Image Analysis
The extraction and analysis of data from images.
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Product
Data Acquistion & Analysis Software
NextView 4
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One software for everything. NextView®4 covers the entire world of PC measurement data acquisition: displaying live data, recording measured values, analyzing your measurement applications - and much more.
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ChromSquare GC×GC Software For Comprehensive Chromatography Data Analysis
ChromSquare
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ChromSquare GC/GC is data analysis software for comprehensive gas chromatography (GC/GC). ChromSquare provides easier, more reliable analysis of information obtained from GCxGC analysis, enabling everything from qualitative to quantitative analysis. This software is a product of cooperative research with a group headed by Professor Mondello at the University of Messina (Italy). This group implements cutting-edge research in the field of comprehensive 2D chromatography.
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Wafer Analysis Systems
Tropel®
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Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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IC Side Channel Analysis
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These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
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Fluorescence Imaging
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A next-generation fluorescence lifetime imaging microscopy (FLIM) camera that simplifies FLIM for researchers and imaging centers by combining excellent light sensitivity with easy image acquisition and data analysis.
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Gasoline/Fuel Analysis
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A gas chromatograph is used for composition analysis of gasoline and its additives in order to improve fuels' performance. In addition to excellent performance, Shimadzu's GC systems improve productivity. For example, the Nexis GC-2030 system combines three standards into one to save analytical instrument and labor costs.
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Diagnostic Laboratory Software And Data Analysis
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Enhance the way you manage quality control data, build connectivity in diagnostic workflows, ensure system security, and more with our diagnostic laboratory software and data analysis tools.
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Digital Image Correlation (DIC) Measurement System
EduDIC
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EduDIC is a complete Digital Image Correlation (DIC) measurement system, designed as a simple and convenient educational training tool for academic courses in experimental solid mechanics. This easy-to-use system allows academic instructors to effectively present the optical measurement technique of DIC for materials testing to the engineers and scientists of tomorrow.
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Fast Electromagnetic Analysis Suite
FEMAS
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FEMAS was created to provide tools for engineers to assist in PCB and system design. Our tools are based on full wave solutions to Maxwell's equations but operate much faster than traditional CEM tools. Multi-Functional! End-to-End Link Path Analysis. S-parameter file concatenation. Time Domain analysis. Frequency Domain analysis. Transmit/Receive Equalization. Causality/Passivity Checking/enforcement. 2D Cross Section Analysis for multi-conductors. S-parameter and waveform plotting. Network parameter conversion. De-Embedding. Signal Analysis.
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Product
Spectrum Analysis For E5081A Up To 44 GHz
S960907B
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The Keysight S960907B spectrum analyzer (SA) software application adds high-performance microwave spectrum analysis capabilities to the Keysight ENA-X up to 44 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Conduct simultaneous spectrum measurements using test and reference receivers. For efficient measurements of spurious signals emanating from mixers and frequency converters, combine the multi-channel SA with the internal swept-signal generators. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
Spectrum Analysis For P50xxB Up To 6.5 GHz
S970901B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
Translating process images into significant tool-defect reduction
Trans-Imager
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Real-time, tool-specific defectivity data. Now there is a way to monitor defectivity on individual processing tools – automatically – in real-time. Microtronic’s new Trans-Imager software module is able to take high-resolution images directly from your processing equipment and immediately detect and displaymacro wafer defects – transferring all of that information into our powerful and long-proven ProcessGuard software which provides a wealth of defect management and analysis. This new capability is called ProcessGuard Xtensis (PGX) because it extends the power of ProcessGuard software to fab tools that previously had no way to detect defects. This provides an important new stream of defect data.
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DC Power Output Analysis Service
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We will detect decrease in power output of a customer’s solar power plant caused by trouble of the panels or other system components quickly, by analyzing the monitored data.
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Product
Manual Label-Free Molecular Interaction Analysis Machine, Flexible Research Platform
OpenPleX
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Designed to meet the demands of biologists, biochemists and biophysicists, the OpenPlex is a flexible surface plasmon resonance imaging system.OpenPlex is your companion for the development of label-free and multiplexed bio-assays and molecule detection. It is a robust and compact system designed for simple use and high versatility. Its open format, dedicated sensor chips and manual operation enable numerous types of experiments to be explored without compromise, covering chemistry, biochemistry, physico-chemistry and biomolecular interactions.
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Standard Modal Analysis
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EDM Modal Standard Modal Analysis provides the user with a complete arsenal of tools, from FRF data selection and parameter identification to results validation and mode shape animation.
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Materials Analysis
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Materials Analysis provides products that enable customers to determine structure, composition, quantity and quality of particles and materials, during their research and product development processes, when assessing materials before production, or during the manufacturing process. Our products help customers to improve accuracy and speed of materials analysis in the laboratory. We see a growing demand for the application of our solutions in quality and process control. Our key customers in this segment are leaders in the metals, minerals and mining, pharmaceutical and academic research industries. The operating companies in this segment are Malvern Instruments, PANalytical and Particle Measuring Systems. Malvern Instruments and PANalytical merged on 1 January 2017.
