Product

Resistivity Meter

Model 2180

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Magnetic Instrumentation Inc.

Model 2180 - Magnetic Instrumentation Inc.

The unit is compact and lightweight. The basic system is 7″ wide by 2.5″ high and 12″ long. When measurements are needed below approximately 100 micro-ohm-centimeters, the basic system is piggybacked onto a second enclosure that houses a power amplifier with a current gain of ten. The combined unit measures 7″ wide by 5″ high and 12″ long. The combined unit weighs 11.5 pounds. Two short cables interconnect the two enclosures for powering the power amplifier and routing the signals to the fixture or four point probe. The front panel of the basic system includes a 32-character backlit LCD display and a set of function keys. An easy-to-use menu will allow access to user defined parameters such as sample thickness, sample volume, and calibration constants; upper and lower alarm limits, relative measurements, and several others.

Product

Four-Point Probe

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Materials Development Corporation

Materials Development Corporation

Materials Development Corporation offers the complete line of Four Point Probe systems from AIT. Systems are available to measue up to 12" diameter (300 mm) wafers as well as specialty systems for Photovoltaic wafers and substrates. For more information on these systems, contact MDC.

Product

Jandel Test Units

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Jandel Engineering Limited

Jandel Engineering Limited

Jandel Engineering Limited manufacture three Test Units designed specifically for four point probe measurements.

Product

Microscopic Four-Point Probes

M4PP

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CAPRES A/S

M4PP - CAPRES A/S

CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.

Product

PANELMAP

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Boin GmbH

Boin GmbH

PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.

Product

WAFERMAP

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Boin GmbH

Boin GmbH

WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.

Product

Manual Four Point Probe Sheet Resistance/resistivity Measurement

RT70V series

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NAPSON Corp.

RT70V series - NAPSON Corp.

• Combinational measurement system by Measurement tester(RT-70V) & Stage.• Thickness input with easy JOG dial operation (RT-70V Tester)• Tester self-test function/Auto change-over measurement range function• Thickness & Temperature correction function for Silicon sample

Product

Jandel Four Point Probes

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Jandel Engineering Limited

Jandel Engineering Limited

Jandel probe heads are manufactured solely by Jandel Engineering Limited and there is one to fit all mountings and systems known to us.

Product

Multi-Test Resistivity Measurement System

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Signatone Corp.

Signatone Corp.

Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.

Product

Contact Resistance Measurement Kit

LRM-10

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ndb Technologies Inc.

LRM-10 - ndb Technologies Inc.

The LRM-10 is a 10A micro-ohmmeter kit designed to measure low resistance for electrical interconnections integrity testing. The LRM-10 has a range from 0.01µΩ to 200Ω. It comes with heavy duty four points probes and it is compatible with a great variety of optional accessories.