XRF
measure of irradated sample's fluorescence radiation revealing it's elemental composition.
See Also: X-ray Fluorescence, X-ray Fluorescence Spectrometers, XRF Analyzer, EDXRF, TXRF, WDXRF
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Product
Micro XRF
W Series
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The W Series Micro XRF uses poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest beam size for coating thickness analysis using XRF technology. A 150X magnification camera is used to measure features on that scale; it is accompanied by a secondary, low-magnification camera for live-viewing samples and birds-eye macro-view imaging. Bowman’s dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and pinpoint the feature to be programmed and measured.
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Product
XRF Systems
OEM Solutions
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Amptek offers a complete line of OEM detectors, preamplifiers, digital processors, and power supplies, and can work with you to help develop custom solutions unique to your needs. We provide established and emerging OEM customers a fast track to the market with our modular systems that will meet current needs, while being flexible enough to adapt to your product roadmap. The below options are typical configurations. Please contact us for custom solutions.
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Coating thickness XRF Standards
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We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
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Product
XRF
M Series
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The M Series is the ultimate in high performance for the smallest x-ray spot sizes. The poly-capillary optics in the M Series is more advanced than the O Series, focusing the x-ray beam down to 15μm FWHM. To measure features on that scale, a 150x magnification camera is included. The field of view becomes more limited with higher magnification, so a second camera takes a macro-image of the part to be measured. The dual-camera system allows operators to see the entire part, click the image to zoom in with the high-mag camera, and pinpoint the feature to be measured.
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Product
Portable XRF Analyzer
GoldXpert
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XRF is a widely used, proven, and accepted method of chemistry analysis and determination of purity and fineness of precious metals. XRF analysis is a multielemental testing alternative that is quicker and less expensive than fire assay and chemical tests. XRF provides on-the-spot analysis of your silver, platinum, and PGM metals and impurities, making it an easy way to boost customer confidence and ensure dealer reliability.
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Product
XRF Analyzer
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X-ray fluorescence (XRF) is a non-destructive analytical method used to determine elemental concentrations in various materials.
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Product
XRF
B Series
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The B Series represents the most basic top-down measurement configuration that Bowman offers. The sample stage is a fixed base plate, requiring operators to manually position parts in the desired area for testing. This is accomplished by placing parts into the chamber and using the video image to align the desired location within the crosshairs on the screen. The sample chamber is the same as the P Series, with the slotted configuration, but without the programmable X-Y sample stage.
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Product
XRF
P Series
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The P series offers the flexibility of measuring a wide variety of sample sizes, shapes, and quantities. It is equipped with a high precision programmable X-Y stage that offers several convenience factors over a fixed stage. Operators can use the mouse and software interface to move to desired measurement locations easily. Multi-point programs can be created to automatically measure multiple sample locations with the click of a button. Pinpoint control is achievable for testing critical areas. Larger sampling volumes are possible through multi-point programming.
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Product
Scrap Handheld XRF Analyzer
DELTA
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DELTA Scrap Sorting Handheld XRF Analyzers provide reliable ID in 1-2 seconds for most alloy grades and pure metals. They are designed for durability to withstand the toughest processing environments. Get fast, reliable alloy sorting and analysis for a wide variety of ferrous and non-ferrous materials in seconds.
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Handheld XRF Analyzer
Vanta Element
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The Vanta Element XRF analyzer series provides elemental analysis for fast alloy grade identification and sorting at an affordable price. The series is available in two cost-effective models
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Product
X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
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Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
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Product
XRF analysis
X-Supreme8000
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XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 for quality assurance and process control requirements across a diverse range of industries.
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XRF Instruments
MasterXRF
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Pratt & Whitney Measurement Systems, Inc.
The MasterXRF® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal instrument for industrial process control, improving product quality, and saving money.
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Handheld XRF Analyzer
Genius-XRF
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Zhengzhou Nanbei Instrument Equipment Co. Ltd
Based on the mature technology of desktop X-ray fluorescence analyzer and the latest technological development, and on the performance of the existing international commercial handheld X-ray fluorescence analyzer, adding new elements into it on the basis of the first, second, and third generation, Skyray Instrument has developed the intellectual portable fourth generational handheld analyzer-Genius XRF series, which can satisfy the market requirements and possess independent intellectual property rights.
