Wafer Level
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Product
SparkFun Level Shifting MicroSD Breakout
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The SparkFun Level Shifting microSD Breakout is quite similar to the SparkFun microSD Transflash Breakout, but with the included level shifting hardware, this board allows you to utilize a microSD card at Arduino’s SD library’s top speed on a 5V system. With this small breakout board, that is not much bigger than your fingernail, adding mass storage to your project will never be easier.
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Product
Wafer Prober
Precio XL
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Fully automated 300mm wafer prober. The system achieves high productivity, excellent contact performance, improved cleanliness, and short lead time, and offers a number of high value-added functions as options.
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Product
Low Level DC Current Data Logger
Process101A
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The Process101A is one of MadgeTech's newest data loggers. It is part of a new series of low cost, state-of-the-art data logging devices. MadgeTech has taken the lead in offering the most advanced, low cost, battery powered data loggers in the world today.
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Product
Sound Level Meters
Optimus
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The Optimus Sound Level Meters are a range of high performance sound level meters that use the very latest technology to provide you with a simple and accurate tool to measure and record noise levels. Combining the latest digital technology with ease of use. Class 1 & Class 2 to IEC 61672-1:2013 & IEC 61672-1:2002. High performance guaranteed - Class 1 & Class 2 Sound Level Meters.
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Product
IK Level Tester
IK07-10
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IK ratings are defined as IKXX, where “XX” is a number from 00 to 10 indicating the degrees of protection provided by enclosures (including luminaires) against external mechanical impacts. The different IK ratings relate to the ability of an enclosure to resist impact energy levels measured in joules (J). IEC 62262 specifies how the enclosure must be mounted for testing, the atmospheric conditions required, the quantity and distribution of the test impacts and the impact hammer to be used for each level of IK rating. The IK test applicate on lighting luminaires test according to IEC60598 (GB7000) and IEC60068-2-75 (GB2423.55).
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Product
Dynatrol® Level Switch for Low Density Bulk Solids
CL-10GS
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Dynatrol® GS Level Sensor Detector is designed for application to high, intermediate, or low point level detection of bulk solids. The GS Level Detector successfully handles lightweight media applications that are difficult to measure or detect like fine low density powders, flock, fluff or fumed silica, etc.The CL-10GS is typically used with bulk solids in the density range of 5-10 lbs/ft3.
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Product
Spring Impact Hammer IK Level Tester
IK01-06
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The most of luminaires manufactory were request to do IK level test (Impact Protection), LISUN can supply the IK test instrument. IK ratings are defined as IKXX, where “XX” is a number from 00 to 10 indicating the degrees of protection provided by enclosures (including luminaires) against external mechanical impacts. The different IK ratings relate to the ability of an enclosure to resist impact energy levels measured in joules (J). IEC 62262 specifies how the enclosure must be mounted for testing, the atmospheric conditions required, the quantity and distribution of the test impacts and the impact hammer to be used for each level of IK rating. The IK test applicate on lighting luminaires test according to IEC60598 (GB7000) and IEC60068-2-75 (GB2423.55).
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Product
DVB-Signal Level Meters
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PeakTech Prüf- und Messtechnik GmbH
Is a comprehensive multifunction measuring device for channel levels from DVB systems. Channel searches for cable, satellite or terrestrial systems can be carried out, channel lists can be created and managed, or satellite systems can also be aligned.
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Product
Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Product
Wafer Probe Loadboards/PIB
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DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Product
Sound Level Meter
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Is used for acoustic (sound that travels through air) measurements. It is commonly a hand-held instrument with a microphone. The diaphragm of the microphone responds to changes in air pressure caused by sound waves.
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Product
BT Imagine New wafer Thickness System
IS-T1
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Measurement Technique Laser Triangulation1-3 Laser Sensor SpotsLaser Spot Size Optimized for Accuracy and Precision.
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Product
In-situ Wafer Temperature Monitoring
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CI Semi's family of noncontact temperature monitors (the NTM line), offers high end pyrometry products for the measurement of wafer temperatures during process. CI Semi’s flag ship of the line, the NTM Delta, incorporates real-time, same point emissivity measurement and compensation making it the ideal solution for in situ monitoring for processes such as RTP, CVD and PVD. The NTM family is sold to leading tool manufacturers.
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Product
Level Test Set
ET 91
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100 Hz to 2.4 MHz selective/wideband Level Meter & Generator,with Spectrum Analyser and Z/RL/LCL Bridge
