In-circuit Emulators
test to validate circuit.
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems, ICE
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Product
High Level Language Debugger and Emulator Tool
Universal Debug Engine
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Programmierbare Logik & Systeme GmbH
With Universal Debug Engine (UDE®) PLS offers on top solutions for software development of systems-on-silicon including debug support for the 16 Bit and 32 Bit microcontrollers C16x, C166™, ST10F276, ST10F280, XC166, XC2000, XE166, XMC4500, C166S V2, SDA6000, TriCore™ from Infineon and STMicroelectronics, Power Architecture® MPC55xx, MPC560x, MPC563x, MPC57xx from NXP™, PowerPC PPC440SPe from AMCC, Power Architecture® SPC560, SPC563, SP574 from STMicroelectronics, ARM7™, ARM9™, ARM11™, Cortex™-M0, Cortex™-M0+, Cortex™-M3, Cortex™-M4, Cortex™-M7, Cortex™-R4, Cortex™-A8, Cortex™-A9, XScale™, SuperH™ SH-2A derivatives in a new multicore debug environment as well as technical support. The extensive feature list includes functions like: high speed and flexible target access via JTAG, cJTAG with OCDS L1, EmbeddedICE, OnCE, COP, DAP, DAP2, SWD support, OCDS L2 trace, MCDS trace, CoreSight™ trace, ETM trace, ETB trace, Nexus trace, ASC, SSC, 3Pin and CAN, in-system FLASH memory programming of FLASH / OTP with UDE MemTool, support of various RTOS, OSEK® and test automation tools.
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Product
PoE LLDP Emulation (PD) & Analysis for 802.3at & 802.3bt
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Integrated PoE LLDP and Load Emulation in a Single Instrument. IEEE 802.3at and 802.3bt LLDP Compliance Analysis. Independent, Per-Port 802.3at and 802.3bt LLDP Emulations. Flexible Single and Dual Signature PD LLDP Emulations. One-Click LLDP Protocol Capture and Analysis. Pop-Up Excel Spreadsheet Reports Assess Protocol Content and Timing. Enables One-Click Emulated Power-Ups and Standard Waveforms with LLDP Power Granting PSE's. Enables 2-Pair and 4-Pair PSE Conformance Test Suties with LLDP Capable PSE's. Enables 2-Pair Multi-Port Suite with LLDP Capable PSE's. Available for PSA-3000 and PSL-3000 Platforms.
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Product
JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
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High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
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Product
Emulators
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Comware Technical Services, Inc.
Comware’s emulators replace your legacy system with modern hardware without changing the operating system and the application software.
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Product
PathWave BenchVue Advanced Battery Test And Emulation Software For A Single Instrument
BV9211B
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Achieve higher accuracy, repeatability, and safety with an emulation based on a unique battery model. Your model will allow you to determine your device's power consumption, emulate an actual battery, and import existing battery models.
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
In-Circuit Testers
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SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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Product
Multi-Stage In-Circuit Test Fixtures
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Circuit Check’s bi-level and multi-stage fixtures combine multiple test levels in a single fixture using controlled actuation and selected probe travels for powered and unpowered tests.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