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Product
XRF
O Series
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The O Series combines high performance with a small x-ray spot size. This is made possible by the poly-capillary focusing optics system that replaces the collimator assembly installed in standard Bowman systems. The optics are designed to focus the x-rays coming from the tube exit window to a very small spot size (80μm FWHM) while retaining virtually 100% of the tube flux. So instead of attenuating the x-rays that can’t fit through the small apertures, as is the case with collimator systems, the poly-capillary optics assembly allows almost all of the x-rays from the tube to reach the sample. The result is much greater sensitivity for testing very small components or thin coatings. Shorter test times can achieve even better repeatability when comparing optics systems vs. a similar sized collimator.
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XRF Spectrometers
Epsilon Range
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The Epsilon range of X-ray fluorescence XRF analyzers are an ideal analytical solution. They are capable of simple element identification and quantification up to more sophisticated analysis. They are easy to operate, compact and X-ray safe instruments without the need for additional chemicals or operating gasses. Considerable savings in time and cost are two of the many benefits XRF can bring compared to alternative analytical techniques.
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Handheld XRF analyser
X-MET8000 EXPERT GEO
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Handheld XRF analyser for environmental soil screening and mining analysis. The X-MET8000 Expert Geo is a handheld XRF analyser for geochemistry applications including fast on-site environmental screening, mining exploration, planning and grade control. Easy to use and designed to withstand the harshest environments and weather conditions, the X-MET8000 Expert Geo offers results in seconds with real time data sharing for fast decision making.
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Product
XRF
L Series
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The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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Process XRR, XRF, and XRD metrology FAB tool
MFM310
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Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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Compact XRF Machines
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Compact and portable XRF machines offer accurate, rapid elemental analysis on the go, making them an essential piece of equipment for anyone looking for laboratory-quality results in the field. At Olympus, our portable XRF machines are rugged yet lightweight, so they can easily be transported to wherever testing is required.
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XRF
G Series
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The G Series’ two most distinctive features are precision video imaging, and “bottom-up” measurement using a motorized Z-axis with laser-based auto-focus. The latter is a feature unique to Bowman. An available manual XY stage with 1.5 X 1.5” travel facilitates easy positioning of small and large parts. The chamber is relatively small when compared to other models like the B Series. The smaller chamber and footprint is well suited for jewelry and other precious metal analysis applications, and components such as connectors and fasteners.
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High Performance XRF Measuring Instrument
FISCHERSCOPE® X-RAY XAN® 250
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Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement. Measurements according to DIN EN ISO 3497 and ASTM B 568.
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Portable XRF Spectrometers
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Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Handheld Portable XRF Spectrometer
QualiX-2000
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Handheld Portable XRF Spectrometer - QualiX-2000 Series are widely applied in accurate and non-destructive detection on a variety of precious metal alloys, low alloy steel, stainless steel, tool steel, electronic components, batteries, toys, stationery, children's products, minerals, raw ore, etc. You can identify material composition and alloy grade.
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Materials Metrology
VeraFlex Family
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World-class XPS and XRF metrology technologies for semiconductor process control.
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XRF, AA & ICP sample preparation
Claisse Range
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Designed for unprecedented analytical accuracy and repeatability, Claisse® electric and gas automatic instruments set new benchmarks in fusion capabilities. The same is true for Claisse pre-fused and homogeneous borate fluxes, high-quality platinumware, as well as analytical consulting services.
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XRF Analyzers
X-STREAM
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For some time, glass ceramics have been causing problems throughout the glass recycling industry. The melting behavior of glass ceramics is different from that of 'normal' glass; therefore, they will not dissolve in the melting tank at the glassworks, or dissolve only with great difficulty.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
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Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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Micro-XRF Spectrometers
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Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
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Micro-XRF Spectrometers
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Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.





























