Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Engineering Test & Development Tools
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Besides DG’s aftermarket diagnostic tools, DG Technologies also offers several engineering tools for vehicle network development. DG’s hardware and software products are used by a variety of engineering customers such as test engineers, production engineers, and fiber optic testers. Our customers use DG interfaces for manipulating messages, datalogging, and ECU end-of-line testing over various multiplex networks.
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Rapid Test Development
TestEZ® Development Suite
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Count on the Test EZ® Development Suite for complete, efficient, cost-effective test development and execution for electronic test systems.
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Test & Development
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Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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Software Update For Test Development, GTE 10.00p
K8224A
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Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
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Test & Test Development for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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Test development service
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Test development may be a complex task, because each emulated session must be unique and consistent. Unless the website consists of exclusively static pages, there is no testing tool that can fully automate the test design process. In many cases the implementation may require considerable research of the client-server communication scheme.
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Flying Probe Test
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Producing the highest quality test programs since 2005, Test Coach is the proven specialist firm for flying probe test. Our in depth knowledge of SPEA systems and over 10 years of honed flying probe test techniques guarantees that our test programs offer the highest test coverage possible. As an In – Concert Partner with SPEA, we work closely with their team to keep at the forefront of new product innovations and technology, so that we can provide the latest advancements to our customers. In addition to test program development, we offer board test services, maintaining the systems and staff that allow for high throughput and the ability to consistently deliver the rapid turn times that customers can depend on. And, with 7,000 square feet of space, we feature a modern, clean, ESD safe and ITAR registered facility that surpasses expectations.
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Intelligent, Single- or Dual-Channel MIL-STD-1760 Adapter
EXC-1553UNET/Px-1760
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The EXC-1553UNET/Px-1760 is an intelligent, single- or dual-channel, MIL-STD-1760 adapter. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the MIL-STD-1760 bus, both in the lab and in the field.The EXC-1553UNET/Px-1760 shares its API with the entire Px family so that applications currently running on PCI, PCIe, ExCARD or PCMCIA boards will run without change on this device.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.In addition the EXC-1553UNET/Px(S)-1760 provides 8 I/O Discrete signals and an IRIG B input.
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Outdoor Accelerated Weathering Testing
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Atlas Material Testing Solutions
Atlas has pioneered outdoor accelerated testing since their development of the Trac Rac in the 1950s. Atlas, primarily at its site in Phoenix, offers the variety of outdoor accelerated services that are listed below.
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Testing Tool Development
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We can create a custom software testing tool for your needs.As developers who love testing, we invest in R&D, combining our product testing and software development expertise to deliver customized testing solutions for you, utilizing open source stacks combined with Artificial Intelligence for added power.
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Thermocouple Wires & Connectors
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Is designed for sensor manufacturers for the production of commercial grade thermocouple junctions, and for users of large numbers of exposed junctionthermocouples such as test & development laboratories where multipoint temperature sensing of test pieces is required.
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Satellite & Payload Check-Out Systems
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Rovsing delivers systems for complete satellite or satellite subsystem testing. Rovsing has developed a modular test system architecture, based on S/W and H/W modules developed by Rovsing for most common space interfaces such as Power, TM/TC, MIL-STD-1553B and SpaceWire. A dedicated test system can then be composed by configuration of the modular architecture, installation of monitoring and control software, as well as test definition and scheduling software as required. Besides reduced development time, this has the advantage that the system to a large extent consists of elements that have been validated on previous missions.
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Testing Aircraft Components
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Sun Test Systems develops, produces, installs and services high-quality test equipment for testing various components of civil and military aircraft and helicopters.
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TTCN-3 Compilation & Execution Environment
Titan
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Titan is a TTCN-3 compilation and execution environment with an Eclipse-based IDE. The user of the tool can develop test cases, test execution logic and build the executable test suite for several platforms. TTCN-3 is a modular language specifically designed for testing (the acronym itself stands for Test and Test Conformance Notation), standardized by ETSI (see www.ttcn-3.org) and endorsed by ITU.
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Training Services
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Austin Labs offers a full line of advanced protocol training classes. All classes are instructor led and guide students through the protocol specifications while using hands on labs with trace analysis to help students discover how the protocol is implemented. To create a reliable product, the user must first understand the technology and know how to use the tools needed to develop, test and debug the relevant host or peripheral specification. Here at Austin Labs we provide everything you need.
