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Heat Stress Meters
The heat stress meter is mainly used in the workplace. The heat stress meter can detect and classify temperature in relation to the amount of moisture content. What is heat stress? And why is heat stress measured? People who work in installations or with machines that produce a lower energy level or a high emission of temperature can occasionally suffer heat stress (by the influence of body temperature). This phenomenon can also cause physiological symptoms: spasms, feeling unwell and shock that can in some cases prove fatal.
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Heat Stress WBGT Meter
Heat Stress Index measures how hot it feels when humidity iscombined with temperature, air movement, and radiant heat Black Globe Temperature (TG) monitors the effectsof direct solarradiation on an exposed surface Air Temperature (TA) plus Relative Humidity (RH) Selectable units of F and C In/Out Function displays the WGBT value withor without direct sun exposure Auto Power Off with override Built-in RS-232 interface with optional Windowscompatible software Complete with two AAA batteries
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Extremely Accelerated Stress Test Chambers
The extremely accelerated stress environment is defined by high temperature, high humidity and high pressure. WEIBER provides humidity resistance evaluation test for electronics components through customized Extremely Accelerated Stress Test Chamber. This chamber provides high performance test in minimal amount of time according to international IEC 60068-2-66 standard. This chamber also known as Accelerated Stress Test Chamber, Halt and Hass Test Chamber, Halt Test Chamber and Hass Test Chamber.This chamber reduces the time taken for humidity testing in electronic components. 2 types of tests saturated and unsaturated extremely accelerated stress test can be performed. In saturated test the temperature is maintained at 1210C at 100%RH, and for unsaturated temperature of 110, 120, 1300C is maintained at 85%RH. Normally for electronic components unsaturated type test is done.
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Encoder Stress Pattern
ESP™
SRI's ESP is a sophisticated video clip consisting of specialized and complex artificial test patterns that stress various aspects of processing to quickly reveal television encoder deficiencies. Its unique motion sequences allow users to visually evaluate and objectively compare the quality and performance of standard- and high-definition encoders.
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Load Testing vs. Stress Testing
A load test is a planned test to perform a specified number of requests to a system in order to test the functionality of the system under specific levels of simultaneous requests. A load test ensures that a web system is capable of handling an expected volume of traffic, and therefore is sometimes referred to as volume testing. The goal of a load test is to prove that a system can handle the expected volume with minimal to acceptable performance degradation. The threshold of acceptable performance degradation must be defined by the testers as some value considered acceptable to the end user so that users will not bounce from the site.
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Highly Accelerated Stress Test Chambers
HAST
Our HAST systems have a modern design that's easier to use: Automatic humidity filling; Automatic door lock; A more square workspace; allowing more product to be loaded;Convenient, hermetic power-pin system for bias testing. We are now able to offer a hermetic port system to allow special signal lines like coax or fiberoptics to be run into the chamber.
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Environmental Stress Screening (ESS) Chamber
ESS
Developed to help electronics manufacturers detect product defects and production flaws, Environmental Stress Screening (ESS) forces infancy product failures that would otherwise occur after final assembly and product delivery. ESS’s goal is to improve profitability by eliminating defective products. ESS Systems can meet individual performance needs, product loading, and throughput requirements. Thermotron has the experience to provide the best solution for ESS testing at your company.
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Lab-Type Environmental Stress Screening Chambers
ESS5/11 SERIES
The ESS5/11 Series provides the unique capability of stress screening products in a small, lab-type chamber. Pre-qualification for ESS, troubleshooting, and small scale ESS programs would all benefit from high air flow, high change rate testing in this compact design. This series can accommodate up to six product drawers from our standard ESS systems. Other features include non-CFC/HCFC design, and wide variety of control systems, refrigeration system sizes, and product fixturing options.
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Heat Stress
Our lineup of heat stress meters include the WBGT (Wet Bulb Globe Temperature) meters, which provides the most accurate determination of the heat stress index based on the cumulative effect of air temperature, air movement, relative humidity, and radiant heat.
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Optical Receiver Stress Testers
Developing next-generation optical receiver technology requires world-class stress testing. Use Keysight's automated calibration solution and get optical stressed eye results in one-tenth the time compared to a manual setup.
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Shear Stress Sensors
DirectShear™
Micromachined floating element shear stress sensor that enables time-resolved, one-dimensional, direct shear stress measurements. Direct measurement of shear stress — no heat transfer calibration. Non-intrusive — minimal flow disturbance. Simultaneous mean and fluctuating shear stress measurements. High resolution, dynamic range and bandwidth. Highly accurate, quantitative measurements.
