ICT
Testing of short circuits, open circuits, component values and operation of ICs.
See Also: ICT Systems, In-Circuit Test
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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ICT / FCT Probes
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*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
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ICT Probes
Merica Series-MPA75
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Minimum Center: 1.91 (75mil)Current Rating: 3amps, continuousCurrent Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 198gf(7oz)
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ICT Probes
Merica Series-MPAL50
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Minimum Center: 1.27(50mil)Current Rating: 3amps, continuousCurrent Resistance: 60milliohmsFull Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 185/227gf(7/8oz)
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In-line High-Density ICT System Series 7i
E9988GL
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The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2-228X (Small IF) / 230540
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
ICT Probes
Merica Serirs- MP175
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Minimum Center: 1.91mm (75mil)Current Rating: 3amps, continuousContact Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.40mmRated Stroke:4.30mmSpring Force: 203gf (7.2oz)/227gf(8oz)
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In-Circuit Test (ICT)
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Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
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2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
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The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Automated ICT System
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With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
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ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2-228X (Large IF) / 230532
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
PXI Based Multifunction Measurement and ICT Instrument
PXI-501
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The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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PCB Test Fixtures
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ATE, ICT, semiautomatic & manual electronic test fixtures, PCB test fixtures, cable test fixture, wiring harness test fixtures, dedicated test fixtures, functional test fixtures, electronic test fixture programming. PADS Schematic capture, circuit board layout, PCB design prototype, solder paste stencils, X-Y coordinate data, B.O.M. maintenance, and manufacturing documentation, Gerber data.
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Interface Probes
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Low resistance used in: *ICT Testers *Functional Testers *Special Purpose Machines
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ICT/FCT-Fixtures Max UUT370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Actuation Methods for In-Circuit Test Fixtures
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Commonly referred to as In-Circuit Test (ICT), loaded board test can be defined as the task of measuring values of components that have been installed on a printed circuit board (PCB). A second basic category of loaded board test measures simple open and shorts on the board to verify manufacturability standards. Circuit Check supports all forms of in-circuit test strategies with its Performance Grade and Value Line test fixtures.
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XJLink2-3070
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The XJLink2-3070, approved by Keysight Technologies, provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from Keysight (Agilent) i3070 ICT machines.
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ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1-228X-S (Small IF) / 230514
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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In‐Circuit Test Fixtures
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Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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LED Analyser
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The Feasa Analyser is an innovative solution for testing multiple LEDs simultaneously for Color and Brightness. There are two Models, Feasa-I(ICT) and Feasa-F(Functional). These can be ordered in 3, 5, 10 and 20 Channel configurations.
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ICT Probes
Merica Series-MPA50
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Minimum Center: 1.27(50mil)Current Rating: 3amps, continuousCurrent Resistance: 60milliohmsFull Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 122gf(4oz)
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Accessories: Fixture
ICT I3070
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View ICT i3070 fixture accessories ranging from fixture kits to vectorless test items like nanoVTEP. You can conveniently select items/parts to request for a Quick Quote.
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ICT: In-Circuit Testing
XILS In-Line Handling Solutions
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Designed to cover a large number of test points, with long panels for future expansion, the XILS series of Handlers, PCB test systems in the line of EIIT - Innovative Engineering Solutions, is ready for the most demanding applications.
