Hanwa Electronic Ind. Co.,Ltd.
The high-tech industries which we service are engaged in a fast-paced race to develop the newest technologies and processes. In order to keep up with our market's needs in this highly competitive atmosphere, we must continuously hone our own high level of technological ability, and maintain the most efficient global distribution network possible.
- +81-73-477-4435
- +81-73-477-3445
- 689-3, Ogaito
Wakayama, 649-6272
Japan
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product
CDM Tester
Hanwa Electronic Ind. Co.,Ltd.
The tester implements to test the withstand voltage which occurs when the device contact to different electric potential object.
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product
Fault Detection Device in PV String
Hanwa Electronic Ind. Co.,Ltd.
◆Very light and easy to carry.◆Possible to find fault areas that can’t find by Voc.◆Measurement Voc and Vc.◆Possible to check data and record the data using Android.
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product
LD/LED ESD Tester
Hanwa Electronic Ind. Co.,Ltd.
◆Automatic operationPerforms automatic destructive evaluation of Lazer-power after zap.After the measurement, the destruction judgment condition can be changed, and it judge again for the acquired data.◆Optical characteristic measurementThe output level of the laser diode (power) is measured by the Photodiode.After zap, it display Optical data displayed(IL), Performs the process of destruction.Settings: slope efficiency, differentiation resistance, and threshold current, etc◆Two kind LDAutomatic settings of two kinds wavelength.◆For variegated deviceThe socket (Jig) is separates. Perform to any device.The P.D. can be changed.Its height can be changed.
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product
TLP Tester lineup
Hanwa Electronic Ind. Co.,Ltd.
The tester can implement simulate operating characteristic of protective circuit In addition capable of the VFTLP test.
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product
Wafer ESD Tester lineup
Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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product
ESD Testers
Hanwa Electronic Ind. Co.,Ltd.
◆Adaptable to the following international standard waveform;JEDEC, ESDA, AEC, and JEITA◆This system’s uniquely short discharge circuit is made possible by its original mechanical design.◆The short circuit minimizes the influence of inductance and capacitance on the data.◆The use of a single circuit ensures data stability for each device pin tested.
