JTAG Technologies Inc.
We are a solutions company specializing in PCB assembly testing, fault diagnosis and device programming. We develop innovative products built upon boundary-scan (IEEE Std 1149.x) standards and supply our software and hardware products and services world-wide.
- 877 FOR JTAG
+31 (0) 40 295 0870 - info@jtag.com
- Bogert 6
Eindhoven, 5612 LZ
Netherlands, Kingdom of the
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Product
DataBlaster PCI / PCIE JTAG Boundary-Scan Controller
JT 37x7/PCI
Controller
High speed and performance JTAG Boundary-scan PCI PC plug-in controller for PCI bus slot or PCIe PC plug-in controller for PCI Express bus slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
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Product
TAP Extender
JT 2135
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The JT 2135 allows TAP signals to be extended away from the base JT 2137 (classic pod) by up to 1 meter and retain full pod’s frequency specifications. The active circuitry inside the JT 2135 compensates for the TDO signal return time of the longer interface cable. Multiple JT 2135s can be implemented if a longer extension is required.
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Product
I/O Modules
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JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
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Product
32 Channel Multi-Purpose DIOS/TAP Modules/Interfaces for Spare JT 2148 QuadPOD Transceiver Slot
JT 2149/MPV eMPV
Interface
The JT 2149/MPV and the JT 2149/eMPV are a 32 channel multi purpose DIOS/TAP pod modules/interfaces that can be plugged into any spare JT 2148 QuadPOD transceiver slot. The DIOS channels of these units I/O interface pods enable increased fault coverage and thus improved diagnostic resolution during boundary-scan testing. The principal difference between the two versions is the use of an extended case on the eMPV that allows standard 0.1″ connections to be used to access ths TAP and static IO signals (see tab below)- on the standard /MPV unit these signals are available at the front face 0.05″ connector. The units are fully supported by JTAG Technologies’ development tools. Additional DIOS modules can be serially connected if more parallel access points are required.
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Product
DDC (Dual DIMM Carrier) DIOS Adaptor
JT 2702/DDC
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The JT2702 Digital 256 channel JTAG I/O module. JT2702/DDC (Dual DIMM Carrier) is a DIMM DIOS accessory product. It is typically used in custom test adapters or fixtures where a large number of digital I/O channels are required with a minimum space overhead.
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Product
eDAK For MAC Panel
JT 2147/eDAC for MAC Panel
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The JT 2147/eDAK is a new variant of the JTAG Technologies QuadPOD signal conditioning interface specifically designed for use within a MAC Panel ‘Scout’ mass interconnect interface. The unit integrates both the JT 2148 transceiver circuitry plus four independent, programmable TAP modules (two of type JT 2149 and two of type JT2149/MPV) on a single board that matches the MAC Panel Direct Access Kit (DAK) form factor. Overall this configuration offers four Test Access Ports, 64 Digital IO Scan channels and reconfigurable (SCIL) capabilities
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Product
64-Channel Boundary-Scan Digital I/O Scan Module
JT 2111/MPV DIOS IDC
Digital I/O Module
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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Product
64-Channel Boundary Scan Digital I/O Scan Module
JT 2111/MPV DIOS DIN
Digital I/O Module
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.This JT2111/MPV DIOS module is also available through our webshop.
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Product
19" Rack Mount Chassis, Industrial JTAG-Powered PCB Tester-Programmer 'CombiSystem'
JT 57××/RMIC
Chassis
The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.
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Product
Production Stand-Alone
PSA
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Using PSA, test engineers can build sequences of applications in the built-in AEX (Application EXecutive) manager using if then else goto capabilities. Sequence builders can also include additional capabilities through DOS/Win command line calls, create serial number logged test reports, export tests results to a database etc.. PSA includes drivers for all JTAG Technologies controller hardware past or present.
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Product
Boundary-Scan Controllers
Controller
Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry’s most reliable IEEE 1149.x high speed and performance JTAG controllers, JTAG interfaces and more. To reliably execute your test and programming applications you can choose from a range of different controllers with different performance capabilities and form factors. For use in design, production and manufacturing and service.
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Product
Development Software Suite
JTAG ProVision
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The JTAG ProVision software suite is used to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This professional development tool is fully automated and supports the import of design data from over 30 different EDA and CAM systems. Other key data inputs are JTAG device BSDL models and a large, well-maintained model library describing thousands of non-JTAG devices.
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Product
Pod with Four Test Access Ports for 5v or 3.3V TTL Thresholds
JT 2137
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The JT 2137 pod remains a popular choice for DataBlaster controller installations that require a compact signal conditioning pod embedded within a test fixture. The JT 2137 features four test access ports which together may be set for 5v or 3.3V TTL thresholds, although additional plug-in adapters are available that allow alternative thresholds to be set on a TAP by TAP basis (contact your local sales office for details). The 20-way 0.1″ IDC TAP headers comply with the standard JTAG Technologies 20-way pin-out and provide the additional flash programming controls Read/Busy and AutoWrite.
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Product
USB License Key
Sentinel RMS
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For customers that wish to use our software on different computers we offer the possibility to purchase our software license locked to a USB dongle. Add this product to your software order and we’ll deliver your software licenses linked to a compact Sentinel RMS license key.
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Product
Digital/Analog/Frequency Measurement Module
JT 2149/DAF
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The JT 2149/DAF is a compact, mixed-signal (Digital/Analog/Frequency) measurement module for use in JTAG Technologies’ widely-used JT 2147 (QuadPod) signal conditioning interface. The DAF module has been designed to replace a regular TAP Pod and provides 28 measurement channels plus a clock generator. When connected to a circuit board via edge connector or test fixture/jig test pins, the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.


















