Moving Probe Testers
multiple probes move robotically to contact integrated circuits, printed circuit and SMT boards.
-
Product
Probe Card
T40™ Series
-
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
-
Product
SPL-03C-090 Step Probe
SPL-03C-090
Step Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 50Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 127Recommended Travel (mm): 3.22Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,530Overall Length (mm): 38.86Rec. Mounting Hole Size (mil): 95Rec. Mounting Hole Size (mm): 2.40Rec. Mounting Hole Remark: 94 to 96 mil / 2.39 to 2.44 mmRecommended Wire Gauge: 22-26 AWGRecommended Drill Size: #41 or 2.40 mm
-
Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1Z1-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Standard 0.81 (23.00) - 4.50 (128.00) Battery Probe
CP-059-026
Battery Probe
Current Rating (Amps): 10Average Probe Resistance (mOhm): 25Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 57Full Travel (mm): 1.45Recommended Travel (mil): 40Recommended Travel (mm): 1.00Mechanical Life (no of cyles): 100,000Overall Length (mil): 221Overall Length (mm): 5.61
-
Product
Alternate 1.00 (28.00) - 2.00 (57.00) General Purpose Probe
P2663G-1R2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
-
Product
Debug Probes
J-Link and J-Trace
-
SEGGER Microcontroller GmbH & Co. KG
SEGGER J-Links are the most widely used line of debug probes available today. They've been proven for more than 10 years with over 250,000 units sold, including OEM versions and on-board solutions. This popularity stems from the unparalleled performance, extensive feature set, large number of supported CPUs, and compatibility with all popular development environments.
-
Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T1-8-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Standard 2.40 (68.00) - 6.20 (176.00) Battery Probe
BIP-8
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Test Center (mil): 188Test Center (mm): 4.78Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 60Recommended Travel (mm): 1.52Overall Length (mil): 396Overall Length (mm): 10.06
-
Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1J-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Luminance Probe
LP471LUM2
-
Photometric probe for measuring the LUMINANCE, spectral response according to the photopic curve, angular field 2°.
-
Product
Threaded Step Probes
Step Probe
Pin position sensing - adjustable height - custom designs - anti-jump solution.
-
Product
Probe Cards
Direct Dock
-
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
-
Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T24-8-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25H79-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Probe Holders
-
Probe holders from ZEISS offer the possibility to use optical and tactile scanning probes on one CMM. With the articulating probe holder even complex parts can be measured with less effort.
-
Product
Probe Cards
-
These cards are compatible with WLCSP and can be customized according to pin positions. They can be used for a pitch of up to 180 μm. We are developing a product for a pitch of 150 μm, to be compatible with narrower pitches.
-
Product
Standard 1.09 (31.00) - 4.50 (128.00) Long Travel Bead Probe
BPLT-1HF-4.5
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
-
Product
Threaded Battery Probes
Battery Probe
Easy to implement - safe solution - height adjustable - custom made
-
Product
Microscopic Probes
M12PP
-
CAPRES M12PP Microscopic Twelve-Point Probes are specialized versions of the CAPRES Micro Multi-Point Probes. By using a dedicated 12-by-4 multiplexer, a total of 495 different pin-configurations can be obtained, each with different probe pitch. This is utilized in e.g. the CIPTech, where 8 or more combinations are used to obtain a “depth profiling” of the measured structures.
-
Product
Current Probe
PA-699
-
*High sensitivity: 1mA, High frequency: 1.5MHz. They are all 10 multiple calculation. Calculation is not making mistakes.*Max measuring current: +/- 40A DC / 80 Ap-p*Max sensitivity: ≧1mA*Bandwidth: DC ~ 1.5 MHz*Rising Time: 0.23 uS*Overload indicator*1V/A, 0.1V/A 2 ranges selectors*Input power switching (priority circuit) and battery available*Dispatching design, high durability
-
Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3J
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3B
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
BTP-25 Bead Probes
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
ProBus Probe Adapter for TekProbe-BNC Probes
TPA10
-
- Allows TekProbe interface level II probes to work with any ProBus-equipped Teledyne LeCroy oscilloscope- Automatic probe detection- Provides all necessary power and offset control to the attached probe- Supports probes up to 4 GHz- Easy firmware updates- Wide variety of probes supported including: Preamplifiers, Current Probes, Single-Ended Active Probes and Differential Active Probes
-
Product
Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72T20-2
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
-
Product
High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25B-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Alternate 3.20 (90.00) - 6.90 (196.00) General Purpose Probe
EPA-4B-1
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
-
Product
Alternate 0.66 (19.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-62H-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02





