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PCB Interconnect Stress Test System
PWB Interconnect Solutions Inc.
Integrated package including PC, Software with real time graphing and all related systems and hardware for 8 head, dual sense testing model IST-HC
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Strain Measurements and Experimental Stress Analysis
Experimental structural testing using strain gauges is necessary in a wide range of applications from airframes and sub-assemblies down to individual components such as turbine blades, satellites, wind turbines, buildings, bridges and many others. These tests enable the engineers to compare the acquired data with the predicted results from the design calculations.
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Accelerated Stress Test Chamber
CSZ's accelerated stress test chambers combine mechanical refrigeration; LN2 cooling and high velocity air flow for fast product temperature change rates. Chambers are typically designed with a change rate up to 30C (54F) per minute based upon the part temperature. Common uses are production stress testing circuit boards, electronic drives, assemblies, etc. Design allows the user to quickly control and change the temperature of the product.
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Automated Thermal Stress System
ATSS Series
Thermotron's Automated Thermal Stress Systems (ATSS) facilitate extremely rapid product temperature change rates in a space-saving, self-contained design that accelerate a Thermal Stress test. Thermotron's ATSS chambers meet the latest MIL-STD 883E and MIL-STD 202F thermal shock specifications as well as JEDEC and IPC test methods. ATSS chambers are capable of the following: Rapid thermal shocking, Accelerated product stressing, Controlled thermal cycling in a self-contained, compact design. With separate hot and cold zones, the Automated Thermal Stress System was designed with a patented retractable product transfer carrier that makes full use of the available working volume in both temperature zones for increased product loading and throughput. The product transfer carrier reduces the overall height requirements of the chamber and is made as light as possible to minimize thermal loading restraints. Thermotron ATSS chambers can be used as part of most commercial reliability and quality control programs, helping to determine:
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Environmental Stress Screening
E.S.S
King Design Industrial Co., Ltd.
E.S.S system could find most potential and hiding defects earlier by checking the physical property of allmaterials and components, and make use of their nature response under Environmental Stress. Through our screening will to pick out all potential and hiding defects in advance and improving the product's reliability inling. It benefits the manufacturer and customer mutually.
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Optical Receiver Stress Test Solution
N4917BSCB
The Keysight N4917BSCB optical receiver test solution is a complete, automated and repeatable solution for optical receiver stress test.
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Stress Analysis Strain Gages
Bondable foil strain gages (strain gauges) available in thousands of possible pattern designs and combinations of grid alloys, backing materials, resistances, and options.
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Stress screening test chambers for temperature and climate
TS and CS series
Our based on the modular concept of the standard range of temperature and climatic stress screening test chambers allow you through increased compressor and large fan performance very high temperature change of up to 30 K / min with conventional refrigeration, or to 70 K / min with liquid nitrogen. These devices allow you to very quickly determine the load limits of your test object in fast motion.
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Temperature & Humidity Chambers
Z-Plus
CSZ''s Z-Plus Test Chambers are capable of simulating a variety of temperature and humidity conditions for environmental testing. Z-Plus chambers are available in a variety of sizes and performance packages with over 90 models to choose from and may be used for basic thermal cycling to accelerated stress testing. Sizes range from 8 cu. ft. (227L) to 64 cu. ft. (1812L). These chambers are designed for ease-of-use, reliability and performance and include many user-friendly features standard with your purchase for the best value in the industry.
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Geotextile Water Permeability Tester
TG010
TESTEX Testing Equipment Systems Ltd.
Geotextile Water Permeability Tester, to determine the constant-head water flow capacity (water permeability) within the plane of a geotextile or geotextile-related product, is measured under varying normal compressive stresses, typical hydraulic gradients and defined contact surface.
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Hydraulic Universal Testing Machines
UH-X/FX Series
Environmentally and operator friendly state-of-the-art universal testing machine The operability and visibility of the computer-controlled hydraulic servo type universal testing machine (UH-X) and the high-performance universal testing machine (UH-FX), equipped with front opening type hydraulic grips, have been greatly improved by the adoption of a large color touch panel. Equipped with a semi autotuning function that automatically adjusts the control parameters, stress control and strain control (ISO 6892 compliant) can be easily carried out without the need for a preliminary test. The UH-Xh and UH-FXh models feature a new hybrid hydraulic oil source that reduces the required quantity of hydraulic oil, thereby achieving a major reduction in electrical power (about 50 %).
