Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Product
Eclipse Test Development Environment
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The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Product
Test & Test Development for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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Product
Test & Development
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Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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Test Equipment Development
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PSE AG has been developing test equipment for many years for a wide variety of clients and uses. If you don’t see exactly the specialized test stand that you need for your innovative research, we will design and develop it for you.
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Product
Test Program Development
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Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Rapid Test Development
TestEZ® Development Suite
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Count on the Test EZ® Development Suite for complete, efficient, cost-effective test development and execution for electronic test systems.
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Product
VPX/VME64x Hybrid, Type 39 E-Frame, Test Platform (Tall)
39E08ADXC8Y3VG3X
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The Type 39 E-Frame, test platform supports development from legacy VME64X to VPX. With a rugged aluminum construction, the versatile 39 E-Frame is 12U to hold 6U cards. The full size (84HP) width holds 17 cards (3 on .8 inch and 14 on 1 inch pitch).
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Product
Full test development environment
XJDeveloper
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XJDeveloper is a graphical application that allows you to quickly and easily set up and run tests on your circuit. With XJDeveloper you can reduce your time to market by reusing your test scripts all the way through the product design process and then in manufacturing.
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Product
Rugged Ethernet
ES-1553RUNET/Px(S)
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The ES-1553RUNET/Px is an intelligent, rugged single channel, MIL-STD-1553 adapter. Its small size and ability to interface through Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the MIL-STD-1553 bus, both in the lab and in rugged environments.The ES-1553RUNET/Px shares its API with the entire Px family so that applications currently running on PCI, PCIe, ExCARD or PCMCIA boards will run without change on this device.Multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.
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Product
Program Development for Multisite Test
IG-XL
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Teradyne’s award winning IG-XL software transforms test program development for the FLEX, UltraFLEX and J750 family of testers. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
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Product
Waveform Function Generators
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Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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Product
Software Update For Test Development, GTE 10.00p
K8224A
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Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
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Product
IC Tester
ICE1
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The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Product
PCI Express 4.0 Protocol Analyzer Exerciser
Summit T416
Protocol Analyzer
The Summit™ T416 analyzer is the computer industry's first high speed PCIe 4.0 protocol analyzer that meets the challenge of 16GT/s and up to x16 lane width protocol analysis. Many PCIe 4.0 product designs are already in progress using the PCIe 4.0 specification. Companies are currently working with the Teledyne LeCroy Summit Z416 protocol exerciser for PCIe 4.0 at the deployment of PCIe 4.0 for host system emulation with their testing needs. This combination of a protocol analyzer and exerciser make Teledyne LeCroy the only supplier of protocol test and development tools for PCIe Gen 4. High speed interposers that provide protocol analyzer connectivity to CEM or other form factor sockets on system boards will still continue to be the principle way to capture PCIe traffic into the protocol analyzer.
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Product
Reach Power-over-Ethernet (PoE) Testers
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After assembly, electronic equipment manufacturers need to test functionally of their products. They want to provide the most test coverage, in the shortest time, for the least cost. When test engineers develop product test plans, they select the most appropriate off-the-shelf general purpose test equipment available. Reach designs and manufactures custom test equipment which is a better fit than general purpose equipment. It not only reduces test time but also reduces costs.
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Power Analyzer
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E-Mobility - eDrive, and Electric Vehicle TestingAdvanced and easy to use solutions for complete electric and hybrid vehicle testing in the development, validation and production phase. One-stop solutions for electric motor and inverter testing, battery and battery charge testing, combustion analysis, hydrogen engine testing and more.
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EYE Super UV Tester
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UV rays are the greatest cause of product deterioration. This unique system dramatically intensifies the deterioration acceleration caused by UV rays. It can achieve an acceleration factor greater than 100 times normal sunlight, producing material effects equivalent to extended outdoor exposure. Its compact size makes it ideal for research and development testing of paints, inks, pigments and fibers as well as plastics.
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Product
MIMIC® MQTT Simulator
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MIMIC MQTT Simulator is a scalable, customizable, programmable, predictable, dynamic simulation platform designed to enable rapid development / testing / deployment / tuning / training / demonstration of large-scale Internet of Things applications.
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Product
Testing Aircraft Components
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Sun Test Systems develops, produces, installs and services high-quality test equipment for testing various components of civil and military aircraft and helicopters.
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Product
Multi-Layer Analyzer
GPON Xpert™
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The GPON Xpert multi-layer analyzer is a unique protocol analyzer for G-PON products. GPON Xpert is a modular tool designed for R&D, laboratory and field application engineers engaged in the development, testing and deployment of G-PON standard-compliant solutions. GPON Xpert verifies the interoperability of G-PON products offered by different vendors, and indicates compliance of any combination of OLT and ONT/ONU modems to the G-PON standard.
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Product
Adapter
EXC-1553UNET/Px(S)
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The EXC-1553UNET/Px is an intelligent, single - or - dual channel, MIL-STD-1553 adapter. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the MIL-STD-1553 bus, both in the lab and in the field.The EXC-1553UNET/Px shares its API with the entire Px family so that applications currently running on PCI, PCIe, ExCARD or PCMCIA boards will run without change on this device.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.
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Static and dynamic analysis
MEMS
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Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
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Product
Assay System (Rest System for Longevity)
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New polymers are constantly being developed and component manufacturing techniques appear, allowing the gradual replacement of metallic materials by plastics or composites, in various fields of application, in different industries. In particular, in the air conditioning, heating and water supply sector, plastic components are subject to the aging process due to the temperature to which they are subjected or due to the amount of oxygen in the fluids. The Test System for Longevity and Accelerated Aging Tests developed by Controlar allows to foresee, in accelerated test, the wear throughout the life of the plastic components of the hydraulic systems, in order to prevent eventual failures during the useful life cycle of the DUT.
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Product
STAR-Ultra PCIe
163
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The STAR-Ultra PCIe is a SpaceFibre Multi-Lane interface and link analyser, designed to aid test and development of SpaceFibre equipment. It can transmit and receive SpaceFibre traffic from a host PC at data rates in excess of 10 Gbit/s, and it can record and display SpaceFibre traffic transmitted and received on one SpaceFibre port.
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Electric Motor Testing
EPT Series
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The EPT Series of testing systems are developed as open, modular solutions that provide complete product testing platforms.
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Serial Port Monitor
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Serial Port Monitor is a professional and powerful system utility for RS232/422/485 COM ports monitoring. The program monitors, displays, logs and analyzes all serial port activity in a system. This is an ideal way to track down problems that may occur during application or driver development, testing and optimization of serial devices, etc.
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Product Support Equipment
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The TTU/515E or O/I Level Test Set was developed to provide a full end-to-end test of the NACES and FAST electronic sequencers used on the NACES ejection seat. The O/ITS provides simulated inputs and measures the timing of initiator firing sequencer outputs. The O/ITS, via a serial channel in the test connector, performs discrete element diagnostics on all the sequencer's redundant electronics and verifies its full functionality.
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Product
Avionics Test & Simulation Software
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Ballard CoPilot® is an intuitive, graphical software program that allows you to easily monitor, record, replay, analyze, and simulate avionics bus data. With CoPilot you can interact directly with data on multiple buses using Ballard avionics interface hardware or work with previously recorded data. This advanced program features powerful tools for development, testing, troubleshooting and maintenance of avionics equipment and systems.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Compliance Test, Development and Test Service
DinoStor
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With its focus on solving critical backup problems associated with Network-Attached Storage (NAS), DinoStor delivers a broad range of products and services to benefit users and vendors of NAS solutions.
