X-ray Photoelectron Spectrometers
determine the atomic composition of a surface.
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Product
High-Performance Liquid Chromatograph Mass Spectrometer
LCMS-2050
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The LCMS-2050 single quadrupole mass spectrometer combines the user-friendliness of an LC detector with the excellent performance of MS to provide a complete package of easy-to-use high-level performance and compactness. To make it accessible to all users, the system is enhanced with technology and functions to ensure that even technicians unfamiliar with mass spectrometers can easily and efficiently perform analysis.
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Product
Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Product
Femtosecond Terahertz Spectrometer
Pacifica
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Terahertz spectroscopy and microscopy are becoming a powerful tool in biology, medicine, semiconductor physics and in many applicaitons. Designed for obtaining THz spectra by using of THz pulses generated by femtosecond laser in oriented ZnTe crystal.
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Product
X-RAY Cameras Based On CCD
XiRAY
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*High resolution direct phosphor imaging, ideal for Micro CT*Ultra-low readout noise with CCD and especially the new sCMOS sensors*Crystal clear 14 bit/pixel images*Partial readout and binning modes for enhanced sensitivity and higher speed*Non-linearity over full dynamic range <2% (of full scale) to 95% of full scale*External triggering, LVTTL*Low power consumption 6 Watt with Cooling or 2W without*Antiblooming, Enhanced Statistical Extra-Mural Absorption*Radiation hardened, Support of Energy levels 7 to 100keV*Measures just 63 x 63 x 46 mm*Peltier TE Cooled with Heatsink and optional fan
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Product
High Performance Liquid Chromatograph Triple Quadrupole Mass Spectrometer
LCMS-8045
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Equipped with a heated ESI probe, the LCMS-8045 has the highest sensitivity in its class. The heated ESI probe, high-temperature heating block, desolvation line (DL) and drying gas, all act to promote desolvation and prevent contamination due to the penetration of liquid droplets into the MS unit. This improves the robustness, so reliable and high-accuracy data can be obtained over the long term. The LCMS-8045 also achieves the world's fastest scan speed (30,000 u/sec) and polarity switching speed (5 msec). These enable ultra-high-speed, high-sensitivity analysis. The excellent cost performance of this system is demonstrated in food safety, environmental analysis, and other quantitative analyses, it can be upgraded to the LCMS-8060.
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Product
Laboratory Spectrometers
M Series
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Current generation M4000 spectrometers truly represent evolved technology. They represent over two decades of product development, incorporating many of the features that allow our high performance dedicated analyzers to achieve low ppb detection levels in complex gas matrices.
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Product
Medical And Dental X-Ray
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Teledyne DALSA offers powerful, innovative CMOS X-Ray detectors combining industry-leading performance with cutting-edge features for applications such as orthopedic and surgical radiology, mammography, intra- and extra-oral dental radiology, CT, and bone densitometry
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Product
TAPPIR Femtosecond Transient Absorption Pump-Probe Infrared Spectrometer
TAPPIR
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A femtosecond difference frequency generator (DFG) is installed inside the TAPPIR optical unit for the tunable probe of transient absorption within 3 mm - 11 mm. DFG is pumped with signal and idler waves delivered together from an external optical parametric amplifier.
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Product
X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
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The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Product
Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
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Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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Product
Polychrometer (multichannel spectrometer)
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It is a spectrometer that reduces the aberration of the optical system to the utmost limit because it measures effectively using multichannel detectors such as CCD, CMOS, InGaAs etc. Since the spatial resolution is high on the whole surface of the light receiving surface of the detector, it can be used for the following applications.
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Product
TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Product
Small Footprint NIR Spectrometer
PGS Series
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ZEISS PGS modules with a spectral coverage of 960 - 2200 nm are among the market leading NIR spectrometers, providing a small footprint, highest throughput and excellent SNR. Special TE-cooled/uncooled InGaAs detectors ensure lowest noise conditions.
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Product
Bulkflow X-Ray Inspection System
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Designed to be integrated into line with optional reject stations, the Bulkflow X-ray System is perfect for loose and free flowing products. Offering a good detection levels on a wide range of contaminants including all metal, bone, glass and dense plastics.
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Product
Mini Raman Spectrometers
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Complete range of miniature Raman components and full systems with deep-cooled CCD cameras.
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Product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
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Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Product
Optical Emission Spectrometers
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Optical emission spectrometers (OES) and the measuring principle of the atomic emission are the ideal method and provide the perfect instrumentation for metal analysis in all different industrial businesses and environments.
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Product
WDXRF Spectrometers
Zetium
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X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium XRF spectrometer leads the market in high-quality design and innovative features for sub-ppm to percentage analysis of Be to Am.
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Product
Entry-level X-ray Inspection System
X-eye 5100 Series
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100kV ~ 130kV Micro-focus Closed tube and high-definition Flat Panel Detector are installed and high-resolution image can be gained.Customer convenience is primarily considered in operation and maintenance of the product.Customization is available because it is specially designed to be add up any necessary functions depends on customer needs with reasonable prices.
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Product
Windows-Based Software Suite for Rigaku's X-Ray Diffractometers
SmartLab Studio II
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SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components. Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.
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Product
Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
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EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
