Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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MALDI Digital Ion Trap Mass Spectrometer
MALDImini-1
With its simple configuration and compact size, it is possible to install the MALDImini-1 in places where mass analysis devices could not previously be used. Through ingenious engineering and innovation its footprint has been reduced to the size of a piece of paper.
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UV-Vis Double Beam Research Spectrophotometer
UVD-3500
The high- performance blazed holographic grating and the optimized CT-type Monochromator reduce stray light, and widen the photometric range. Wavelength range: 190 nm – 900 nm. Spectral bandwidth: 0.1, 0.2, 0.5nm, 1.0nm, 2.0nm, and 5.0 nm.(UVD-3500).
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Beam Pattern Measurement System
BP100
The BP100 is purpose-made for luminous intensity measurement of lamps, using a diffusely transmitting screen to provide a flat image that can be measured by an imaging photometer. This is a low cost, versatile solution in comparison to the traditional method of measuring lamp properties as a function of angle of emission, using Goniometers that are often costly and dedicated for one specific measurement.
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Beam Directional Power Supply Mains
SiteX CP225D
The CP225D is currently the most powerful constant potential X-Ray generator in ICM's portfolio. Supplemental to its outstanding penetration capacity (up to 47 mm for steel in just 10 minutes), it includes a built-in multiple X-Ray output carrousel that features a Beryllium window for the inspection of lighter alloys such as aluminum and carbon fiber. The CP225D is one of the most versatile generators on the market and will adapt to an extremely wide variety of applications. In fields as diverse as the construction or petrochemical industries, its power and small focal spot, light weight, compactness and high penetration capacity will be much appreciated.
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Ar Gas Cluster Ion Source
GCIS
The Kratos Ar Gas Cluster Ion Source (GCIS) is optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode, dependent on the operating parameters defined by the user and the type of material to be profiled. In Arn+ ion cluster mode the ions can be accelerated up to a maximum of 20 keV. This enables the successful sputter depth profiling of the widest range of polymer materials to be undertaken. However, Arn+ cluster depth profiling has been shown to give very low sputter yields for inorganic materials. In order to retain the capability of generating depth profiles from this class of materials this ion source can also be operated in the more conventional Ar monomer (Ar+) mode.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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S Beam Load Cell
Futek Advanced Sensor Technology, Inc.
FUTEK S Beam Load Cells (Tension/Compression) offer a compact design for a variety of applications. Available in standard and metric, the S Beam Load Cell series provides accuracy, compact design features, overload protection (select models), and a wide capacity range to choose from. S Beam Load Cells are also commonly known as Z Beam Load Cells or S Type Load Cells.
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Laser Diode Modules: 635nm-660nm Visible Wavlength, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
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50% Beam Splitter
10701A
The Keysight 10701A beam splitter is designed for beam diameters of 6 mm or less. It reflects one half of the total incoming laser beam, and transmits one half. The Keysight 10701A optic includes a housing for standard mounting.
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Economical Bending Beam Load Cells
EBB SERIES
The EBB Series is a economical low capacity bending beam load cell suitable for use in a variety of industrial and OEM force measurement and weighing applications. It is made of an aluminum alloy and comes in 1, 2, 5 and 10 kilogram ranges.
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Ultra-compact Laser Collimated Beam Sensor
HL-T1
Panasonic Industrial Devices Sales Company of America
The HL-T1 Sensor is an ultra-small laser Thru-Beam Sensor with very high resolution.
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Infrared Laser Diode Modules: 830nm-852nm, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
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Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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50% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834G
The E1834G is a 50% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Capacitors - Beam Lead
Macom Technology Solutions Holdings Inc.
MACOM’s MMI-9000 and 9100 Series Chip Capacitors feature high stand-off voltage and low dielectric loss leveraging nitride/oxide dielectric layers. Gold bonding surfaces, top and bottom provide ease of bonding and minimum contact resistance. MACOMs beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which are features that produce devices with excellent long-term stability.
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Single Beam Echosounder, Hydrographic Survey Boat
Z-Boat 1250
Teledyne Oceanscience Z-Boats® are the number one choice for reliable, remotely controlled, hydrographic surveying in streams, rivers, lakes, and coastal waters around the world.Whether you need to reduce survey time, keep people safe during hazardous conditions, or access hard to reach locations, there is a Z-Boat to suit your survey and your budget. The Z-Boat 1250 is easy to operate. The integrated echosounder has an embedded transceiver with digital signal processing and outputs depth & temperature using NMEA 0183 data output.
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Beam Probes
The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
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Beam Bender BK7, Fixed Vertical-Bend Mount
E1834Z
The E1834Z is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance vertical mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
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Ion & Electron Detection
Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Beam Bender BK7, Fixed Horizontal-Bend Mount
E1834M
The E1834M is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance horizontal mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
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4% Beam Splitter
10725B
The 10725B 4% beam splitter, designed for beam diameters of 9 mm or less, reflects 4% of the total incoming laser beam and transmits 96% straight through. This optic is without housing and requires a user-supplied mount.
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40 Mm Beam Pitch General Purpose Area Sensor
NA40
Panasonic Industrial Devices Sales Company of America
The NA40 General Purpose Area Sensor from Panasonic offers a slim body design, failure monitoring and easy modification of length with robust aluminum enclosure.
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Beam Directional Power Supply Mains
SiteX CP200D
Being just 20 mm longer than the CP160D, the CP200D represents the best compromise between high penetration (up to 42 mm for steel) and the capacity of the generator to fit with various NDT applications, such as inspections of more technical materials in the aeronautical or space industries. The CP200D is one of the most versatile generators on the market and thanks to its built-in multiple X-Ray output carrousel it will adapt to a very wide variety of NDT applications, without compromising in any manner its light weight (12 kg) and ease of use.
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Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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Beam Directional Power Supply Battery 40 to 120 kV
CP120B
This ultra-light, compact and battery operated constant potential portable X-Ray generator is the perfect tool for specific NDT applications that require repetitive short exposures. Its versatility also makes it the ideal piece of equipment for security applications. In fact, in combination with the FLATSCAN15, the FLATSCAN30 and other digital X-Ray detectors, the CP120B will – thanks to its small focal spot and constant potential X-Ray output – enhance image quality and definitely contribute to a reduced exposure time.
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Force Sensors, Load Cells, Shear Beam
INELTA Sensorsysteme GmbH & Co. KG
Exact force measurement and weight measurement
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*High Power Laser Beam Dumps & Low Power Beam Traps
Laser beam dumps for high power laser processing, laser measurement and other applications, and low power beam traps
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Intex Beam Gauge & Standard Contacts
Developed to measure both internal and external diameters and lengths, the Intex gauge's aluminium extrusion beam gives it a rigid yet lightweight quality, making it ideal for shop-floor environments. The simple release of a locking thumbscrew enables the gauge's measuring direction to be changed quickly and easily.
