Router Test
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Product
PXI Integration Platform
ATS-3100
Test Platform
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
Digital Interconnect Test System, Reference Solution
Test System
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
5G Router
ICR-4261
Router
ICR-4200, EMEA, 2× ETH, 2× RS232/RS485, USB, SD, Without Accessories. 5G NR Cellular Connectivity, Sub-6GHz. 3GPP Release 16, Support both NSA and SA modes.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
4G Router
ICR-2834WA01-S1
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ICR-2800-S1, EMEA, 2× Ethernet, 2× RS232/RS485, USB, Wi-Fi, Metal, EU ACC LTE Cat.4 with 3G/2G fallback Security based on IEC 62443-4-2 level 1. 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
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Product
Ethernet Switch and Router
VPX6-684
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Curtiss-Wright Defense Solutions
Curtiss-Wright's VPX6-684 FireBlade provides Systems Integrators with a fast, secure and unified approach to interconnect subsystems, chassis, cards, and compute nodes within any given platform using 1 or 10 Gigabit Ethernet links. Providing up to 24 wirespeed 10/100/1000 Mbps interfaces and up to four 10 Gbps interfaces in a single 6U VPX slot, the VPX6-684 Ethernet Switch is ideal for architecting system-wide Intra-Platform Networks (IPNs).
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Product
Compact 4G Router
ICR-1645W-CN-A
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ICR-1600, CHINA, 5× ETH, 1× RS232/RS485, WiFi, Antennas included
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
Test System
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
LTE-A Router
ICR-4233
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ICR-4200, EMEA, 2× ETH, 2× RS232/RS485, USB, SD, Without Accessories. LTE-Advanced Cat.6 Cellular Connectivity. Quad-core CPU with 1 GB RAM.
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Product
LAN Router
ICR-2701WA01
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ICR-2700, GLOBAL, 2× ETH, USB, WiFi, Metal, EU Power Supply. 1.3 GB eMMC storage to host customer SW applications. 2× Ethernet 10/100 WiFi 802.11n.
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Product
In-Circuit Test System Rentals
Test System
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
4G Router
BB-SR30400415
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SmartFlex, EMEA/LATAM/APAC, 3x ETH, 1x RS232, 1x RS485, Plastic, ACC Int. LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2x SIM. LTE B1, B3, B5, B7, B8, B20 VPN router, Open Linux OS.
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Product
Compact 4G Router
ICR-1642G-EU-A
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ICR-1600, EMEA, 2× ETH, 1× RS232/RS485, GNSS, Antennas included
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Product
4G Router
BB-SR30418020
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SmartFlex, EMEA/LATAM/APAC, 2x Ethernet, Wi-Fi, PoE PSE, Metal, Without Accessories. LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2x SIM. LTE B1, B3, B5, B7, B8, B20 VPN router, Open Linux OS.
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Product
4G Router
ICR-2834GPA02
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ICR-2800, EMEA, 2x Ethernet, 2× RS232/RS485, USB, GPS, Plastic, UK ACC LTE Cat.4 with 3G/2G fallback. GNSS receiver 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
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Product
ARINC 818 Tester
Test Platform
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Product
5G Router
ICR-4272
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ICR-4200, GLOBAL, 2× ETH, 2× RS232/RS485, GNSS, USB, SD, Without Accessories. 5G NR Cellular Connectivity, Sub-6GHz. 3GPP Release 16, Supports both NSA and SA modes. Quad-core CPU with 1 GB RAM.
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
4G Router
ICR-2734WPA01
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ICR-2700, EMEA, 2x Ethernet, USB, Wi-Fi, Plastic, EU Accessories LTE Cat.4 with 3G/2G fallback. 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
4G Router
BB-SR30400120
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SmartFlex, EMEA/LATAM/APAC, 5x ETH, Metal, No ACC LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2x SIM. LTE B1, B3, B5, B7, B8, B20 VPN router, Open Linux OS.
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Product
LAN Router
ICR-2701-S1
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ICR-2700-S1, EMEA, 2× Ethernet, USB, Metal, Without Accessories. Security based on IEC 62443-4-2 level 1. 1.3 GB eMMC storage to host customer SW applications.
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Product
NTS Platform
Test Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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Product
Battery Management (BMS) Environmental Test System
Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
