Stator Test
See Also: Stator
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Stress Testing System
Load Dynamix
LoadDynamix (former Swifttest) is famous for its IP based converged storage system stress testing, including iSCSI, SMB/CIFS, NFS, FC and HTTP/HTTPS based storage systems. Its GUI interface is very easy to use and allow customer engineer to fully configure all the parameters at the protcol layer. Nearlly all the major IP storage system manufacturers have LoadDynamix products in their test lab.
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Testing and Safety Technology
Maschinenbau Haldenwang GmbH & Co. KG.
Online appointment bookingfast, comprehensive vehicle inspection with transparent display of measurement resultsmenu-driven, automatic service process -> close dialogue between the customer and service employeesclearly defined order if the customer leaves the dealershipAvailability of all relevant data in one system (car legend) -> optimum customer approach by the present data and evaluationsregular flow of information about new features / changes in the dealership and on / for the vehicle
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Battery Test Chambers
At Weiss Technik we supply battery test chambers specific to testing batteries in a variety of conditions including low or high temperatures, humidity changes, vibration changes, and altitude changes. Our battery test chambers are designed to test Lithium Ion batteries, lead acid, Battery Managements Systems (BMS), battery packs, modules, battery cells, and more.
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Battery Test Equipment
Battery test equipment refers to instruments and devices used to assess the performance, capacity, and condition of batteries.
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Vibration Testing
As specialists in dynamic testing, we provide equipment capable of exerting a 6,000 to 40,000 pound force with the capacity to perform closed-loop control from a single input to multiple channel inputs (from 2 to 32) with averaging or notched channel control. Vibration control systems can be programmed for real time monitoring, scheduled for length of time, or level scaled by dB or percentage, or scaled at various durations at different acceleration levels.
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Flight Test Switches
Curtiss-Wright Defense Solutions
Our compact, deterministic flight test switches have been qualified to reliably deliver high-speed, real-time data with a wide temperature operation ranging from -40 to 85°C. Their rapid boot-up capability minimizes data loss from power outages, while their flexible forwarding and filtering configurations can send what is required to multiple destinations for real-time monitoring, recording, and transmission.
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Shock And Vibration Testing
Innovative Testing Solutions, Inc.
We perform multiple types of vibration testing; Random, Sine, Sine-on Random, Random-on-Random, and Road-Load vibration. Our vibration capabilities range from as low as 2 lbs/force to 4,000 lbs/force. Four of our systems have 2? stroke capacity and we have four chambers designed to perform combined environment testing.
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Optics Test Systems
IR Autocollimator
Optik Elektronik Gerätetechnik GmbH
The infrared autocollimator was specially designed for the 1550 nm wavelength range. In conjunction with the CROSDETECT evaluation software, it achieves a measuring accuracy of 1 arcsec with a resolution of 0.1 arcsec. The camera used is suitable for the wavelength range from 900 nm to 1700 nm.
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Battery Testing Equipment
Mainly for battery testing in lab,such as 5V1mA, 5V10mA, 5V50mA,5V100mA, 5V1A,5V3A,5V6A,5V10A
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Oil Testing
BA Series
The ultra light BA series Breakdown Analyzers by b2hv are superlative in their specification and ideally suited for both laboratory and on-site transformer oil testing.
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Test Advisory Services
The QA function has unique challenges in every enterprise, be it a small enterprise that is just at the beginning to set up a QA team or a multi-billion dollar giant with matured QA processes. The right QA strategy can help you improve the overall product quality, reduce release cycle time enabling faster time-to-market and controlling the rising QA costs. TestingXperts’ Test Advisory Services provides you the specialist advice to achieve these objectives and help you move to the next maturity level in QA. We deliver custom solutions that address your current business needs and align with your future aspirations.
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FCC/CE Certification Testing
FCC/CE Certification Testing services to ensure that our product designs meets the necessary FCC/CE/UL norms. FCC compliance testing is mandatory for a wide variety of products designed for the EU/US markets.
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Test Lead Set
69128
Set of two (red, black) 32'' (813 mm) test leads.Each lead has alligator clips attached to both ends.Multi-purpose tooth pattern for better gripping of wires and test points.Recommended for general purpose measurements.
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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Test Service Offerings
ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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JTAG Test Procedures
Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete “turn-key” service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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IC Test Services
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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Test Strips
High-quality Hach chemistry in an easy-to-use test strip. Simply dip the strip into the sample and compare the color to the colors on the bottle to determine the reading. The test strips are accurate, portable and inexpensive. Applications include potable water, waste water, swimming pools and spas, industrial process applications and more. Available parameters include chlorine, nitrate and nitrite, water hardness, alkalinity, chloride, ammonium and more. Hach offers a high-quality 5-in-1 test strip that measures free chlorine, total chlorine, hardness, alkalinity, and pH—all in one strip.
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Brake Test Systems
Giant 8000 Series
Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Communication Test Set
Eye-BERT 100G
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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Automotive Test System
LABCAR
The LABCAR product family comprises software, hardware, and models suitable for integration into tailor-made testing systems that fit perfectly into existing processes. Deployable from the earliest to the latest phases of development, the LABCAR family provides for efficient verification and validation of embedded systems and software.
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EMF Exposure Test
sXcTEM835
Tests radiofrequency electromagnetic field exposures from mobile communication devices operating in the 900 MHz region (additional frequencies upon request). The setup is based on two Crawford TEM cells that are blindly excited by a fully computer-controlled signal unit.
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Test Data Management
When testing your products, the measurement and test data produced is invaluable in helping your improve your product quality. Most companies do nothing with their test data apart from storing on a hard drive somewhere. Accessing it and using this data is the most valuable way of gaining insights into your manufacturing performance and enabling you to make immediate improvements to help increase product quality whilst reducing the likelihood of unwelcome field failures and expensive product recall events.
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Battery Testing
Electric vehicles (EVs) rely on batteries as their primary source of energy storage. As battery packs require battery management systems (BMS) to operate safely and reliably, it is vital to test control algorithms for state of charge (SoC) estimation or cell balancing at an early stage.
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Power Quality Testing
Weshine Electric Manufacturing Co., Ltd
Transformer K Factor, Power factors(PF)and displacement factors, Short-term voltage flicker, .Three phase unbalance (Current and Voltage), Waveform real-time display(4 channels voltage /4 channels current) True RMS values of voltages and currents
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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MEMS Testing System
BK3010V2
The BaKo BK3010V2 is our updated MEMS Tester, based on our C-Mic tester, the best selling BK3010. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is very easy and can be done in a few minutes. In addition, the new BK3010V2 can be connected to a computer so you can keep and view compiled data and track trends in variations in your C-Mics.
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Magnet Testing
magtrack
The magtrack makes it possible to detect the absolute 3D position in space as well as the orientation of a magnetically marked particle over a course of time. The magtrack system is modular and can therefore be adapted to any installation and system.
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RFID Test System
RFID test system of Peritec is making FPGA board (IF-RIO) the processing of the IF band. This reading of the code, called (Electronic Product Code) EPC is required for RFID tag ISO18000-6 TYPEC of (EPC C1 G2). However, it did not provide treatment too late in the traditional instruments.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