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Solid-State & Pouch Cell Test Cell
SSP1
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SSP1 Solid-State & Pouch Cell Test Cell is designed for solid-state battery, liquid battery or in-situ electrochemical research where stable assembly pressure, reliable sealing and repeatable cell geometry are important. It supports laboratory-scale testing, method development and custom battery fixture projects. Choose the test cell or mold according to electrolyte type, target pressure, electrode size and required characterization method. For spectroscopy or imaging experiments, confirm window material, beam path and sealing requirements before ordering.
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System Integration
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Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.
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Development Switches
TTESwitch A664 Lab v2.0
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The TTESwitch A664 Lab v2.0 supports laboratory testing and development efforts for non-real-time to hard real-time operations in distributed systems. The flight-capable TTESwitch Module A664 Pro is the core of TTESwitch A664 Lab v2.0. This enables a reduction in the development cost and time of a flightworthy switch.
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Multi-Protocol Test & Simulation Adapter for USB or Ethernet
EXC-UNET2/xx
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The EXC-UNET2/xx is a multi-protocol test and simulation adapter for USB or Ethernet equipped computers. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of a number of communications protocols, both in the lab and in the field.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.
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Exhaust Gas Analysers
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Designed specifically for the busy workshop environment, it incorporates the fastest MoT test procedures, developed in-house here at Boston and using our newly released SW900 product control software.
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Near Zero Footprint SMT Spring Pin Sockets
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Ironwood Electronics socket is a device size or near device size footprint test socket incorporating industry standard high performance spring pins. Ironwood can design a socket to work with any type IC packages- BGA, LGA, QFN, DFN and even leaded devices where you need to fit a socket in place of your device to allow fast, easy testing and development.
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Ceramic Constant-Pressure Solid-State Battery Test Cell
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SSL1 Ceramic Constant-Pressure Solid-State Battery Test Cell is designed for solid-state battery, liquid battery or in-situ electrochemical research where stable assembly pressure, reliable sealing and repeatable cell geometry are important. It supports laboratory-scale testing, method development and custom battery fixture projects.
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Boundary-Scan DIMM Socket Tester
ScanDIMM
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Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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ISDN Chip Set
Emutel Symphony
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Emutel Symphony is a convenient and flexible Basic Rate ISDN, Primary Rate ISDN and Analog PSTN network simulator. With support for S, U, E1, T1 and PSTN analog interfaces you can use the Emutel Symphony to test and develop a full range of ISDN(E1/T BRIS BRIU) and PSTN analog (FXS) equipment.
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Product
Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228A
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The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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Power Device Test Systems
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Power semiconductors are devices that control electric power, and are used in automobiles and a wide range of electrical products. Our power semiconductor test systems, developed and provided by CREA, an Advantest Group company, specialize in testing power semiconductors that handle high voltages and large currents, and have special safety features for this purpose.
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Reach Power-over-Ethernet (PoE) Testers
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After assembly, electronic equipment manufacturers need to test functionally of their products. They want to provide the most test coverage, in the shortest time, for the least cost. When test engineers develop product test plans, they select the most appropriate off-the-shelf general purpose test equipment available. Reach designs and manufactures custom test equipment which is a better fit than general purpose equipment. It not only reduces test time but also reduces costs.
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Boundary Scan / JTAG Test Development System
onTAP Development
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The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Product
Die-cast Rotor Tester
AIP868X series
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Qingdao AIP Intelligent Instruments Co., Ltd
Introducing the international testing technology and developing special sensor according to digital signal processing method, the die-cast rotor tester able to automatically analyze and judge the filling quality of die-cast rotor.This system is applied to all kinds of cast aluminum and copper rotors, such as: cast aluminum rotor of compressor motor, cast aluminum rotor of washing machine motor, cast aluminum rotor of fan motor, cast aluminum rotor of pump motor, rotor of automobile motor and three-phase asynchronous motor, etc. The main detection functions are: broken bar, fullness of the bar (thin bar, hole, bubble and porosity ), leakage between the squirrel cage and lamination, squirrel cage eccentricity, slot deviation.Test items: broken bar, thin bar, maximum amplitude value, minimum amplitude value, comprehensive value.
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Programmable USB Hub with 4 Charge Ports
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The USBHub2x4 is a programmable USB 2.0 compatible hub featuring 4 device downstream ports with standard USB type-A receptacles and each port is capable of delivering up to 2.5A simultaneously. With two host (upstream) connections using usb mini-B connectors, the USBHub2x4 is perfect for environments where multiple devices need to be shared or switched between two host computers. E.g.: software regression testing, iPhone software development and validation, Android software development and validation, USB device regression testing, manufacturing testing, device burn-in testing and USB device charge-curve testing.
