Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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Sematech Analysis and SEMI Standards Analysis
Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
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High Power LED Photo-color-semi Automatic Selector
Shenzhen Chuangxin Instruments Co., Ltd.
Can divide LED in to several groups by chromatic coordinates, correlated color temperature, dominant wavelength or luminous flux.
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EasyMatrixCode
Automatic detection of the code in the imageDecodes ECC200, ECC000, ECC050, ECC080, ECC100 and ECC140 codesComputes quality indicators as per ANSI/AIM, ISO/IEC 15415, ISO/IEC TR 29158 and SEMI T10-0701 standardsVery fast operationImpressive robustness to noise, blur and distortionSupport of GS1 Data Matrix codesEfficient reading of codes in grid layoutMultiple codes reading
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Indoor Multi-Light source of Measurement System for PV Cell
King Design Industrial Co., Ltd.
The multi-light source measurement system is capable of execute I-V measurements by Real-Time One-Sweep Method (RTOSM), which not only removes the capacity effect but also meets the requirements of SEMI PV57-1214. The measurement process is controlled by designed program, thus the measured I-V curve, Pmax/Isc/Voc/… etc, could be exported automatically.This system is applicable to DSSC/OPV/Perovskite measurements.
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10W to 100W - Single Output
DRL Series
*High Efficiency, up to 90%*Low Profile for Building Automation*Class II Double Insulation*ErP Compliant Design*Low No Load Power Consumption*UL 1310 Class 2 Compliant*SEMI F47 Compliant
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Semiconductor Inspection (SEMI)
A process for detecting any particles or defects in a wafer.
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Semi-automated Metrology System
Full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness
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Receiver Semi-Kit
75-NS-3
National RF’s 75-NS-3 receiver is a complete super-hetrodyne mini high frequency receiver, designed specifically for the short-wave listener, electronics enthusiast or radio amateur, who wants to use their hands and build a radio. The receiver is offered as a semi-kit in which the electronic assembly is loaded and functionally tested at the National RF facility. The customer must then go to the grocery store (yes…the grocery store!), procure a can of lunch meat, eat it or give it to the dog, and then proceed to drill and paint the can, in order for it to become the receiver’s enclosure! As the name of the preferred potted meat can has a registered trademark by Hormel Foods, Inc., it won’t be mentioned on this web-site. However, the name of the product is synonymous with unwanted email!!! In addition, there are other food products that might be found that are packaged in the same metallic enclosure. Detailed drilling instructions and final assembly instructions are provided as part of the kit. All other parts required for completion of the receiver are provided as well. Recognizing that the finished assembly looked somewhat like the fabled Collins receiver of the ‘60s, the 75S-3, (particularly when the can is painted a light gray) National RF engineers dubbed it (with tongue firmly planted in cheek, of course) the 75-NS-3! Although we have had fun packaging this receiver in a lunch meat can, it is nothing to turn your nose at! Its performance and portability will surprise you, and it is an ideal radio to bring with you on any trip!
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Film Frame Test Handler
4170-IH
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
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Semiconductor Package Wind Tunnel
WT-100
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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600W to 1056W - Single Output
SWS-L Series
*Low Cost*Active Power Factor Correction*Input Transient Protected IEC61000-4*Universal Input (85 - 265VAC)*SEMI F47 Compliant (208VAC)*Medical Approvals (SWS1000L)
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Semi-automatic 150mm Probe Station
CM460
CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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Hand-Held, Battery-Operated Multi-Frequency Eddy Current Instrument
US-454A
United Western Technologies Corp
The US-454A is a portable, hand-held, battery-operated multi-frequency eddy current instrument that can be connected to a laptop, PC and motion controllers for use in semi- or fully automatic data collection applications. Two encoder inputs enable position stamping of data. Pulse-on position input is ideal for motion control applications. Ethernet and USB capabilities allow instrument control along with time- and position-stamped data transfer to the client computer. Built from the rugged US-454 architecture, the US-454A offers single- and multi-frequency inspection, frequency mixing capabilities, enhanced signal-to-noise ratio, USB, Ethernet and data storage capability, and unprecedented digital strip chart data collection.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Machine Vision Camera - 1.3 MP, 60 FPS, e2v EV76C560, Color
Flea3 USB3
The Flea®3 line of USB3 Vision, GigE Vision and FireWire cameras offers a variety of CMOS and CCD image sensors in a compact package. The Flea3 leverages a variety of Sony, ON Semi, and e2v sensors ranging from 0.3 MP to 5.0 MP and from 8 FPS to 120 FPS. For FLIR GigE and USB3 cameras with the latest sensors and most advanced feature sets, please refer to our Blackfly S and Oryx camera families.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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PI/O Optical Transceiver
GCI's sensors are the preferred solution for E84 optical communications. GCI's full line of PI/O transceivers are fully compliant and are compatible with other manufacturers' sensors that conform to the SEMI Standard E84. Leading 300mm FABs, OEMs, and EFEM manufacturers choose the GCI sensor for its superior reliability and stability.
