Si
atomic number 14 tetravalent metalloid chemical element.
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Product
Ultra-Low Noise 2 kHz Photoreceiver w/ Si-PIN Photodiode
PWPR-2K-SI
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Picowatt Photoreceiver series PWPR-2K with switchable gain (10 to the 9th V/A, 10 to the 10th V/A) and a bandwidth from DC to 2 kHz is the perfect choice for cw-measurements, time resolved signal acquisitions and highly sensitive modulated measurements. Si and InGaAs models cover the wavelength range from 320 to 1700 nm.
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Product
Si Detectors & Spectrometers
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Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Product
4-Port Serial Interface, Modular, With/Without Optical Isolation, 3.3V
CPCI-7500
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*This Model has a 37-pin D-Sub male connector*RS232, RS422, RS485, 20 mA Current Loop*Modular structure through SI modules*With or without optical isolation*Mode configuration free for each port*128-byte FIFO-buffer, common interrupt*Transfer rate programmable up to 115,200 Baud*Option: up to 1 MBaud for RS485 and RS422*Automatic direction recognition for RS48*Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)*Transmission mode asynchronous, full, half duplex*Transfer rate: progr. up to 115.2 kBaud up to 1 MBaud on request*Protocol: 5, 6, 7 or 8-bit character 1, 1? or 2 stop bits*Parity: even, odd, none, mark or space*Interrupt lines: automatic through BIOS
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
Chemical Calibration
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Trescal provides full Chemical Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Chemical Calibration services can be delivered at your site or at our lab. Accreditations for our chemical calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Magnetic Susceptibility Meter
SM-20
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The SM-20 magnetic susceptibility meter is very useful tool for a number of geological and geophysical applications where the unique sensitivity of 10-6 SI units together with its small, shirt-pocket size and low weight are appreciated.
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Product
Acoustic Calibration
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Trescal provides full Acoustic Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Acoustic Calibration services can be delivered at your site or at our lab. Accreditations for our acoustic calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
DVB Analyzer
DVB Inspector
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DVB Inspector is an open-source DVB analyzer, written in java. It can show the logical structure of the DVB SI and PSI data. It also shows bit rate usage data. DVB Inspector can be used to analyse contents; MPEG Video structure, teletext, DVB subtitles, DSM-CC Object carousels.
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Product
Optical Node
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Sichuan Jiuzhou Electronic Technology Co.,Ltd
* Philips CGD914 amplifier module that employs both GaAs and Si dies.* 4 outputs, output level ≥100dBμV when optical input at -1dBm.* Plug-in fixed attenuator, fixed equalizer.* Optical power indication for -7 ~ 0dBm.* FP laser or DFB laser for return path.* RF test point for forward path and return path.* Optional SNMP responser unit supporting JIUZHOU HFC Net Managing software.* AC 60V or AC 220V power supply.* Aluminum die-casting housing.
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Product
Avalanche Photodiodes
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Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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Product
Pressure Calibration
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Trescal provides full Pressure Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Pressure Calibration services can be delivered at your site or at our lab. Accreditations for our pressure calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Mass Calibration
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Trescal provides full Mass Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Mass Calibration services can be delivered at your site or at our lab. Accreditations for our mass calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Volume Calibration
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Trescal provides full Volume Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Volume Calibration services can be delivered at your site or at our lab. Accreditations for our volume calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Medical Device Calibration
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Trescal provides full Medical Device Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Medical Device Calibration services can be delivered at your site or at our lab. Accreditations for our medical device calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
4-port Serial Interface, Modular, With/without Optical Isolation, 3.3V/5V, With 9-pin Connectors
APCI-7500-3/4C
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*This model has 4x 9-pin D-Sub male connectors on 2 brackets*RS232, RS422, RS485, 20 mA Current Loop*Modular structure through SI modules*With or without optical isolation*Mode configuration free for each port*128-byte FIFO-buffer, common interrupt*Transfer rate programmable up to 115,200 Baud*Option: up to 1 MBaud for RS485 and RS422*Automatic direction recognition for RS48*Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)
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Product
Power Meters and Calibration Cells
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The Solar Reference Cell consist of a 20 x 20 mm monocrystalline silicon Photovoltaic Cell encased in a 92 x 70 x 16 mm metal enclosure with a protective quartz window and a temperature sensor. The temperature sensor is a 100 ohm platinum Resistance Temperature Detector (RTD).The Solar Reference Cells come with a Certificate of Calibration and compatible set of connecting cables. The following parameters of the reference cell are certified: Isc, Imax, Voc, Vmax, Pmax, Area, Fill Factor and Efficiency. The certification is accredited by NIST to the ISO-17025 standard and is traceable both to the National Renewable Energy Laboratory (NREL), and to the International System of Units (SI). A compatible cable set is also supplied with each Solar Reference Cell.
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Product
KV CAPS
1000 V
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Macom Technology Solutions Holdings Inc.
The MACOM KV CAPS™ Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available in surface mount (SMT) plastic packages or in hermetic ceramic packages.
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Product
Potentiostats
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AMETEK SI offers a range of bipotentiostats, single and multi channel potentiostats and galvanostats through both the Princeton Applied Research and Solartron Analytical brands.
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Product
AAA Solar simulator
SS50AAA-PLC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
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Product
Resister
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Our ARFC type Film Flat Chip Resistor & ARFCN type Thin Film Chip Resistor Network are high precision Metal Film resistors produced with high purity. Alumina Substrate and Ni-Cr-Si Resistor Film based on high precision Etching Technology. The electrode Terminals are made with Spattering Film and Nickel-Solder Plating, and solderability is very good in all Flow, Reflow and Dipping type soldering for Hybrid IC, SMT, PCB etc. Our ARFC Metal Film Resistor & ARFCN type Thin Film Chip Resistor are being produced under the thorough quality control, and are being used widely in high precision and high reliability electronics circuit such as Measuring Instrument, Medical Instruments, Communication and other Industrial Instruments.
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Product
Magnetic Calibration
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Trescal provides full Magnetic Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Magnetic Calibration services can be delivered at your site or at our lab. Accreditations for our magnetic calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
FCB Probe Card
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The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Product
Velocity Calibration
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Trescal provides full Velocity Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Velocity Calibration services can be delivered at your site or at our lab. Accreditations for our velocity calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Viscometry
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SI Analytics, a brand of Xylem, formerly SCHOTT® Geräte and SCHOTT® Instruments, is a world-renowned manufacturer of glass capillary viscometers and automatic viscometry meters.
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Product
RF Front-end
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The RF integrated passive device (RF IPD) uses a high-resistivity substrate to integrate quality factor components such as capacitors and indictors. Many functions like impedance matching networks, harmonic filters, couplers, baluns, and power combiners/splitters can be designed using IPD technology. ST's IPDs are manufactured using thick film and HiRes Si or glass wafer manufacturing technology and photolithography processing.
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Product
Single Port Serial Interface
APCI-7300-3
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*PCI interface to the 32-bit data bus. *Asynchronous communication adapter, 1-port serial interface*1 socket for SI modules*Modular structure through SI modules*Configurable as: RS232, RS422, RS485, with or without isolation, or 20 mA Current Loop (active, passive) with isolation*Addressing through software
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Product
IV Tester System
PET-CC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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Product
Scanning Slit Beam Profilers
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DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
