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Sputter Coater & Freeze Fracture Solutions
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To obtain high-quality images of samples with scanning (SEM) or transmission electron microscopy (TEM), your samples need to be conductive to avoid charging. If a sample does not have a high enough conductivity, then you can quickly cover it with a conductive layer using the method of sputter coating. Also, a carbon or e-beam evaporator coating can be used. Such coatings protect the sample, allow enhancing of the EM image contrast, or can act as a TEM-grid support film for small scale samples.
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Image Analysis & Stage Micrometers
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The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Product
Chromaline Camera
MC2
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Sciences et Techniques Industrielles de la Lumière
Because of this limitation, expensive and complicated Z-scanning systems and/or auto-focusing mechanisms are required to view samples with larger Z-extension and moving samples.Chromaline camera incorporating chromatic confocal microscopy technology is a technology that enables the design of optical systems with a very large depth of field (up to several mm).With Chromaline camera, frequency acquisition is available up to 199,500 lines/second.
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Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Microscopy Software
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Our modular software platforms enable you to acquire, process and analyze images in multiple dimensions and over various timepoints
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Scientific CCD Image Sensors
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Our front and backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, In vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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SPA100
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Our highly sensitive source picoammeter is designed for measuring and logging very small currents down to the pA range - making it an ideal instrument for scientific and research applications, including physics, materials science and electron microscopy. Full-featured at an affordable price, the SPA100 combines sensitivity, accuracy and stability to allow users to measure low currents with high precision as well as conveniently source bias voltages for experimentation. SPA100 also doubles as an ultra-high resistance meter, measuring accurately into the teraohm range. As with all our “headless” products, the SPA100 connects to PC via USB and utilises our complimentary software EPIC - enabling users to easily measure, graph and capture readings with timestamps and measurement stability information.
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PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785164-01
FlexRio Digitizer
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
Laboratory Instrumentation
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Haydon Kerk Pittman has developed motion control systems used in: multi-axis sample management systems requiring high performance and reliability to meet high duty cycle requirements; microscopy stages demanding high precision positioning in multiple axis simultaneously; motion systems for automatic pipetting which requires very accurate motion for aspiration and dispense modes helping to eliminate manual pipetting errors.
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Product
X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Microscopy and Nanotechnology Labs
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Integrated Dynamics Engineering
IDE, with the most vibration isolation and EMI cancellation systems in use today, is no stranger to nanotechnology. For over twenty years, IDE has been addressing the special needs of research environments with advanced isolation solutions. IDE’s influence and global reach can be seen in the most cutting edge labs pushing physical boundaries to extremes in advanced materials, surface science, microbiology and more.
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Femtosecond Terahertz Spectrometer
Pacifica
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Terahertz spectroscopy and microscopy are becoming a powerful tool in biology, medicine, semiconductor physics and in many applicaitons. Designed for obtaining THz spectra by using of THz pulses generated by femtosecond laser in oriented ZnTe crystal.
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Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Fourier Transform Infrared Spectroscopy (FTIR)
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Rocky Mountain Laboratories, Inc.
FTIR Analysis is used to analyze organic materials. Bulk and small particle materials can be analyzed. FTIR microscopy analysis allows for the identification of particle as small as 10 µm.
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Highly Dynamic XY Linear Motor Scanning Stage
L-731
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Physik Instrumente GmbH & Co. KG
The magnetic linear direct drive is designed to provide high velocity and acceleration for inspection and microscopy. With a travel range of 205 mm square and solid velocity to 100 mm/sec, the L-731 is equipped to deliver high accuracy and smooth motion. Precision crossed roller bearings with anti-creep cage assist enable superior guiding accuracy (1.5 m straightness for loads up to 20 kg). An integrated optical reference encoder and limit switch provide further positioning control and accuracy for this compact stage with 5 nm resolution. DC servo motor versions are available on request.
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EMCCD Cameras
iXon Life
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With the iXon EMCCD cameras, Andor have delivered a dedicated, truly high-end, yet accessible ultrasensitive scientific camera platform, designed specifically to drive the absolute best from EMCCD technology across all critical performance specs and parameters. Andor’s new iXon Life EMCCD platform is available exclusively for fluorescence microscopy applications and is engineered to deliver single photon sensitivity with absolutely unparalleled price/performance. Perfect for single molecule detection and live cell microscopy with minimized phototoxicity or photobleaching, but at a price more normally associated with back-illuminated sCMOS cameras.
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PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785171-01
FlexRio Digitizer
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
Cross Sections and Metallography
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Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
