Flash Device
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Product
Flash Storage Device
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Axiomtek provides various industrial-grade flash storage device for customers to simplify and shorten the system design time.
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Product
Flash Memory Test System
T5830
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T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
Flash ISP Feature, GTE 10.00p
K8219A
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The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
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Product
CF Cards
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a durable, high-capacity, and fast-acting flash memory storage device primarily used in professional cameras, camcorders, and industrial applications.
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Product
Location Devices
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Flash Pinger is a small battery powered acoustic transmitter as well as an optical flashing recovery device. Multiple settings allow for selection of flashing, timing, and frequency options for use in a variety of different applications.
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Product
JTAG USB Controller
NetUSB-1149.1/E
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The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.
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Product
PLD ISP Feature, GTE 10.00p
K8220B
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The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Product
High Speed Pick and Place Handler
Commander 2000
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At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
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Product
FPGA-Based Ultra-Fast Flash Programmer
XJFlash
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XJFlash is an FPGA-based advanced and innovative method that uses JTAG for high-speed in-system programming (ISP) of flash memories – all serial and parallel flash devices are supported. The most common use of XJFlash is programming the SPI/QSPI NOR flash used to configure an FPGA.
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Product
Universal Automated Programming System
4900
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The 4900 is powered by the newest BPM 9th generation technology, which delivers the fastest programming speeds in the industry for MCU’s, eMMC HS400, NAND, NOR and Serial Flash devices. BPM 9th generation technology produces 200 MHz signals, allowing each byte of data to transfer in up to 2.5 ns. Up to 9 times faster than competing programmers. 3D Vision option inspects BGA, CSP, QFP, TSOP, SOIC and J-Lead devices for coplanarity, bent lead, pitch, width, diameter, standoff and XY errors.
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Product
Flash ISP Feature, GTE 10.00p
K8219B
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The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
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Product
Debug probe for ARM Cortex processors
USB Multilink ACP
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P&E’s USB Multilink ACP is a debug probe which allows a PC/laptop access to JTAG/SWD on ARM Cortex devices from several manufacturers (see complete list below). It connects between a USB port on a Windows machine and the standard debug connector on the target. The product photos to the left of this page show how the headers can be accessed by simply flipping open the plastic case. Ribbon cables suitable for a variety of architectures are included. By using the USB Multilink ACP, the user can take advantage of the debug mode to halt normal processor execution and use a PC to control the processor. The user can then directly control the target’s execution, read/write registers and memory values, debug code on the processor, and program internal or external FLASH memory devices.
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Product
Semiconductor Memory Tester
T5851
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Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Product
Memory Test System
T5835
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The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Product
PLD ISP Feature, GTE 10.00p
K8220A
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The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Product
Dynamic Power Device Analyzer/Double Pulse Tester
PD1500A
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As an off-the-shelf measurement solution, the PD1500A delivers reliable, repeatable measurements of wide-bandgap semiconductors. The platform ensures user safety and protection of the system’s measurement hardware.
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Product
USRP-2955, 10 MHz to 6 GHz, 80 MHz Bandwidth, GPS-Disciplined OCXO, Reconfigurable USRP Software Defined Radio Device
785264-01
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The USRP-2955 provides an integrated hardware and software solution for rapidly prototyping high-performance wireless receiver systems. It is designed for over-the-air signal acquisition and analysis. It features a two-stage superheterodyne architecture with four independent receiver channels and shares local oscillators for phase-coherent operation. It also offers a Kintex-7 FPGA programmable with the LabVIEW FPGA Module. With these features, the USRP-2955 has the RF and processing performance for applications such as spectrum monitoring, direction finding, signals intelligence, wideband recording, and radar prototyping. The USRP-2955 is equipped with a GPS-disciplined 10 MHz oven-controlled crystal oscillator (OCXO) Reference Clock, which improves frequency accuracy and synchronization.
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Product
USRP-2954, 10 MHz to 6 GHz, GPS-Disciplined OCXO, Reconfigurable USRP Software Defined Radio Device
783153-01
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The USRP-2954 provides an integrated hardware and software solution for rapidly prototyping high-performance wireless communication systems. Built on the LabVIEW reconfigurable I/O (RIO) architecture, USRP RIO delivers an integrated hardware and software solution, so researchers can prototype faster and shorten time to results. You can prototype a range of advanced research applications that include multiple input, multiple output (MIMO); synchronization of heterogeneous networks; LTE relaying; RF compressive sampling; spectrum sensing; cognitive radio; beamforming; and direction finding. The USRP-2954 is equipped with a GPS-disciplined 10 MHz oven-controlled crystal oscillator (OCXO) reference clock. The GPS disciplining delivers improved frequency accuracy and synchronization capabilities.
