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Flash Device
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PLD ISP Feature, GTE 10.00p
K8220A
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Location Devices
Flash Pinger is a small battery powered acoustic transmitter as well as an optical flashing recovery device. Multiple settings allow for selection of flashing, timing, and frequency options for use in a variety of different applications.
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PLD ISP Feature, GTE 10.00p
K8220B
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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High Speed Pick and Place Handler
Commander 2000
At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
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FPGA-Based Ultra-Fast Flash Programmer
XJFlash
XJFlash is an FPGA-based advanced and innovative method that uses JTAG for high-speed in-system programming (ISP) of flash memories – all serial and parallel flash devices are supported. The most common use of XJFlash is programming the SPI/QSPI NOR flash used to configure an FPGA.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Flash ISP Feature, GTE 10.00p
K8219B
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
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Flash ISP Feature, GTE 10.00p
K8219A
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Flash Storage Device
Axiomtek provides various industrial-grade flash storage device for customers to simplify and shorten the system design time.
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JTAG USB Controller
NetUSB-1149.1/E
The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.
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Debug probe for ARM Cortex processors
USB Multilink ACP
P&E’s USB Multilink ACP is a debug probe which allows a PC/laptop access to JTAG/SWD on ARM Cortex devices from several manufacturers (see complete list below). It connects between a USB port on a Windows machine and the standard debug connector on the target. The product photos to the left of this page show how the headers can be accessed by simply flipping open the plastic case. Ribbon cables suitable for a variety of architectures are included. By using the USB Multilink ACP, the user can take advantage of the debug mode to halt normal processor execution and use a PC to control the processor. The user can then directly control the target’s execution, read/write registers and memory values, debug code on the processor, and program internal or external FLASH memory devices.
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Universal Automated Programming System
4900
The 4900 is powered by the newest BPM 9th generation technology, which delivers the fastest programming speeds in the industry for MCU’s, eMMC HS400, NAND, NOR and Serial Flash devices. BPM 9th generation technology produces 200 MHz signals, allowing each byte of data to transfer in up to 2.5 ns. Up to 9 times faster than competing programmers. 3D Vision option inspects BGA, CSP, QFP, TSOP, SOIC and J-Lead devices for coplanarity, bent lead, pitch, width, diameter, standoff and XY errors.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Flash Point
At which temperatures will your sample burn, ignite, or cause fire? How are your flammable liquids composed, and what are their properties? Volatility is directly related to a substance‘s flash point temperature (flammability). Anton Paar’s flash point testing equipment safely and easily determines the values you require for the processing, storage, transportation, and classification of dangerous liquids.
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Arc Flash Monitoring
Arc fault protection for the fast clearance of arcing faults on BUS bars & within metal clad switchgear & associated cable boxes. The arc is detected using an optical sensor & the signal input to a protection device which alsomonitors the load current on the system.
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Universal Flash Storage
UFS
Universal Flash Storage (UFS) is a JEDEC standard for high performance mobile storage devices suitable for next generation data storage. The UFS is also adopted by MIPI as a data transfer standard designed for mobile systems. Most UFS applications require large storage capacity for data and boot code. Applications include mobile phones, tablets, DSC, PMP, MP3, and other applications requiring mass storage, boot storage, XiP or external cards. The UFS standard is a simple, but high-performance, serial interface that efficiently moves data between a host processor and mass storage devices. USF transfers follow the SCSI model, but with a subset of SCSI commands.The Arasan UFS IP family consists of Host controller IP, Device controller IP, and MPHY.
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Flash Programmers
Easy fixture integration thanks to the compact size: 142x17,6x70mm, Independent ISP channels supporting several communication protocols (JTAG, SPI, I2C, BDM, UART, 8 digital I/O lines for each channel, coupled with dedicated ground return lines.
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Arc Flash Analysis
ETAP Arc Flash Analysis allows you to identify and analyze high risk arc flash areas in your electrical system, and it also allows simulation of several different methods used by engineers to mitigate high incident energy.
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Flash Point Testers
Flash point is the lowest liquid temperature at which a test flame causes sample vapors to ignite. Fire point is the temperature at which the test flame causes the sample to ignite and remain burning for ≥5 seconds.
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In-Line Flashing Station
AR302
The 6TL AR302 In-Line Flashing Station is designed with the most innovative numeric movement control technologies and ensures reliability and precision.With multiple flash programmer options, it offers a high PCB transfer speed and includes a stopperless system. Up to 40 devices in parallel can be programmed and no compressed air is required for operation.
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High Speed Device & Flash Programmer
JT 2147 QuadPOD
The JT 2147 QuadPOD high speed device programmer and flash programmer comprises JT 2148 transceiver and four independent, programmable JT 2149 TAP PODs and provides signal conditioning for the DataBlaster series of boundary-scan controllers. Used for gang, parallel, fast testing / Programming of devices.TAP pods can be housed integrally within the transceiver or they can be detached and reconnected via the (optional) one meter extension cable. The JT 2148 transceiver is available in standard (/10) or industrial (/13) variants. The /13 variant includes a SCSI cable splitter to allow system integrators to use flat ribbon cables into the transceiver itself which often simplifies fixture building.A fixture-embedded variant of the JT 2147 is available as part reference JT 2147/FXT. This unit integrates the function of the transceiver and four pod onto a single assembly. This variant can also support 64 DIOS channels and SCIL functions (see more images below for a picture of the JT 2147/FXT).
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Device Programming
At A.T.E. Solutions, we offer a fast and reliable device programming service. With support for a vast number of devices from different suppliers, whatever your device programming needs, we will provide a speedy and cost-effective service.
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Auxiliary Device
Mornsun Guangzhou Science & Technology
MORNSUN provides high quality EMC auxiliary devices: EMC filter, surge suppressor, pulse suppressor, EMI filter, etc.
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Powerful In-Circuit Production Flash Programmer
CYCLONE FX
P&E Microcomputer Systems' Cyclone FX programmer is is a powerful in-circuit, stand-alone programmer that supports a wide range of ARM Cortex and NXP® processor families. It's a versatile tool that offers on-board storage of programming images, provides power to the target, supports manual or automated programming, and has an easy-to-use touchscreen interface. Programming may be launched by a single button press without a PC or automatically from a PC via the automated control SDK. The Cyclone may also be used as a debug probe during development.
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Measuring Device
CAN-Bus Tester 2
The CAN-Bus Tester 2 is a widely used measuring device for control of bus parameters. The success story starts already in year 2002 with the first model. The hardware was completely redesigned in version 2. The corresponding software is still developed and has been enhanced with extensive updates.
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Flash Photolysis Spectrometer
Vernier Software & Technology, LLC
The Vernier Flash Photolysis Spectrometer is a simple, user-friendly device for demonstrating the fundamental principles of chemical kinetics and photochemistry to undergraduate chemistry students.
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Connected Devices
enable communication between devices. We provide connectivity for sensor applications and input devices via mobile communication and develop custom IoT solutions. Capturing, transferring and visualizing data increases your productivity and creates transparency.
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Bridge Devices
USB
*Royalty free Virtual Com Port (VCP) drivers*Simple GUI based Xpress configurator for configuring, programming and customizing applications*No USB expertise required*Seamless compatibility with most operating systems*UART, SPI, I2C/SMBus and I2S interface options available*Fastest way to add USB Turn key, no firmware development needed
