Scanning Electron Microscopy
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopes, SEM
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Electronics
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Flann provides control processors and switch drivers that support all Flanns current range of programmable attenuators, phase changers and waveguide switches
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PC System Electronics
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Keysight PC electronics provide state of the art laser interferometer performance in the convenient PC backplane format. Axis, servo-axis and compensation boards are available.
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Single Molecule Microscopy
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Nano-scale precision motion and stability are cornerstones of research grade microscopes for single molecule imaging. Mad City Labs has developed modular microscopes that ease integration of optical components and assist users with developing and adapting instrumentation for their own application requirements. Contact our single molecule microscopy application development team to discuss the right products for your application.
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DC Electronic Load
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DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more.
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Testing & Programming Solution - Electronic Assemblies
BARCUDA VP230
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The BARCUDA VP230 is the right system if you are looking for a complete turnkey solution for flexible testing and programming of your electronic assemblies. The stand-alone unit uses the technologies of embedded JTAG solutions such as VarioTAP or ChipVORX. However, you can also expand these to meet the functional test requirements of your electronics production.
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Electronic Brake Meter
2000-R
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The Bowmonk 2000-R is our next generation electronic brake meter, featuring a built-in printer, keyboard, GPS receiver, and coming soon built-in Wi-Fi for automatic uploading of brake test results. Significant processing power and on-board storage enables the Bowmonk 2000-R to be customised for various applications. The Bowmonk 2000-R also supports an optional pedal force transducer to measure the force applied to the vehicle's footbrake during braking. Using the pedal force transducer will also identify any "braking delay" - the time between depressing the brake pedal and the brakes being applied.
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General Microscopy
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Nano-scale precision motion and stability are cornerstones of research grade microscopes for high resolution imaging. Mad City Labs provides nanopositioning systems, micropositoining systems, and stabilization systems that assist users with developing and adapting instrumentation for their own application requirements. Contact our sales and engineering team to discuss the right products for your application.
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Single-sensor Color Area Scan Cameras
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JAI provides a wide selection of single-sensor color area scan cameras with resolutions ranging from VGA to 20 megapixels. Cameras are built around state-of-the-art sensor technology including the latest CMOS global shutter imagers, as well as some with traditional CCDs.
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Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
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MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Scanning Probes
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Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
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AC Electronic Load
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AC&DC Electronic Loads are design for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources and other power devices such as switches, circuit breakers, fuses and connectors.
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Collaborative Correlative Microscopy
nanoGPS navYX
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Correlative microscopy is the combination of multiple modalities performed on the same sample. The results produced emphasize the strengths of each modality while offsetting their individual limitations.nanoGPS navYX™ is an open solution which makes SEM-Raman correlative microscopy seamless regardless of the electron and optical microscopes used. Simply stick the Coordinates Transfer System to the sample!
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1149.6 Boundary Scan Feature, GTE 10.00p
K8213A
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Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
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Input Characteristic Analyzer of Electronic Ballast
UI2001
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• 4 display windows for V (600V), A (2A), W, PF/Hz • THD, 0 to 39th harmonic components • Accuracy: ± (0.4% reading + 0.1% range + 1 digit) • Data and curves printable. All the data and curves can be displayed after being connected with PC
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Electronic Development & Manufacturing
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Our employees offer proven expert knowledge and application know-how in the development of finished products, embedded electronic systems and software applications on the most varied complexity levels. Solutions for the automotive, aviation and production industries are created using a combination of modern development methods and tools and µ-electronics, embedded electronics, firmware and software.
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High Power DC Electronic Load
34000A Series（5KW~40KW）
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34000A Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
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300 Watt Electronic Load Module
N3304A
Load Module
The Keysight N3304A is a 300 W (0-60A, 0-60V)electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3304A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3304A can also digitize waveforms.
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Programmable DC Electronic Loads
SDL1000X/X-E Series
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SDL1000X/SDL1000X-E series Programmable DC Electronic Load has a 3.5 inch TFT-LCD display, a user-friendly interface and superb performance specifications. The SDL1020X/SDL1020X-E models feature an input range of 150 V/30 A 200 W while the SDL1030X/SDL1030X-E have an input range of 150 V/30 A 300 W. The SDL1000X series leads with measurement resolution of 0.1 mV/0.1 mA and the base SDL1000X-E series resolution is 1 mV/1 mA and adjustable current rise times from 0.001 A/μs~2.5 A/μs. For remote communication and control, the SDL series includes RS232/USB/LAN interface types. The SDL1000X series delivers stability over a wide range of applications and can meet all kinds of testing requirements. including: Power, battery/handheld device design, industry, LED lighting, automotive electronics, and aerospace.
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Color Measurement With Line Scan Cameras
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The Chromasens line scan cameras offer new approaches for the color-accurate capture of objects. The chromaPIXA has an internal FPGA-based color calculator which converts the color information of the CCD sensor on-the-fly into standard output color spaces. Algorithms are used which allow a more precise transformation than the usual 3x3 matrix transformation.
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Misc. Electronic Instruments
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Electronic components for test and measurement come in all sizes.
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Electron Spectrometers
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SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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3D Scanning Software
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Software is a comprehensive component to any advanced metrology system. Combined with laptops and portable equipment, 3D scanning and measurement is now possible virtually anywhere. 3D scanner software plays a critical role in every stage from the creation of a concept design to the manufacturing and inspection of prototypes. Below is a look at some of the Laser Scanner Software and 3D Scanner Software providers and platforms we represent and handle.
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Laser Scan Heads
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Aerotech supplies high-performance 2D, 3D and 5D laser scan heads to meet a diverse range of precision manufacturing challenges. Choose from standard options or leverage our expertise in designing laser manufacturing systems.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Laser Scanning and Emission Tools
InfraScan™ 400TDM
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The InfraScan™ 400TDM is the newest evolution of Checkpoint’s pioneering top-down laser scanning and emission tools. This tool is specifically designed to accommodate any commercially available probe station, up to 300 mm wafers.
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Power Electronic Devices
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REINHARDT System- und Messelectronic GmbH
We also produce the power electronics devices listed below. They can be integrated into all our Test Systems.
