Electron Microscopes
scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.
See Also: Transmission Electron Microscopes
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Industrial Microscope Systems
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Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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Monocular Microscopes
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ACCU-SCOPE monocular microscopes use high-quality optics for bright, crisp images. Possibly the iconic and most recognized example of microscopes, monocular microscopes are compound microscopes with the outstanding feature of a single eyetube and eyepiece. Our monocular microscopes are durable and portable, making them favorites across a wide range of laboratories and educational environments including high schools, environmental science, and veterinary settings. ACCU-SCOPE monocular microscopes come with a standard selection of 4x, 10x and 40x DIN objectives (“DIN” is an international standard for type of thread and focal length). Depending on the series, 60x dry or 100x oil immersion objectives are available.
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Microscopic Melting Point Meter
DRK8029
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Shandong Drick Instruments Co., Ltd.
Determination of the melting point of the substance. Mainly used for the determination of drugs, chemicals, textiles, dyes, perfumes and other organic crystal, the microscope. Measured either by capillary method, and the slides are available - coverslip (hot stage method).
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AC Electronic Load
IT8600 Series
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IT8600 is ITECH latest series of AC/DC electronic loads with power range 0~14.4 kVA and adjustable frequency 45 Hz ~ 450 Hz. The unique oscilloscope waveform display function of IT8600's can display input voltage & current as waveform. It is equipped with measurement modes for different parameters such as inrush current, peak value, effective value, PF (power factor).
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Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Flip-Flop Electronics
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Analog Devices supplies a range of D type and T type flip flop products. Members of this portfolio can support data transmission rates up to 43 Gbps and clock frequencies as high as 43 GHz. All of our flip flop products are RoHS compliant and available in 3 × 3 or 4 × 4 SMT packages.
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Digital Microscopes
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Our range of products include digi classic digital lcd microscope, digi monozoom i lcd microscope, digi monozoom ii digital microscope, digi zoomstar iii lcd microscope, digi zoomstar iv digital microscope and monozoom e digital microscope.
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Digital Electronic Scale
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A type of electronic weighing machine, which is used to measure many readings
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Metallographic Microscope
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Beijing TIME High Technology Ltd.
A specialized optical instrument used to examine the microstructure of opaque materials, such as metals and alloys, by reflecting light off the polished and often etched surface of a sample.
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Acoustic Microscope
AMI P300
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The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
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Electron Probe Microanalyzer
EPMA-1720
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Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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Electronic Loads
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Chroma Systems Solutions, Inc.
Power conversion testing for automated test systems, LED drivers, power supply testing, battery testing, and much more.
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DC Electronic Loads
LSG Series
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*Operating Mode : C.V/C.C/C.R/C.P/C.C +C.V/C.R + C.V/C.P. + C.C.*High Precision, High Resolution (10 A),High Speed Variable Slew Rate (16A/ s).*Sequence Function for High Efficient Load Simulations.*Parallel Connection of Inputs for Higher Capacity. (With 4 Booster Units : Max 9.45kW or 4 Master Units)*External Channel Control/Monitoring via Analog Control Connector.*Program Mode to Create Work Routines for Repetitive Tests.*Multiple-Interface : USB 2.0 Device/Host and GPIB/RS-232C.*Adjustable OPP/OCP/OVP Setting.
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Temperature Controlled Microscope Stages
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Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
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Binocular Stereo Zoom Microscope Systems
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Our ELZ Series is not only a great choice for an entry level binocular microscope, but it’s cost effective and compact, as well as have a zoom range of 3.5x – 120x with options and a FOV of 67mm – 6mm with options. Our SSZ-II Series, which is a user friendly stereo zoom microscope, has a zoom range of 2x – 180x with options and a FOV of 109mm – 1.3mm with options.
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NanoFluorescence Microscope
NFM
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The NFM is a specialized optical microscope system custom-designed for imaging individual single-walled carbon nanotubes (SWCNTs) through their intrinsic short-wave infrared fluorescence. It is ideal for SWCNT studies in physics, chemistry, biomedicine, and environmental research. The NFM is the new, more affordable replacement for our pioneering NM1 Fluorescence Microscope.
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Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Power Electronics Test Solutions
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Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.
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Atomic Force Microscope
HDM Series
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The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Auditor Universal Electronic Testers
AUET-DC Series
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The Auditor Universal Electronic Testers (AUET) have a broad range of features to accommodate most requirements. These instruments are designed to be bench top mounted and are available in several configurations and various single or multiple torque ranges. They are also available with file capability (DC) models. The DC models require PC software Auditor Tool Manager (ATM).
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Upright Microscope Systems
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Below you can see examples of an upright microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications.
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Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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92 Electronics Applications
Electronics Engineering Apps. PRO.
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Electronics Engineering Apps. PRO.
The Electronics Engineering ToolKit is a universal App. It is designed for both iPhone and iPad.
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Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Electron Probe Microanalyzer
EPMA
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JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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Laser Electronics
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A device that emits light through a process of optical amplification based on the stimulated emission of electromagnetic radiation.
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Raman Spectrometer - Confocal Raman Microscope
XploRA™ PLUS
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Incorporating unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab, the XploRA PLUS is our best multi-sample, multi-user Raman microscope ever.It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman images available, typically 10x faster than conventional Raman imaging.
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Electronic Test Lead Kit
U8202A
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Designed for use with the U3606A DMM and DC power supply; includes leads, alligator clips, mini grabbers, and more
