Near-Field
1) EMF closest to the antenna. 2) Near-field optics.
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Product
Near Field Probes
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Used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.
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Product
RF Near Field Scanner
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The TEM Consulting near field scanner is a high precisions positioner that supports the precise movement of field probes. Using our scanning positioner field maps of planes and volumes can be developed to assist engineers in antenna design, analyzing and solving EMC problems and mapping signal intensity.
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Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Product
Near Field Moving Detector Goniophotometer
LSG-1900B
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LSG-1900B Goniophotometer is near field Type C automatic goniophotometric instrument for luminous intensity distribution measurement. The LSG-1900B uses a constant temperature detector. It is for industrial laboratory photometric data measurements of small luminaires, such as down light, bulb light, etc.
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Product
GO-NR1000 Near-Field Goniophotometer
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Hangzhou Everfine Photo-E-Info Co., LTD
Suitable for LED light source, LED chip, module and other small light source, the principal function includes: spatial light intensity distribution curve, spatial color distribution curve, iso-lux curve, total luminous flux, effective luminous flux, spatial luminance curve, etc.The test data can be saved as IESNA (*.ies), CIBSE (*.cib), EULUMDAT (*.ldt), CIE (*.cie), CEN (*.cen) and other formats, which can be directly used as the input data of international general lighting design software. Spatial luminance data can be imported into near-field lighting generation software to generate light data that can be imported into third parties (TracePro and LightTools).
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Product
Deluxe Near-field Detection Receiver
ANDRE™ Deluxe
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The ANDRE is a handheld broadband receiver that detects known, unknown, illegal, disruptive, or interfering transmissions. The ANDRE locates nearby RF, infrared, visible light, carrier current, and other types of transmitters. Quickly and discretely identify threats using the ANDRE Deluxe’s wide range of accessories specifically designed to receive transmissions from 10 kHz up to 12 GHz.
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Near Field Probes
MFA Family
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The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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Product
Near Field Probes
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Anteral has extensive background in the design of Near Field Probes (open ended waveguides probes). Our Near Field Probes are currently being used in several laboratories around the world including the ESA's anechoic chamber. Anteral designs Near Field Probes from 10 GHz to 750 GHz covering the sectors requirements. Moreover, our Near Field Probes have a sharped design minimize reflections.
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Product
Near Field Probes 30 MHz up to 3 GHz
RF1 set
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The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Near-Field Probes 100 kHz up to 50 MHz
LF1 set
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The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Product
Near-field Goniophotometer
RiGO801
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TechnoTeam Bildverarbeitung GmbH
Correct determination of the luminous intensity distributions (lid) of lamps and luminaires far within their photometric near-field range. Capture of ray data.
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Product
Near Field Micro Probe ICR HV H Field
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The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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Product
Near-Field Detection Module for Imaging
Transmission
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Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Product
EMC Near Field Probes
TBPS01
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The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
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Product
Near Field Micro Probe Sets
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The near field probe is designed for a high-resolution measurement of electrical near fields.
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Product
Near Field Probes 30 MHz up to 3 GHz
RF2 set
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The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Cylinder type, Near field Antenna Measurement System
anm02
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As it combines the vertical direction of the probe antenna with the turn of the object antenna, and performs the near field measurement in the shape of a cylinder. The result will be converted to far field. Feature The pattern behind the antenna can be measured by a cylinder scanning. Fast measurement.For example ) Vertical direction 256 point and Rotatory direction 180 point : 30 minutes.
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Product
RF Near Field Probe Set DC to 9GHz
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EMF & RF close field sniffer-set for use with any Spectrum Analyzer or Measurement Receiver. The EMC Near Field probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our RF near field probe set is especially suitable for: - Pinpointing interference sources - Estimation of interference field strength - Verification of shielding and filtering measures - Identifying faulty components - Detecting circuitry overly sensitive to interference.
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Product
Near Field Probes 30 MHz up to 6 GHz
XF1 set
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The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Product
Near-field Chambers
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Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.
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Product
NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-02
Transceiver Adapter Module
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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Product
Antennas
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Our broad portfolio of antennas includes products designed for cellular, broadcast, navigation, RFID, IoT, DAS, mmWave, and more. Our antennas are available in standard and custom designs and engineered for use in cars, heavy-transport vehicles including rail, and a wide variety of personal electronics, including mobile device and wearable technology. Our antennas offer high-quality transmission for a wide variety of frequencies including, but not limited to Bluetooth, WLAN, and ZigBee. We manufacture our antennas in facilities worldwide, which include testing capabilities in near and far field patterns, scattering parameters, SAR, vibration, humidity, temperature shock, salt fog, throughput, and acoustic. We also manufacture antenna assemblies.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-01
Transceiver Adapter Module
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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Product
Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Product
Seismic Sensor
SmartPhone D
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Teledyne Marine Real Time Systems
The highly rugged encapsulated SmartPhone D was designed for use with the SmartSource controller, or SmartPhone D system, for real-time monitoring of near-field signatures.
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Product
Imaging Goniometers
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Radiant Vision Systems fully-automated goniometric systems are combined with a ProMetric® Imaging Colorimeter or Photometer and specialized software to capture a precise, comprehensive model of a light source’s near-field output.
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Product
Near-Field Scanning Optical Microscope Platform
MoScan-F
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MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Product
Antenna Test Chamber
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Comtest provides Antenna test ranges fully covered with microwave absorbers for both near-field and far-field measurements. Because we always strive for new solutions, our R&D department developed our ‘Javelin Tip’ polystyrene absorbers. The enhanced material composition and altered shape, lead to improved performance and cleaner working space, enabling you to make high precision antenna testing fast, reliable, and worry-free.
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Product
Near-Field Detection Module for Imaging
Reflection
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Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
