Boundary Scan Software
Boundary Scan software is a comprehensive toolset for program development and diagnostics for boards designed with boundary-scan devices.
See Also: Boundary Scan, IEEE 1149.1
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Software Solutions
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AuSIM is a technology company where the technology manifests itself in software. AuSIM has some of the brightest software developers in Silicon Valley. AuSIM software is light-weight, extremely efficient, and very high-performance. Since humans are in the middle of all AuSIM technology experiences, AuSIM optimizes for perceptual-based design, usability, and the lowest latency anywhere.
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BlueViewer Software
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Quickly view .xyz 3D point clouds filesTake accurate point-to-point measurementsSupports a variety of color maps including jet, gradient, and intensityOverlay multiple point clouds
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Differential Scanning Calorimeters
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Differential Scanning Calorimeters (DSC) measure temperatures and heat flows associated with thermal transitions in a material. Common usage includes investigation, selection, comparison and end-use performance evaluation of materials in research, quality control and production applications. Properties measured by TA Instruments’ DSC techniques include glass transitions, “cold” crystallization, phase changes, melting, crystallization, product stability, cure / cure kinetics, and oxidative stability.
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Ultra-High Vacuum Scanning Kelvin Probe
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Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Turret Test And Scan Handlers
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Turret platforms for semiconductor test, inspection and packaging.
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Software
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A tool is available to update ARGUS testers, which is also included in our WINplus and WINanalyse software packages. With this tool, the latest firmware versions can be downloaded to the tester from www.argus.info. The whole procedure is very simple and intuitive, thanks to the integrated step-by-step instructions.
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Software Development
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In support of system, test and our tooling design, our software development team is ARC’s primary advantage in providing the superior performance in hardware (electrical), mechanical and software cohesiveness. The software team at ARC literally brings all of it together.Whether you want to leverage one of our standard platforms, such as TestCentre or harness the power of the process editor in our PVS software to build up your custom workflow, most customers are impacted by the power and scalability of our software solutions, without sometimes ever knowing the tremendous effort that goes into our software.Customization, whether you are needing work in LabVIEW, TestStand, C# or other development platforms, our team can deliver the perfect solution, tie the mechanical and electrical worlds together in coming up with your next solution.
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Handy Scan 3D
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The truly portable metrology-grade 3D scanners delivering highly accurate measurements.Truly portable and faster than everMetrology-grade accuracy and resolutionUser-friendly and easy to use
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LC Software
Shimadzu LC Driver for OpenLAB CDS
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Control of Shimadzu’s Nexera and Prominence series by OpenLAB CDS is now available by adoption of Agilent’s RC. Net driver standard.
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Controller Software
EZ-View
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EZ-View Software allows users to easily monitor and control their CSZ test chambers from any location. Features include advanced data logging, profile entry, graphs, system security with file encryption, alarm monitoring, and flexible trend. Control & monitor up to 128 devices from a single PC.
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Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Software Packages
GLUON
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The software uses notched specimens (CT specimens) to evaluate the material elasto-plastic fracture toughness value (JIC). The test is conducted at constant loading rate under test-force control or CTOD control and the load is removed to calculate the crack length. The software plots graphs of the crack length increase (Δa) and crack growth resistance (J value) from the acquired data, calculates the JIC value, and evaluates its validity.
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Single Sensor - Monochrome Line Scan Cameras with Fast Scan Rates
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JAI’s monochrome line scan cameras provide an excellent combination of high resolution and fast scan rates.The Sweep SW-8000M-PMCL model features an 8192-pixel linear CMOS sensor delivering a line rate of 100,000 lines/s (100 kHz) over a Camera Link interface. The SW-4000M-PMCL model is based on a 4096-pixels sensor capable of running as fast as 200,000 lines/s (200 kHz) over Camera Link.