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500W to 1500W - Single Output
LZSA Series
*Five year warranty*-40°C to +71°C Operation*MIL-STD-810E Vibration / Shock*Input transient protected*UL508, SEMI F47, Factory Mutual (Cl 1, Div 2)*Rugged design with conformal coating*Superior thermal design
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Semi-Portable Gas And Leak Detectors
Semi Portable Gas Detectors and Leak Detectors meet the diverse requirements for gas detection industries throughout the world. Our range offers an ideal solution where a temporary detection or contractual detection is required for a specific project or incident.
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Semi-Automatic Probe Station
P300A
The P300A probe station is the most stable, intuitive, and space efficient 300mm semi-automatic analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300A comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing.
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Semi-automatic Semiconductor Probe Assembly Equipment
The components of the incoming parts are pre-assembled and preloaded to two packages. We use a high-speed four-axis robot equipped with high-precision multi-sensor grips to grab these pre-assembled subcomponents. Under CCD visual guidance, a set of rotary grab devices is equipped to capture top plunger. The device uses a multi-set CCD visual module to ensure accuracy, and the positioning accuracy of each motion link is controlled within 15um.
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Semi-Automatic Isoperibol Calorimeter
AC600
Developed to measure the calorific content of solid and liquid fuels, the LECO AC600 semi-automatic isoperibol calorimeter sets the standard for future calorimetry instruments. Its semi-automated operation, combined with the use of thermodynamic TruSpeed®, obtains a rapid analysis of calorific content and increased instrument throughput without sacrificing accuracy or instrument precision. A new, ergonomically-designed, lightweight combustion vessel assures ease of operation while greatly reducing operator strain.
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Semi-automatic Three-phase kWh Meter Test Bench
SY8310
Hong Kong Songyang Industrial Ltd.
The new SY8310 series semi-automatic three phase energy meter test board, designed according to International Standard, is a newly developed ideal measuring equipment for energy meters. The equipment can be operated easily through test board button to preset directly all data of meter under test and test process.
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Test Handlers
Boston Semi Equipment test handlers are designed for optimum production performance on your test floor.
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Emulator
GCI E84
The GCI E84 Emulator is the world's leading tester for development, implementation and qualification of products that must comply with the SEMI E84 Standard. It provides the industry-standard automated test plans that are utilized by virtually every 300mm FAB and equipment manufacturer worldwide. GCI testers are the only solutions that guarantee 300mm factory automation interoperability.
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Customization & Automation
For production and test bench applications, the operation of the measurement needs to be either semi or fully automated. On top of its turnkey solutions, Oros offers a large number of tools to open the programming access. This can be addressed based on all levels of programming expertise achieved by OROS users themselves, local partners or OROS teams.
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Semi-Automatic Contactless Wafer Detector
NCS-200SA
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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Compound Semi | MEMS | HDD Manufacturing
KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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PXIe Semi-Dynamic Digital I/O Module, 64-Channel
42-419-001
The 40-419-001 (PXI) and 42-419-001 (PXIe) are a 64-channel digital I/O modules suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. They can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Create Topographic Profiles from SPM Images
TopoStitch
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
