, sensitive and compact solution for on-line monitoring of the sulfur content in highly viscous hydrocarbons.
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Moisture Analyzer
5800
The 5800 is ideal for high-purity gas production, semiconductor gases, and the production, storage and transmission of olefins. It is suitable for use in industries including hydrocarbon processing, industrial gas and semiconductors.
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Tunable Diode Laser Absorption Spectroscopy
5100P TDLAS Transportable
Using tunable diode laser absorption spectroscopy, the 5100P is a transportable, easy-to-use analyzer optimized to measure either water vapor (H2O) or carbon dioxide (CO2) in select gas streams.
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Tunable Diode Laser
Tunable diode laser absorption spectroscopy (TDLAS) is a fast, accurate, non-contact gas analysis technique that responds quickly to changing analyte concentrations. It is a proven technology free of interferences from other sample stream components.
