Total Reflection X-ray Fluorescence
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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X-ray inspection system for BLU, LED Long bar products
X-eye 9000LED
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X-ray Tube100kV / 200uAMin. Resolution5µmTable Size1,500mm X 500 mmDetectorFlat Panel Detector (High sensitivity)Dimension3,620(W) x 1,065(D) x 1,590(H)mm / 850kg
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Total Organic Carbon Monitor
HT-110
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The continuous online TOC-Analyzer HT-110 is suitable for the measurement ot total organic carbons in Purified Water (PW), Water For Injection (WFI) and Highly Purified Water (HPW). The unit is operating according to USP 643. It is applicable for pharmaceutical and/or semiconductor manufacturing. The measuring principle is based on UV-Oxidation and measurement of the difference in conductivity. TOC concentration measurement (TOC concentration 500 ppbC or lower) is necessary to perform quality control according to GMP (Good Manufacturing Practice).
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Total Effective Irradiance Probe
LP471A-Uveff
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The combined probe LP471A-UVeff measures the Total Effective Irradiance (W/m²) weighted according to the UV action curve (CEI EN 60335-2-27).
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Constant Potential Generator Metal Ceramic X-Ray Tube 30 to 300 kV
CP300C
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The CP300C is the first panoramic x-ray generator of the CPSeries product range. Equipped with a metal-ceramic tube, the CP300C is a light (less than 30kg) and powerful generator (300 kV), able to penetrate up to 52mm of steel in 10 minutes, making it the best power-to-weight ratio in the world.The efficiency of the CP300C is also maximum thanks to its real 100% duty cycle that allows longer exposure time (> one hour).A full range of accessories is available (holding bars, tripod…) and even a 60°x40° lead diaphragm to convert the CP300C into a directional unit.
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Total Nitrogen Analyzer
QuickTON
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The QuickTONb from LAR AG provides rapid nitrogen analysis
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Analyzer for Total Sulfur
FGA-1000
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ATOM Instrument offers the most versatile total sulfur analyzers available. The ATOM FGA-1000 is an online process analyzer utilizing patented Excimer UV Fluorescence (EUVF) Technology to measure Total Sulfur in a variety of applications such as monitoring refinery flare gas and subsequent sulfur dioxide (SO2) emissions as mandated by the EPA Rule 40 CFR 60, Subpart Ja.
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Your High-performance Slide Scanner For Fluorescence, Brightfield And Polarization
ZEISS Axioscan 7
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Digitize your specimens with Axioscan 7 – the reliable, reproducible way to create high-quality virtual microscope slides. Axioscan 7 combines qualities that you would not expect to get in a slide scanner: high speed digitization and outstanding image quality plus an unrivaled variety of imaging modes are all available in a fully automated and easy to operate system.
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Energy Dispersive X-ray Spectroscopy
EDS
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Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Total Hydrocarbon Analyzer
Model 4030
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Teledyne Analytical Instruments
The Model 4030 uses a field proven FID detector in a heated chamber. The chamber is heated to a high temperature to meet US EPA requirements for VOC emissions monitoring.
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
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X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
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Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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CVAF – Cold Vapor Atomic Fluorescence
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Cold Vapor Atomic Fluorescence (CVAF) is a powerful technique based on detecting fluorescence light emitted by the sample. Below the principle of the technique is explained in a nutshell.
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X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
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- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
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Proton Induced X-ray Emission (PIXE)
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Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
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X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
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The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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PRO Low Range Total Dissolved Solids Meter
MW401
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MW401 is a Portable Low Range Total Dissolved Solids (TDS) Meter with Automatic Temperature Compensation. This instrument has been designed for aquariums, aquaculture, labs, and water conditioning applications to meet the needs for equipment suited from hobbist to professional. It is also a great meter for food labs, and water treatment applications.
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X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Fluorescent Lamp Asymmetric Pulse Tester
UI2002C
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UI2002C is designed according to the latest update in IEC 61347-2-3 about the test requirements for local rectifying effects on tubes. It imitates the condition when tube is under local rectifying status and tests the abnormal protection function of ballast by adopting fluorescent lamp asymmetry pulse test method with 3 windows for displaying rectified voltage, rectified current, and rectified power. It is easy for operation and with high test accuracy. • Measure lamp voltage, lamp current , average and total power of lamp. • Lamp voltage range: 10~300V • Lamp current range: 10mA~1.0A • Lamp power range: 0.5~300W • Tolerance is 5%
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Adjustable Range Reflective Photoelectric Sensor
RX-LS200
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Panasonic Industrial Devices Sales Company of America
Panasonic's Die-cast Adjustable Range Reflective Photoelectric Sensor. The Sensor does not detect the background beyond the set point and the color or size of the object does not affect its sensing performance.
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X-Ray Inspection System
TruView™ Fusion
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The quality of your products is paramount to the success of your business. The TruView™ Fusion X-ray Inspection System allows you to "see inside" your products without destroying them, enabling unprecedented understanding of your manufacturing process. The TruView™ Fusion X-ray is the right solution if you are looking for a radiography system to inspect medical devices, printed circuit boards, electronic components, and mechanical parts.
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X-Ray Preamplifier Power Supply
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The X-ray Preamplifier Power Supply (XPPS) provides power for 50 or more preamplifiers. The 19-inch rack-mount or benchtop unit contains linear power supplies that generate +/-12V @ 5.1 Amperes and +/-24V @ 3.6 Amperes, with very little noise.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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UV Fluorescence H2S, SO2 Analyzer
Model T101
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Teledyne Advanced Pollution Instrumentation
The Model T101 H2S analyzer uses the proven UV fluorescence principle to measure hydrogen sulfide at levels commonly required for ambient air monitoring.The Model T101 is equipped with an internally mounted catalytic converter set at 315C to convert H2S to SO2. A switching mode alternately measures H2S and SO2 while showing both readings concurrently on the front display.
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X-RAY Cameras Based On CCD
XiRAY
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*High resolution direct phosphor imaging, ideal for Micro CT*Ultra-low readout noise with CCD and especially the new sCMOS sensors*Crystal clear 14 bit/pixel images*Partial readout and binning modes for enhanced sensitivity and higher speed*Non-linearity over full dynamic range <2% (of full scale) to 95% of full scale*External triggering, LVTTL*Low power consumption 6 Watt with Cooling or 2W without*Antiblooming, Enhanced Statistical Extra-Mural Absorption*Radiation hardened, Support of Energy levels 7 to 100keV*Measures just 63 x 63 x 46 mm*Peltier TE Cooled with Heatsink and optional fan
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
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Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Medical And Dental X-Ray
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Teledyne DALSA offers powerful, innovative CMOS X-Ray detectors combining industry-leading performance with cutting-edge features for applications such as orthopedic and surgical radiology, mammography, intra- and extra-oral dental radiology, CT, and bone densitometry