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Avionics Test Solutions
IES Systems is a turnkey test systems solution provider with 10 years of proven experience in avionics test solutions. We provide final acceptance test equipment and environmental stress screening test equipment for the following programs.
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Surface Mount Ball & Socket Test Point
SMOX
SMOX is a unique select on test terminal which provides accurate line tests in PCB assembly. Supplied loose or on tape and reel for ease of assembly, its unique retention mechanism enhances reliability through low stress contact.
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Mechanical Creep and Rupture Testing Machine
MRC Series
Jinan Testing Equipment IE Corporation
MRC series mechanical creep and rupture testing machine with single-lever structure is designed for long-term creep and stress rupture test applications. The series mechanical creep and rupture testing system is mainly for the metallic materials under room or elevated temperature according to GB/T2039, GB/T 20120, EN ISO 204-2009 and ASTM E139. The creep and rupture testing machine can also maintain constant loads for extended periods of time. Through the mechanical advantage of the lever arm loading system, constant loads can be maintained with a high degree of accuracy for long duration. This creep and rupture tester uses dead weights without continuous operation and the dependency of a mechanically powered drive. The creep and rupture testing system is an ideal equipment for metallurgy manufacturer, research institute, colleges and other relevant factories and mines.
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Serial AC Power Sequencer
90-200-001
Each power outlet can be programmed to switched on in sequence with a specific timing delay. The delay can be staggered to ensure that order dependent systems - like PXI - can be switched on and off in an orderly way with just one operation. A staggered start up also limits the inrush current associated with the powering up of equipment, including earth current inrush, placing less stress on cabling and leakage breakers. Power on or off instructions can be initiated from either the front panel switch or via the serial interface.
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Passive Oscilloscope Probes
5900 SERIES
Probe Master's new 5900 series passive oscilloscope probes are available in 400 MHz & 500 MHz bandwidths. Probes are also available with readout actuators for oscilloscopes with the readout feature. The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.The probe body is made of high impact ABS. Soft molded strain reliefs at all stress points assure long cable life. In short it has been designed to offer you high performance coupled with high quality.
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Rapid Temperature Change Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
Sanwood is the company capable of offering a series of Rapid ESS Test Chamber,Rapid Temperature Change Test Chamber,Environmental stress screening (ESS) test chamber,Environmental stress screening test chamber,Temperature Change Test ChamberEnergy-saving design: Adopting PID + PWM principle of VRF (refrigerant flow control) technology to achieve low-temperature energy-saving operation (electronic expansion valve according to thermal energy conditions refrigerant flow servo control technology) low temperature working state, the heater does not participate in the work, through PID + The PWM regulates the flow rate and flow direction of the refrigerant, and regulates the three-way flow of the refrigerant pipe, the cold bypass pipe, and the hot bypass pipe to achieve automatic constant temperature to the working chamber. This method can reduce energy consumption by 30% under low temperature conditions.
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High Voltage Surge Current Monitors
HVSCM
Designed to be used with the Model HVST High Voltage Surge tester. The Surge Current Monitor allows simultaneously surge testing 20 units. The Surge Current Monitor monitors the current going through each unit under test at the time of the surge. If a unit under test breaks down or leaks, the Surge Current Monitor will identify the bad unit by lighting the corresponding LED. The most important features of the surge tester are its ability to test the entire winding insulation system. A high voltage surge generates turn to turn, coil to coil, and phase to phase voltage stress, as well as ground insulation stress. When used as a dielectric test, accurate voltage readings are essential. The HV Surge Tester monitors the voltage directly across the winding under test. In production testing we expect that most of the time the devices will pass. In the event that one should fail, the failed device would be removed and then all the parts would have ot undergo another surge test. Since most devices pass most of the time, simultaneous surge testing can be a real time saver.
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Wafer Bonder
AML
Wafer bonding has found many applications in the field of MST, MEMS and micro engineering. These include the fabrication of pressure sensors, accelerometers, micro-pumps and other fluid handling devices. The process is also used for first-order packaging of silicon microstructures to isolate package-induced stresses. The OAI AML Wafer Bonder facilitates both the alignment and bonding to be performed in-situ, in a high vacuum chamber. For anodic bonding the wafers are loaded cold and heated in the process chamber. For high accuracy alignment the wafers are aligned and brought into contact only after the process temperature has been reached, thus avoiding differential thermal expansion effects which can compromise alignment. The AML Wafer Bonder is excellent for anodic bonding, silicon direct and thermal compression bonding applications. These features enable the bonder to be used with virtually any processing tool.