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Product
Long Exposure Time Imaging Cooled CCD Camera
Retiga LUMO
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The Retiga LUMO CCD camera is a cooled, 6 megapixel camera that takes advantage of advanced technical features to enable detection and quantification of ultra-low light luminescence signals and for applications that require long exposure times.
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Multivariate Analysis and Experimental Design Software
The Unscrambler
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Analytical Spectral Devices, Inc.
The Unscrambler software from Camo Software is a complete Multivariate Analysis and Experimental Design software solution, equipped with powerful methods including PCA, Multivariate Curve Resolution (MCR), PLS Regression, 3-Way PLS Regression, Clustering (K-Means), SIMCA and PLSDA Classification etc.
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Surface Analysis
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Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Particle Analysis for Liquids
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With our partner Pamas we have developed the microscopic image analysis system PAMAS FastPatch 2 GO for automatic membrane filter analysis.
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Product
Raman Spectroscopy Analysis Laboratory
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Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
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Product
Self-Discharge Analysis Software
BT2155A
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The Keysight BT2155A self-discharge analysis software, controlling the BT2152A or BT2152B self-discharge analyzer, measures and records Li-Ion cell self-discharge current and cell voltage. The software configures the analyzer’s channel settings, such as initial voltage and current matching, channel limits (OVP, OCP, UVP), measurement intervals, and test duration.
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Data Acquisition & Analysis
FlowCam 5000
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Yokogawa Fluid Imaging Technologies, Inc.
FlowCam 5000 is our most affordable instrument. Streamlined for rapid data acquisition and analysis, it quickly and easily images, measures, analyzes, and counts microparticles suspended in a fluid medium.
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Impedance Analysis
S96041B
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Make impedance analysis measurements of Surface Mount Device (SMD) components on the E5080B vector network analyzer with 16198A-010 10 GHz SMD test fixture.
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Product
Measuring and Analysis Software
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With over 10 years of experience, IVS-KA6000 PV Test IV software has been developed by Enli Technology. IVS-KA5000, the previous generation, has more than 500 users. IVS-KA6000 is evolved from IVS-KA5000 based on users’ feedback and experience. IVS-KA6000 can control a variety of SMUs and perform data collection of current and voltage based on setting parameters by users. The formulas and algorithms of IVS-KA6000 are …
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System for the Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel
SierraNet M328
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The SierraNet M328™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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Thermal Imaging Camera
IRT301
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Wuhan JOHO Technology Co., Ltd
IRT301 Thermal Imaging CameraIRT301, a fixed-site thermal security camera lets you aware of intruders and other threats to your facility clearly in total darkness, smoke, mist and other harsh situation. It is compatible with a wide variety of third-party accessories, permit them easy to integrate. It enable to control and operation over digital and analog networks. With 384x288 pixel detector, it delivers high quality thermal image in any harsh environmental conditions, IRT301 is ideal for both indoor and outdoor surveillance, applications covered from industrial monitoring to city or boundary security monitoring. ApplicationBorder security and surveillanceRoad, channel, warehouse monitoringBuilding and industrial safety monitoringKey FeaturesRugged, waterproof and dustproof designHigh resolution, high frame rateAdvanced image processing technologyStandard interfaceVarious lenses and pan-tilt optionsTechnical specificationDetectorDetector MaterialUFPA microbolometer, AsiResolution384x288, 25mSpectral range8m~14mNETD80mK@30LensFocus
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Failure Analysis – Materials
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Failure analysis – materials is the investigation into the background or history of a sample, or an event, to determine why a particular failure occurred. A product failure may include premature breakage, discoloration or even an unexpected odor. It is useful to know if this failure is a new, unique occurrence or if it has been an ongoing issue. The investigation can involve analyzing the sample as it currently exists and extrapolating from that data what may have caused the failure. A sample of the “good” vs. “bad” product may also be useful for comparison purposes.
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Ultra-compact, uncooled thermal imaging core
Dione 640 CAM Series
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The Dione 640 CAM series is based on the Dione 640 OEM thermal imaging core with 640 x 480 pixels and 12 μm pixel pitch. The NETD is less than 40 mK (available upon request) or 50 mK. The maximum frame rate is 60 Hz.The camera cores are optimized for low SWaP (Size, Weight and Power). The Dione 640 CAM is both lightweight and small. It utilizes Xenics image enhancement for advanced image processing while keeping power consumption low.All Dione 640 CAM versions have the same SAMTEC ST5 connector and are GenICam compliant. Dione 640 CAM is a LWIR uncooled thermal imaging SWAP module with housing supporting M24/M34 lens (optional). The ultra-compact Dione 640 CAM series find application in safety and security systems, as well as in industrial thermal imaging systems.
