Test Driven Development
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Product
Direct conversion from cycle driven simulation data
Test program generator
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Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Development Boards
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Advantech Development boards provide a schematic software & reference to reduce design effort at the development stage. Development Boards have been designed in order to allow customers to verify the functions of COM, text carrier board problems and support COM series. Advantech has designed a Development Board which can be used to test carrier board problems and support COM series, and Qseven, ETX / XTX form factors.
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
Test Port Cable
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Batterie Inspektor
Battery Test Platform
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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Product
Multibus Development and Test Tool for ECUs and Networks
CANoe
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The versatile software tool for development, testing and analysis of ECUs and entire networks. Bus systems: CAN, CAN FD, LIN, MOST, FlexRay, Ethernet, WLAN, Car2x ITS G5, AFDX, J1708, ARINC429 > Protocols: TCP/IP, SOME/IP, CANopen, J1939, ISO 11783, J1587, MCnet, GMLAN, K-Line, CANaerospace and ARINC 825. Others upon request.
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Development Switch
AFDXSwitch Lab v2.0
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The AFDXSwitch Lab v2.0 is identical to the TTESwitch A664 Lab v2.0, which fully supports AFDX® and operates in accordance with all requirements specified in the ARINC 664 part 7 standard. Features include traffic policing and frame filtering functions as well as integrity and error checking of frames. Additionally, the switch comes with advanced features like 1 Gbit/s speeds and flexible physical layer configuration. The TTESwitch A664 Lab v2.0 is based on the TTESwitch Module A664 Pro, thus providing the full range of technical functionalities of TTTech’s certifiable AFDX switch modules and making it the optimal switching solution for a large variety of different application areas.
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Product
Development System
FE-51MX
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* Emulates Philips P8xC51MA/B/C , P89C669 Microcontrollers * 1MByte Code Memory * Based on bond-out Technology * Frequency up to 24MHz 3V / 5V Operation * Huge Real Time Trace Memory * Windows Debugger for C/C++ and Assembler * Target Board Included * RS-232 or USB Interface * 64K C/ASM and 8K C++ Included
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Product
Product Development
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Product development is the core service we offer in helping our OEM Partners fulfill their project goals and reduce their time-to-market for their products. Our design team draws on a broad history of innovation to provide complete solutions for your project. Over several decades and across dozens of partnerships, Teledyne OEM Solutions has built a portfolio of demonstrated capabilities along with the skills to innovate fresh solutions based on your and your customers' needs.
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Product
Custom Sensor Development
X4M03 | X4M06
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Kickstart your sensor product development with the XeThru development platform, and quickly develop a prototype using certified radar sensors and your programming language of choice, be it MATLAB, Python or C++. All embedded functionality for your radar sensor project is included; access to parametric control of the XeThru X4 UWB radar SoC, the back-end data processing it demands, and communcation stacks that connects to the host software running on Windows, Mac, Linus and embedded targets.
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Product
Gamlen Development Series
D series
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The first fully automated powder compaction analysis system
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Product
EMI Test System
TS9975
Test System
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
Software & Development Tools
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Gidel’s frame grabbers are supported by software suite and development tools enabling different grabbing flavors and customization possibilities. Customization can be performed for both software and FPGA design code (HDL). The software suite includes the ProcFG and InfiniVision Grabber GUIs as well as API suits for custom user software application. The Development kit that includes the ProcWizard application is for efficient and intuitive FPGA code customization and integration with software code.
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Product
ALD For Research & Development
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Veeco’s atomic layer deposition research systems are designed by ALD scientists and built for maximum experimental flexibility and value. With universal precursor delivery systems, you can use solid, liquid or gas chemistries in any precursor port. There are many options to choose from including ozone generators, in-situ monitoring and various configurations. As always, our team of ALD scientists are ready to answer your recipe development and film characterization questions. Over 2500 published academic papers feature research performed on our Savannah® thermal ALD system and Fiji® plasma ALD system.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
I-Pi SMARC Development Kit Based On Intel® 6th Gen Atom® X6425E Quad-Core SoC
I-Pi SMARC Elkhart Lake
Software Development Kit
The I-Pi SMARC Elkhart Lake is a SMARC-based edge solution development kit powered by Intel Atom x6425E quad-core SoC with integrated Intel UHD graphics and comprehensive high speed interfaces. Development-focused, this kit also supports the latest version of the Intel® Distribution of OpenVINO™ toolkit, which features more deep-learning models, higher inferencing performance, and fewer code changes, making developing ever simpler.
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Product
Fixturing Kit
10744A
Test Fixture
The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
Bottom Electrode SMD Test Fixture
16197A
Test Fixture
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
Development Switch
AFDXSwitch Lab
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The AFDXSwitch Lab operates in accordance to all requirements specified in the ARINC 664 part 7 standard. Features include traffic policing and frame filtering functions as well as integrity and error checking of frames. Additionally the switch comes with advanced features like 1 Gbit/s speeds, flexible physical layer configuration and extended environmental ratings. The AFDXSwitch Lab provides the full range of all technical functionalities of TTTech’s certifiable AFDX production switches, making it the optimal switching solution for a large variety of different application areas.
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Product
Anite Development Toolset
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Benefit from a comprehensive suite of tools that support all phases of wireless terminal development, from pre-silicon protocol module development through to systems integration and verificationGain easy access to parameters at lower layers to re-create tests in the very early stages of chipset and device developmentAccess an extensive LTE/LTE-Advanced technology roadmap including early 5G specificationsRemain in control of test designs through accessing Layer 1 and Layer 2 using Application Programming Interfaces (APIs)Benefit from a high level of flexibility and control in terms of test creation
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Product Development
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Have a complex system level or product level solution you need to develop that could use some engineering know-how? Whether it is a sophisticated mission critical system or a product with your IP that needs a host, ARC can help you deliver on these complex solutions. Our DSX product, can help support your IP and be the host processor for your design, or if a larger system, DSX could be an integral part of your system.Don’t recreate the architecture. Let our team of experts help configure your product solution – by leveraging the best in FPGA and system level PXI technology that ARC has already created for you.
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Product
Development System
FE-51CC01
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* Emulates Atmel T89C51CC01/2 and T89C51AC2, T89C5115 * 60K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V, 33MHz/5V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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