HenergySolar
A PV (photovoltaic) module and solar cell manufacturer.
- 008621-56185657
- 4006-048-365-607
- sales@henergysolar.com
- #16 GuangHua Road
TongZhou Industry Distric, Beijing
China
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Product
AAA Solar simulator
SS50AAA-PLC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
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Product
Silicon Heavy-doped Pen Tester
HS-MPRT
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Heavy doped testing, especially good for purchase the material.■ Not only sound alarm, but also Led light alarm , to guarantee sorting work accurately.■ adaptable for sorting little granular material, little broken IC Wafer and other little silicon material.■ Can set alarm ranges from 0.0 to 1.0Ω﹡㎝.
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Product
Multiple Angle Laser Ellipsometer
PH-LE
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The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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Product
Semiconductor Large Range Type Tester
HS-PSTT
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HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
Minority Carrier Lifetime Tester
HS-CLT
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HS-CLT Minority Carrier Lifetime Tester has strong functions. It can not only measure carrier lifetime of wafer but also silicon ingot, silicon filament,silicon phosphorus ingot,silicon boron ingot, seed crystal and other irregular shape silicon material.The minority carrier testing ranges from 1μs to 6000μs, the minimum resistivity is 0.1Ω.cm, (can be extensive to 0.01Ω.cm). Dynamic curve monitoring in the whole process.
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Product
4-Probe Resistivity and Resistance Tester
HS-MPRT-5
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t used for measuring resistivity of silicon rods and wafers, and sheet resistance of diffused layers, epitaxial layers, LTO conductive films and conductive rubbers, etc.
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Product
Semi-Automatic Contactless Wafer Detector
NCS-200SA
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Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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Product
PV Measurements System
PH-IQE200
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PV Measurements offers to combine a Spectral Response/QE/IPCE system with an I-V system into one compact measurement system. Depending upon the configuration required for your devices,it may share a test fixture.This reduces overall system cost.
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Product
Conductivity Type Tester
HS-HCTT
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It is strictly designed according to the requirements of the hot-probe thermal EMF conductivity type test in standard ASTM F42: Standard Test Methods for Conductivity Type of Extrinsic Semiconductor Materials. A temperature controlling heating element is installed inside the hot probe so that the hot probe is heated automatically and its temperature is maintained in the range 40-60℃.
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Product
Silicon heavy-doped Tweezer Tester
HS-MRTT
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Mini resistivity tweezer tester is used to check heavy-dope silicon. adaptable for little granular material, little broken IC Wafer and other little silicon material. When the resistivity is lower than the set value, it will make alarm.
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Product
Sapphire 3D Microscope
WDI-2000
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The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
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Product
Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
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Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
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Product
Silicon Resistivity, PN type & Alarm Tester
HS-PSRT
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It use Four Probe to test the resistivity and P/N type of wafers、ingots and all type of silicon materials.It can be used by Solar and Semiconductor industry.
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Product
Silicon Phosphor and Boron Analyze system
HS-ICP-MS
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The Silicon Phosphor and Boron Analyze system HS-ICP-MS is the best system to measure the element like P&B in silicon material, the HS-ICP-MS can detect and analyze over 75 elements.
