Visual Inspection
See Also: PCB Inspection
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Product
Visual Fault Locator
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Shanghai Baudcom Communication Device Co.,Ltd.
This Pen-type VFL is specially designed for field personnel who need an efficient and economical tool for fiber tracing, fiber routing and continuity checking in optical networks. It finds breakpoints, poor connections, bending or cracking in fiber optic cables
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Product
3D Solder Paste Inspection system
PI Series
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PI Series is a new generation 3D Solder Paste Inspection system that overcomes the limitations of traditional SPIs and satisfy all your inspection needs. The PI Series allows to easily implement Solder Paste Inspection in any PCBA line. These new generation systems are very intuitive to use, allowing non-experienced persons to get expected results.
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Product
GPR Bridge Inspection Equipment
BridgeScan
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Geophysical Survey Systems, Inc.
BridgeScan™ is a complete, affordable GPR system that is an effective tool for quickly determining the condition of aging bridge decks, parking structures, balconies and other concrete structures. The system is also used to obtain accurate concrete cover depth on new structures.
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Product
X-ray Inspection System
Cougar ECO / Cheetah ECO
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Cheetah and Cougar ECO X-ray inspection systems for use in the electronics industry. These microfocus systems, which have been developed by Yxlon in Germany, are characterized by an excellent price-performance ratio. Being entry-level systems in two sizes, each of them provides best inspection results in quality control in the SMT and semiconductor industries.
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Product
Defect Inspection Module
EB40
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The Class 1 certified E40 and B40 modules (available separately or combined in one module) can automatically detect defects on the entire edge, from zone 1 to 5, and the entire backside. The ability to inspect the entire backside allows for faster root-cause analysis of zone 5 defects since such defects can migrate from the wafer interior.
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Product
Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
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Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Product
Industrial CT X-Ray Inspection System
X7000
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The X7000 is North Star Imaging’s largest standard system. The large scanning envelope and generous focal distance allow for unparalleled inspection capabilities of very large objects. The system is great for composites, castings, pipes, tubes, welds and similar parts.
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Product
2D Automated Optical Inspection Systems (2D-AOI)
BF1 Series
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Saki’s unique line scanning technology and coaxial overhead lighting enables high-speed accurate inspection.
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Product
Visual Fault Locators
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Optical Wavelength Laboratories
OWL fiber optic visual fault locators (VFL) are specially designed to couple a maximum of optical energy into multimode and singlemode optical fibers by using a bright red fiber optic laser. Breaks, microbends, and other anomalies in optical fibers and connectors cause the intense bright red laser light to escape, thus revealing the presence of a fault. In addition to visual fault location, OWL VFLs can be used as a visual optical fiber identifier. A visual fiber optic identifier eliminates much of the guesswork during testing by identifying the fiber under test.
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Product
Real-time X-ray Inspection System
JewelBox 70T™
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The JewelBox-70T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system’s 10-micron MicroTech™ x-ray source provides magnification from 7X to 2000X, with resolution of 100 line pairs/mm.
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Product
AXI Inspection Systems
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises AXI Inspection Systems
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Product
DC Safety Inspection Device For Solar Panels
“DC Fault Tester”
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Identifies defect position instantly- contributes to saving inspection time
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Product
High Energy Industrial CT X-Ray Inspection System
MeVX Series
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The most advanced industrial DR & CT systems in the world are now available with Linear Accelerators. Offered with energies up to 9MeV, the MeVX series of systems provide the same ease of use as our low energy systems in a high energy format. Utilizing our current efX software platform along with the superior service, support & training that we are known for puts these systems in a class of their own.
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Product
Ultrasound Inspection
ULTRAPROBE 10,000
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The Ultraprobe 10,000 brings Ultrasound Inspection technology to a whole new level. With this one system, inspectors can perform condition analysis, record sounds, store and manage data.
