In-circuit Test Systems
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers
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Product
OST-500 Optical Radiation Test System
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Hangzhou Everfine Photo-E-Info Co., LTD
OST-500 is an optical radiation safety test system with 200-3000 nm wavelength range, refer to IEC/EN 62471/CIE S009, IEC/TR 62778, GB7000.1-2015, GB/T 20145, IEC/EN 60598 Annex P., IEC/EN 60598 Annex P. IEC/EN 60432, IEC/EN 60335, GB/T34075-2017, GB/ T34034-2017 2009/125/EC and other relevant standards. The system is equipped with a precision automatic dual-axis turntable, which can automatically find and obtain the maximum radiation position, and automatically measure the photobiohazard value of various lamps and lamp systems (LED products, ultraviolet lamps, lighting sources and lamps, etc.) at the maximum radiation position, and carry out safety classification.
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Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Optics Test Systems
Mobile Wedge Angle Sensor With Positioning System
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Optik Elektronik Gerätetechnik GmbH
Mobile wedge angle sensor for determining the wedge angle and the radius of curvature of glass panes, eg windshields of automobiles, helicopters, airplanes or rail vehicles.
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Product
Conducted Immunity Test System
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Conducted RF immunity tests acc. to IEC/EN61000-4-6 and BCI tests acc. to ISO 11452-4 and MIL-STD 461 CS 114 Signal generator,RF-power amplifier, RF-power meter and directional coupler (optional) in one 19”-caseStand-alone operation possible with optional available netbookControl-software includedMost important parameters are shown on an integrated displayAutomatic EUT-monitoringOperation via USB port of a PC or NotebookComplete range of CDNs available
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Product
Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
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The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
BSD (Test Diagnostics)
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BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Multi-Stage In-Circuit Test Fixtures
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Circuit Check’s bi-level and multi-stage fixtures combine multiple test levels in a single fixture using controlled actuation and selected probe travels for powered and unpowered tests.
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Product
Scienlab Battery Test System – Pack Level
SL1700A Series
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increase the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 90 and 270 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Mini-MRI Systems
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Magnets for Magnetic Resonance Imaging (MRI) are required to generate a high homogeneity field over the imaging volume which remains stable in time.
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Product
Tracking Systems
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Portable wand based systems are utilized to walk a pipeline to precisely locate a stuck pig. These systems allow for visual and audible indication of pig location.
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Product
Multi-Purpose RF Test System
SPA1241
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The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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Product
Optical, Color And Electrical Integrated Test System
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Hangzhou Hopoo Optoelectronics Technology Co., Ltd
Our individually calibrated LED spectroradiometers provide fast and accurate results for actual light measurement applications. It only takes a few seconds to measure and view the results directly on the display, or use the optional analysis and automation software for more in-depth research. Using the HPCS6500 Spectroradiometer, you can measure any or all of the following optical quantities:
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Product
METES - Meter Test Systems
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Dramatic advances in the field of measurement technology and the use of state-of-the-art micro-electronics have led to the development of a new generation of electricity meters which are far more accurate than their predecessors of just a few years ago. As well as measuring the exact amount of energy used, a high level of integration enables electronic meters to perform a number of additional functions. As a result, these meters are also more sensitive to network irregularities. This means that regular testing is the only way to ensure that a meter functions correctly, both during final factory tests and during the entire life span of a meter.
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Product
Systems Integration & Test
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Watring Technologies, Inc. is an experienced, diversified high technology company proficient in total system integration services including test & evaluation, custom tooling design, and automated hardware validation and verification. We give customers access to a sole- source, multi-disciplinary staff of specialists offering turn-key solutions.
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Product
6TL08 Benchtop Test Platform
H710008
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Multi-DUT Mobile & IoT Test System
IQxstream-M
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Its ultra-compact design and flexible architecture makes it highly suitable for high volume manufacturing of smartphones, tablets and cellular IoT modules.