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Product
USRP‑2930, 20 MHz Bandwidth, 50 MHz to 2.2 GHz, Included GPS-Disciplined OCXO, USRP Software Defined Radio Device
781910-01
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20 MHz Bandwidth, 50 MHz to 2.2 GHz, Included GPS-Disciplined OCXO, USRP Software Defined Radio Device - The USRP‑2930 is a tunable RF transceiver with a high-speed analog‑to‑digital converter and digital‑to‑analog converter for streaming baseband I and Q signals to a host PC over 1 Gigabit Ethernet. It also features a GPS-disciplined oscillator (GPSDO) with PPS accuracy of ±50 ns. You also can use the NI USRP‑2930 for the following communications applications: white space; broadcast FM; public safety; land-mobile, low-power unlicensed devices on industrial, scientific, and medical (ISM) bands; sensor networks; cell phone; amateur radio; or GPS.
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Product
USRP Software Defined Radio Device
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The USRP Software Defined Radio Device is a reconfigurable RF device that includes a combination of host-based processors, FPGAs, and RF front ends. The USRP Software Defined Radio Device include options that range from lower cost options with fixed FPGA personalities to high-end radios with a large, open FPGAs and wide instantaneous bandwidth. These devices can be used for applications such as multiple input, multiple output (MIMO) and LTE/WiFi testbeds, SIGINT, and radar systems.
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Product
Flash Meters
SF 100
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Flash meters for measurement of illuminance time response of rapid changing light sources (flashes, rotating beacons).
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Product
Laser Flash Photolysis
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This system that makes complex electronics, cumbersome software and large optical benches a thing of the past. The LFP system incorporates everything needed except the excitation laser. This is a simple, yet powerful instrument, ready to perform a wide range of time resolved kinetic and spectroscopic measurements involving transient absorption or diffuse reflectance. The LFP system, including the monochromator and digitizer is completely computer controlled, making it easy to obtain
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Product
Flash Vs. Scan
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A LiDAR system can observe the complete field of view (FOV) at once, called Flash systems. Flash typically works well for short to mid-range (0-100m), and by capturing the complete scene at once also objects with high relative speeds can be detected properly. Another implementation is to focus on a subset of the FOV, consequentially look at the next subsets, until the complete FOV is covered, called Scanning. Scanning can focus the light on the subset instead of the full FOV, and therefore can do object detection at a longer range compared to Flash.
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Product
Arc Flash Analysis
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ETAP Arc Flash Analysis allows you to identify and analyze high risk arc flash areas in your electrical system, and it also allows simulation of several different methods used by engineers to mitigate high incident energy.
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Product
Flash Point Tester
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Weshine Electric Manufacturing Co., Ltd
Closed flash point tester, when the test sample is used in a closed environment (such as transformer oil), to determine the closed flash point value of petroleum products. Use touch screen instead of keyboard operation, adopt foreign advanced technology, large LCD screen LCD full Chinese display man-machine dialogue interface, full screen touch key prompt input, convenient and fast, open, fuzzy control integrated software, modular structure, in line with national standards, the United States, EU and other standards.
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Product
Arc Flash Monitoring
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Arc fault protection for the fast clearance of arcing faults on BUS bars & within metal clad switchgear & associated cable boxes. The arc is detected using an optical sensor & the signal input to a protection device which alsomonitors the load current on the system.
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Product
Flash Chromatography Columns & Cartridges
RediSep®
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A flash chromatography system, no matter the quality, needs superior columns to perform its best. That’s what you get with Teledyne LABS RediSep Flash Columns. Designed for high-capacity purification, RediSep columns are precision-packed for high resolution and reproducibility. They feature a one-piece design with no cumbersome or expensive adapters, valves, barrels, or other accessories. Luer end-fittings provide quick, easy connection to CombiFlash® systems You’ll enjoy fast, easy purification and scale-up from milligrams to tens of grams with RediSep Flash columns.
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Product
Industrial Flash & Memory Solutions
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Advantech provides a full range of industrial storage module, memory module, and embedded I/O module.
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Product
Flash Point
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At which temperatures will your sample burn, ignite, or cause fire? How are your flammable liquids composed, and what are their properties? Volatility is directly related to a substance‘s flash point temperature (flammability). Anton Paar’s flash point testing equipment safely and easily determines the values you require for the processing, storage, transportation, and classification of dangerous liquids.
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