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Product
In-line Inspection And Integrity Services
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The safety, integrity, and operating efficiency of your assets are at the core of what we do. Baker Hughes Process & Pipeline Services (PPS) unique portfolio of services helps you confidently manage the lifecycle of your pipeline—delivering timely and stress-free startup, supporting day-to-day reliability, and enabling controlled decommissioning.
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Product
Fiber Optic Visual Fault Finder
VFF5
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Used to verify continuity, test and find breaks in fibre links, locate pinched fibre strands in termination cabinets, or anywhere fibre optic cables are terminated and subject to mechanical damage.
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Product
X-Ray Inspection System
MXI Ruby XL
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Designed for the largest PCBs, Ruby XL allows 96 x 67 cm (37.9” x 26.4”) areas to be inspected non-destructively, with feature resolution up to 0.5 µm.
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Product
Analysis and Visualization of Arbitrary Test Reports and Result Data
TEST-GUIDE
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Test execution in development projects leads to the accumulation of various reports and data. Test automation intensifies this, producing very high numbers of test executions, which are distributed over several users and test environments. This multitude of test results from different sources can be efficiently managed and analysed using TEST-GUIDE.
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Product
Wireless Fiber Inspection Probe
OCI-20BN-W
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OCI-20BN-W is a portable optical fiber connector inspector for checking fiber and connector end-face cleanliness, ideal for bench top and fiber optic network installation technicians to eliminate error caused by poor quality or improper cleaning.OCI-20BN-W offers excellent viewing on connector/fiber end-face and is able to feature to record and save image/video of fiber end-face; It can be connected to PC or phone by WIFI.More than 40 assorted high-precision tips designed for inspection solutionsAngled/Lengthened tips for awkward positions.Connect smart phone for testing FiberEye2 is the application on an android or IOS smart phone to capture, display and record the fiber end-face image from the Wi-Fi probe.Connect tablet/laptop for testing EFD is the analysis software on Windows tablet/laptop to have dusts, and scratches on end face inspected, analyzed, compiled and reported
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Product
Magnetic Particle Flaw Inspection System
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This model can perform every kinds of magnetic particle flaw inspection in our unit. circular magnetization longitudial magnetization continuous magnetization, residual magnetization threading bar magnetization current induction magnetization, AC magnetization AC demagnetization DC magnetization, DC demagnetization.
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Product
Luminescence Defect Inspection System
INSPECTRA® PL Series
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This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
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Product
Automated LED Inspection and Testing
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Landrex Technologies Co., Ltd.
Automated LED Inspection and Testing
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Product
Pipeline Inspection
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Radiodetection and Pearpoint provide a wide array of Pushrod and Crawler pipeline inspection systems.
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Product
Inspection & Alignment Services
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As a leading provider of precision measurement services for power generation and turbo-machinery, API has the professional experience necessary to minimize the overall downtime of the outage or rebuild schedule. The ability to fully utilize API’s precision measurement capabilities, combined with experienced Service Engineers in the turbine alignment process, differentiates API for complex alignments.
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Product
X5 XL800 X-Ray Inspection
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Designed to be integrated into the production process at either the beginning to protect equipment or at the end to protect consumers, the X5 XL 800 is perfect for products such as meat in Euro crates or cheese in bulk boxes.
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Product
Protective Coating Inspection Kit 3
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Measurement parameters include:Surface profileSurface temperatureClimatic conditionsCoating thicknessAdhesion
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Product
Automated And Manual Sample Inspection
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In addition to typical in-process, continuous dynamic measurement applications, LaserLinc’s non-contact measurement equipment is well suited for manual and automated off-line sample inspection. Inspecting cylindrical products with long, thin characteristics, such as camshafts and catheters requires checking multiple locations and dimensions for accuracy. Manual inspections of these areas can be difficult because of the complex profile as well as the need for numerous measurement stations, different equipment and skilled personnel.
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Product
Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Product
NUV-PL SiC Defect Inspection System
VS6845E
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Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
