Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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Product
Semi- or Fully-Automatic Laser Repair System
LCD 6400
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The Korima Model 6400-L offers an exceptional laser cutting system that exceeds the requirements for flat panel display, large photomask, and color filter repair. Fully automatic and remote controlled, the 6400-L comes with single, dual, or triple wavelength to achieve optimum results in the removal of aluminum, chromium, ITO, and polymide on panels before or after assembly.
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Product
Semi-Automatic Contactless Wafer Detector
NCS-200SA
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Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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Product
Compound Semi | MEMS | HDD Manufacturing
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KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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Product
High Power LED Photo-color-semi Automatic Selector
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Shenzhen Chuangxin Instruments Co., Ltd.
Can divide LED in to several groups by chromatic coordinates, correlated color temperature, dominant wavelength or luminous flux.
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Product
500W to 1500W - Single Output
LZSA Series
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*Five year warranty*-40°C to +71°C Operation*MIL-STD-810E Vibration / Shock*Input transient protected*UL508, SEMI F47, Factory Mutual (Cl 1, Div 2)*Rugged design with conformal coating*Superior thermal design
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Product
32G DDR5-5600 2GX8 1.1V SAM -20~85℃
AQD-D5V32GN56-SBH
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger, Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
8G SO-DDR4-3200 1GX8 1.2V SAM -20~85℃
AQD-SD4U8GN32-SE2
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger, Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
Normalised Site Attenuation
NSA
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Normalised Site Attenuation (NSA) is measured in accordance with CISPR 16-1-4 and ANSI C63.4 in semi and fully anechoic environment.
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Product
PI/O Optical Transceiver
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GCI's sensors are the preferred solution for E84 optical communications. GCI's full line of PI/O transceivers are fully compliant and are compatible with other manufacturers' sensors that conform to the SEMI Standard E84. Leading 300mm FABs, OEMs, and EFEM manufacturers choose the GCI sensor for its superior reliability and stability.
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Product
Semiconductor Package Wind Tunnel
WT-100
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Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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Product
15W to 150W - Single Output
HWS-A Series
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*Limited Lifetime Warranty*UL 508 approved*SEMI F47 Compliant (high line AC)*Universal Input (85 - 265VAC)*Higher Efficiency than HWS Series
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Product
Film Frame Test Handler
4170-IH
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High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
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Product
Semi-Automatic Isoperibol Calorimeter
AC600
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Developed to measure the calorific content of solid and liquid fuels, the LECO AC600 semi-automatic isoperibol calorimeter sets the standard for future calorimetry instruments. Its semi-automated operation, combined with the use of thermodynamic TruSpeed®, obtains a rapid analysis of calorific content and increased instrument throughput without sacrificing accuracy or instrument precision. A new, ergonomically-designed, lightweight combustion vessel assures ease of operation while greatly reducing operator strain.
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Product
600W to 1056W - Single Output
SWS-L Series
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*Low Cost*Active Power Factor Correction*Input Transient Protected IEC61000-4*Universal Input (85 - 265VAC)*SEMI F47 Compliant (208VAC)*Medical Approvals (SWS1000L)
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Product
Optical Transceiver
RJ-11
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The next generation of optical transceiver has arrived with the introduction of GCI's RJ-11 Optical Transceiver. This fully SEMI compliant and Hokuyo compatible unit is the choice of leading 300mm FABs and equipment manufacturers throughout the world to simplify installation and maintenance of their E84 communications.
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Product
Brake Test Systems
Giant 8000 Series
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Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Product
GuardianPro Clean Storage
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The GuardianPro™ family of semi bare reticle stockers, with Tec-Cell® Technology pod stockers, provides ultra-clean highly reliable storage and inspection solutions to meet the current and future needs of fabs around the world. GuardianPro reticle stockers deliver technical advantage by ensuring reticle safety, reducing haze, and providing automation solutions to improve reticle logistics and optimize stepper utilization.
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Product
32G SO-DDR4-3200 2GX8 1.2V SAM -20~85℃
AQD-SD4U32GN32-SB2
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger, Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
32G SO-DDR5-5600 2GX8 1.1V SAM -20~85℃
AQD-SD5V32GN56-SBH
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger. Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
4G DDR4-3200 512X16 1.2V SAM -20~85℃
AQD-SD4U4GN32-SP2
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger. Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
High Force Large Area Bond Tester
Sigma HF
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- For high force and large area- Typically for IGBT, power modules and batteries up to 1000 kgf- High axis speed- Deep access up to 80 mm- SEMI S2 safety cabinet with visual feedback- Flexible positioning of multiple work holders
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Product
16G DDR5-5600 2GX8 1.1V SAM -20~85℃
AQD-D5V16GN56-SBH
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger, Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
EasyMatrixCode
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Automatic detection of the code in the imageDecodes ECC200, ECC000, ECC050, ECC080, ECC100 and ECC140 codesComputes quality indicators as per ANSI/AIM, ISO/IEC 15415, ISO/IEC TR 29158 and SEMI T10-0701 standardsVery fast operationImpressive robustness to noise, blur and distortionSupport of GS1 Data Matrix codesEfficient reading of codes in grid layoutMultiple codes reading
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Product
Semi-automatic 150mm Probe Station
CM460
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CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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Product
Compliance Testing Services
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Compatible Electronics is the largest commercial compliance test lab in Southern California, with four test locations, 10 Open Area Test Sites (OATS) and 7 Semi Anechoic Facilities. All open field sites (OATS) are in low ambient areas, which is ideal for radiated emissions testing.
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Product
300W to 1800W - Single Output
HWS Series
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*Limited Lifetime Warranty*UL 508 approved*SEMI F47 Compliant (high line AC)*Universal Input (85 - 265VAC)*High Efficiency*Class 1 Div 2 option (/RY suffix)
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Product
6TL29 Semi-Automated Test Platform
AQ377
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- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
8G DDR5-5600 1GX16 1.1V SAM -20~85℃
AQD-D5V8GN56-SCH
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger, Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
4G DDR3-1600 512X8 1.35V&1.5V SAM -20~85℃
AQD-D3L4GN16-SGH
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger, Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
Semiconductor Inspection (SEMI)
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A process for detecting any particles or defects in a wafer.