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Android Software
SonarMite 'Plus' App
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The SonarMite+ App is based on the free SonarMite App but offering additional features. The software is an Android App designed to work with the popular SonarMite Bluetooth Echo Sounder used in hydrographic surveying applications. With the demise of Hyperterminal as a standard terminal application the end user is left with little choice for a simple communications program with serial data devices. Connecting via Bluetooth is cleaner than USB cable, there are no wires and the connection is independent of baud rate and other serial port settings. Most terminal programs are not easily configured with commands to directly interface with instruments such as SonarMite.
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Scanning XPS Microprobe
PHI VersaProbe III
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The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Software & Informatics
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Agilent laboratory software offers the control that businesses demand, as well as the flexibility and technical functionality that cutting-edge labs require. Our portfolio features a range of high-quality solutions to ensure your laboratory can make the most of every analytical system.We offer analytical data systems for instrument control and data analysis, laboratory informatics and automation software, data and workflow management, and additional lab software packages to enhance data visualization and mining.
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Software
DIMENSIONS
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DIMENSIONS is Microtrac's proprietary measurement and evaluation software for the dynamic image analysis and laser scattering product lines. The software comprises five clearly structured Workspaces for method development, operation of the analyzer, result presentation and evaluation of several analyses.
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CMM Software
CAMIO
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Proven in the most challenging application environments CAMIO is the CMM software of choice for many of the world’s largest manufacturers. By leveraging the productivity benefits of CAMIO, manufacturers can focus on accelerating lead times and improving product quality while reducing costs. CAMIO’s interoperability across CMM platforms, sensor technology and manufacturing sites, is a unique advantage which guarantees the sustainability of your investment in software and inspection program
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Area Scan 3D Camera
3D-A5000 Series
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Cognex’s 3D-A5000 series is an area scan 3D camera designed to capture high-resolution 3D images. It features 3D LightBurst technology which rapidly acquires images to maximize throughput. High-resolution 3D images combined with industry-leading Cognex 3D vision tools enable reliable and accurate solutions to applications such as assembly verification, in-line measurement, and robotic guidance.
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Line Scan Camera
Linea Lite
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Linea Lite makes line scan more accessible than ever. Designed with performance in mind, this camera offers superior color fidelity with 2k to 4k resolution and line rates from 12.5 to 50 kHz, with a GigE Vision® interface.
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Scanning Auger Nanoprobe
PHI 710
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The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Testing Software
IEC 61850
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Beijing GFUVE Electronics Co.,Ltd.
Intelligent substation has widely adopted IEC 61850 standard communication, the standardization of information model is the basis for intelligent substation equipment (or system) to achieve IEC 61850 communication. This module can test if the information model meet the requirements of DL/T860 standard, national network and related model specifications. It can test and control unit model, protection unit model, econometric model, condition monitoring model. It is selectable to test according to IEC61850-6 SCL grammatical rules, IEC61850-7 logic nodes and common data, the national network model standards and custom models.
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Software
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SKF Condition Monitoring Center
SKF has comprehensive software solutions with powerful diagnostic and analytical capabilities to provide fast, efficient and reliable storage, analysis and retrieval of complex asset information. This software makes the information accessible throughout your organisation. The software available for your condition monitoring needs include the following.
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Thermal Software
ThetaCalc
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Thermal Engineering Associates, Inc.
A tool designed to provide a quick estimate of the temperature and thermal resistance from a heat source to a reference heat sink. It also shows the temperature and thermal resistance value of each layer in the heat flow path. The program can accomodate up to ten layers of different materials of varying dimensions between the heat source and sink. The heat spreading angle can be set independently for each layer to a value between 0 and 45 degrees; the tool will automatically determine if heat flow reaches the layer edge and then convert to columnar flow.
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Laser Scanning Microscopes
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A confocal laser scanning microscope scans a sample sequentially point by point, or multiple points at once. The pixel information is assembled into an image. As a result you acquire optical sections with high contrast and high resolution in x, y and z .
