Corelis, Inc.

Product

MTM-Bus Tester

PXIe-1149.5

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Corelis, Inc.

PXIe-1149.5 - Corelis, Inc.

The Corelis PXIe-1149.5 is a versatile, multi-mode instrument for interfacing with MTM-Bus modules. The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).

Product

Remote Intelligent Pod

ScanTAP

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Corelis, Inc.

ScanTAP - Corelis, Inc.

The test patterns generated by the PCI-1149.1/Turbo controller are distributed to the target system either directly through ScanTAP 4 and ScanTAP-8 pods. The ScanTAP-4 and ScanTAP-8 pods can apply test vectors and/or ISP patterns to target boards with a variety of JTAG chain topologies. In the simplest case, the ScanTAP-4 and ScanTAP-8 will provide the interface between the PCI-1149.1/Turbo controller and a target system consisting of a single JTAG Test Access Port (TAP). This would be the case where the target system consists of one JTAG chain and its single associated TAP.

Product

PCI Based JTAG Controller

PCI-1149.1/Turbo

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Corelis, Inc.

PCI-1149.1/Turbo - Corelis, Inc.

The PCI-1149.1/Turbo is a powerful PCI-based JTAG/boundary-scan controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.

Product

Boundary-Scan Test / In-System Programming Controller

CPXI-1149.1/Turbo

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Corelis, Inc.

CPXI-1149.1/Turbo - Corelis, Inc.

The CPXI-1149.1/Turbo is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the CPXI-1149.1/Turbo offers up to 80 MHz clock rates on 4, 8, or 32 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.

Product

BSDL File Validation

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Corelis, Inc.

Corelis, Inc.

Corelis offers services to validate the accuracy of Boundary-Scan Description Language (BSDL) files that characterize the boundary-scan functionality of semiconductor devices. These services include validation of a device's BSDL file while the chip is still in development and BSDL file accuracy verification against actual silicon.

Product

Boundary-Scan Test Executive

ScanExpress Runner

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Corelis, Inc.

ScanExpress Runner - Corelis, Inc.

Efficiency in engineering means managing your most precious resources: time and effort. Automated testing is essential and boundary-scan is a critical component; no other structural test system provides the same value.When down to the wire, your boundary-scan test system needs to be built both for ease-of-use and reliability; a robust and powerful mechanism to ensure that no matter the state of production, all boundary-scan tests can be quickly and faithfully executed to maintain forward momentum.

Product

In-Circuit Tester Integration

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Corelis, Inc.

Corelis, Inc.

The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.

Product

Boundary-Scan Interactive Analyzer & Toolkit

ScanExpress JTAG Debugger

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Corelis, Inc.

ScanExpress JTAG Debugger - Corelis, Inc.

Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.

Product

High-Speed 4-TAP USB 2.0 JTAG Controller

USB-1149.1/4E

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Corelis, Inc.

USB-1149.1/4E - Corelis, Inc.

The USB-1149.1/4E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.

Product

JTAG Test Procedures

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Corelis, Inc.

Corelis, Inc.

Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete “turn-key” service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.

Product

Flash Memory In-System Programming File Generation

ScanExpress Flash Generator

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Corelis, Inc.

ScanExpress Flash Generator - Corelis, Inc.

ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.

Product

Test Development Solution

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Corelis, Inc.

Corelis, Inc.

Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete "turn-key" service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.

Product

JTAG 3rd Party Controller Support

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Corelis, Inc.

Corelis, Inc.

Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).

Product

Programming File Generation

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Corelis, Inc.

Corelis, Inc.

Corelis will process your design information, create all necessary programming files, and verify the programming works using your actual hardware. This is a complete "turn-key" service resulting in a fully functional flash programming solution. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and need a programming solution in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.

Product

JTAG USB Controller

NetUSB-1149.1/E

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Corelis, Inc.

NetUSB-1149.1/E - Corelis, Inc.

The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.