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Product
D-Mic Testing System
BK3012V2
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Easy to use and faster than human testers can load, the new BK3012V2 is the upgrade of our popular BK3012 D-Mic tester. Setup is even easier than for the BK3012 and you can enter specifications and be ready for testing in a few minutes. As well as testing, the BK3012V2 can be connected to a computer, so you can keep your results and analyze them for current quality and trends over time.
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Probe Systems
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These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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Product
microLED Testing System
OmniPix-ML1000
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The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Product
Electric Vehicle Service Equipment Test System
T4350
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With the growing demand for electric vehicles (EV), there needs to be a simple and accurate method to test EV charging systems. Test the accuracy of AC and DC voltages and currents with TESCO’s Electric Vehicle Service Equipment (EVSE) Test System TS400. The TS400 is a valuable set with complete testing capabilities and caters to every possible EVSE charging protocol in the world (AC and DC). EV charging stations are popping up all over as the sale of electric vehicles increase. Many states or counties are now mandating testing for these charging stations. TESCO’s TS400 makes testing these chargers easy! TESCO’s EVSE Test Systems test the accuracy of energy delivery using a transactional mode compatible with Handbook 44 provisions. The TS400 Test System includes a T4000 EVSE Tester and a PL4000 EV Load Emulator. Reach out to your TESCO Representative for more information!
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Product
68HC(S)12 In-Circuit Debugger
ICD12Z
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P&E's ICD12Z for Windows is a powerful tool for debugging code. It uses the HC(S)12 processor's background debug mode (BDM), via one of P&E's hardware interfaces, to give the user access to all on-chip resources.
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Characterization System
System 7700
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Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Supported Test Systems
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TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Automated Relay Test System
Relay Master
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Relay Master is an automatic relay test system capable of testing from one to 64 relays simultaneously without having to remove them from the rack. System automation improves efficiency and reduces track time requirements. The PC-based system stores test parameters and results in a database for ease of reliability and trending analysis.
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Product
Eddy Current Testing /ET System
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Xiamen IDEA Electronic Technology Co., Ltd.
Eddy current testing system uses the most advanced digital electronic technology, photovoltaic technology and microprocessor technology. With beautiful design automatic transmission, complete electromechanical integration system, which is the only company that have a complete system of automatic machine.
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Product
Immersion Systems
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Immersion systems are the workhorses of the industry. Our latest NXT machines have shown the ability to run in excess of 6,000 wafers per day, with an average five percent productivity increase over 12 months, supporting our customers' value requirements. We continue to innovate our immersion systems to meet the requirements of future nodes, benefiting from commonalities in R&D with our EUV program, while ensuring the platform’s extendibility through System Node Enhancement Package upgrades. Thanks to these packages, any NXT system can be upgraded to the latest technology.
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Product
Amplifier Systems
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Sutter Instrument provides a complete line of electrophysiology recording hardware and software, ideal for applications ranging from tissue slice patch clamp over dissociated cell recordings to cell line studies.
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Exposure Systems
Model 2012AF & 2012SM
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The Model 2012AF Flood Exposure System provides a cost-effective method for automated flood exposure. Designed to accommodate wafers from 8” to 300mm, the tool features automated FOUP loading. Mask and substrate changeover can be accomplished quickly and easily adding to both versatility and high-volume throughput of this production tool.The Model 2012SM Automated Edge-bead Exposure System provides a cost-effective method for edge-bead removal using standard shadow mask technology. Designed to accommodate wafers from 8” to 300mm, the tool features automated FOUP loading. Mask and substrate changeover can be accomplished quickly and easily adding to both versatility and high-volume throughput of this production tool.
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Product
Pressure Decay Test Systems
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Pressure decay leak testing technology has become a mainstay in the arena of high volume production testing. Pressure decay testing methods offer the world's manufacturers a cost-effective and easily applicable solution to the leak testing challenges they encounter on a given day. Fundamentally, pressure decay testing is a straightforward measurement technique; Cincinnati Test Systems (CTS) pioneers new and innovative ways to integrate our technology into custom turnkey systems that exceed the industry standards for reliability and repeatability. CTS' 30+ years of experience goes way beyond the pressure test unit by offering our customers comprehensive, custom turnkey solutions to the most challenging leak testing problems.
