Jitter Analysis
Measure timing changes in a circuit.
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Product
Wafer Analysis Systems
Tropel®
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Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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Product
Benchmark, Competitive and Failure Analysis
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Helping you determine the root cause of product failures and evaluate products against industry competition and standards.We provide third-party verification and support for claims related to performance versus competition, root product failure cause, and benchmark industry performance. As an independent laboratory with over 60 years of product testing experience, our expertise helps you evaluate products for a variety of performance related characteristics. Additionally, we can provide expert witness legal testimony for insurance claims, CPSC filings, and civil/criminal court cases through our testing results and data.
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Product
LC/MS/MS Method Package For Water Quality Analysis
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Shimadzu provides method files, including pre-registered MRM parameters with optimized quantitative and reference ions, LC separation parameters, and retention times and peak identification parameters for each compound, as well as report templates for outputting quantitation results, as a package. If retention times are adjusted when the system is introduced, based on the HPLC configuration delivered, the analysis process can be started as soon as the specified columns, mobile phases, and standard samples are supplied.
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Product
Signal Analysis
Super-Resolution Spectrum
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Super-resolution Spectrum is used for spectral signal analysis with high frequency resolution. The program is used in diagnostics and monitoring systems of buildings and for analyzing non-stationary signals. The Software enables solving the following tasks:
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Product
In Vivo Signal Detection & Intelligent Image Analysis Software
VISQUE®
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Patented algorithms for kinetic analysis of molecular diffusion phenomenon- Tmax, Tarrival, Imax, Iarrival, Trising, 1st Peak, FluAngio, DyAngio, etc.Kinetics visualization with feature mapsTime-series kinetics graphs
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Product
Zero-footprint Coverage Analysis For Critical Software
RapiCoverZero
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*Collect coverage from systems that produce branch traces*Save time with efficient merge and mark verification workflow*Simplify verification through integration with your CI tool*Collect coverage for libraries without source code
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Product
Gas Analysis
HPR-90
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The HPR-90 automated package cracking analysis system is a complete system optimized to analyse gas within sealed volumes such as light bulbs.
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Product
Spectrum Analysis For P50xxB Up To 9 GHz
S970902B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
STDF Test Data Analysis Tool
DataView
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DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Product
PXI Bluetooth Signal Generation and Analysis
Test Toolkit for Bluetooth™
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Start taking faster Bluetooth measurements with PXI, the most cost-effective, flexible, and capable platform for wireless device test. Keep up with the latest Bluetooth standard developments with free upgrades of the Test Toolkit for Bluetooth. Gain greater confidence in your Bluetooth design's performance and increase test coverage with a flexible toolkit that offers fine control of the generated Bluetooth waveforms and generates accurate measurement results.
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Product
Analysis Application for E84
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GCI's industry leading E84 diagnostic software is a powerful, Windows-based graphical analysis application that can upload and analyze data from GCI's E84 Handheld Tester, E84 DLD, and RJ-11 Optical Transceiver products. The E84 Analysis Application can also display the signals of a live material handoff in real-time when connected to GCI's E84 DLD or RJ-11 Optical Transceiver.
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Product
Silicon Test & Yield Analysis Solutions
Tessent®
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The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Product
Failure Analysis – Materials
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Failure analysis – materials is the investigation into the background or history of a sample, or an event, to determine why a particular failure occurred. A product failure may include premature breakage, discoloration or even an unexpected odor. It is useful to know if this failure is a new, unique occurrence or if it has been an ongoing issue. The investigation can involve analyzing the sample as it currently exists and extrapolating from that data what may have caused the failure. A sample of the “good” vs. “bad” product may also be useful for comparison purposes.
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Product
Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Product
Data Acquisition and Analysis Software
Magnifi®
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Eddyfi® Magnifi® is a constantly evolving, integrated electromagnetic inspection data acquisition and analysis software. It boasts an intuitive graphical user interface (GUI) suited to modern devices, powerful reporting functions and data management, as well as simple inspection configurations.
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Product
Laboratory And Analysis Systems
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High performance UV-VIS-IR spectrophotometer with superb optical performance for the determination of spectral absorption coefficient and spectral effective scattering coefficients
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Product
C and C++ Testing, Static Analysis, Code Review
C++test
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Parasoft C++test is a complete C/C++ developer's quality suite for static code analysis, code review, automated unit and component testing, coverage analysis, and regression testing ? on the desktop under leading IDEs and in batch processes. Available for common enterprise and embedded environments.
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Product
Acoustic Analysis
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Includes cursor readout of dB bands, max & min lines, noise curve overlays, pink noise generator, and optional STC Transmission Loss.
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Product
Visual Analysis Tool for GNSS Receiver Data
Panorama
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Panorama is the flagship tool when it comes to analyzing receiver data. When engineers use Panorama they spend more time looking at plots and making decisions, instead of making plots and writing reports. Panorama takes receiver data (.csv files) from PANACEA and RxStudio (other ODS products) and turns it into over 60 engineering plots ready to view at the click of your mouse. These plots give engineers and analysts the ability to view summary level data, head to head comparisons, receiver specific results, and 3D LLA replays using STK.
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Product
System for the Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel
SierraNet M328
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The SierraNet M328™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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Product
Gas Analysis
HPR-20 EGA
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The Hiden HPR-20 EGA gas analysis system is configured for continuous analysis of evolved gases and vapours from thermogravimetric analysers, TGA.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
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The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Water Iron Analysis
Aztec AW633
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The Aztec 600 colorimetric iron analyzer provides reliable and accurate measurement of iron concentrations to improve drinking water quality and optimize chemical usage.
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Product
Spectrum Analysis For P50xxB Up To 6.5 GHz
S970901B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
Cloud-Based RF Signal Analysis Software
Cloud4Testing
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Our next-generation software as a service (SaaS) platform is an ideal choice for your test and measurement needs. With the R&S®Cloud4Testing, you can enjoy a quick and easy access to Rohde & Schwarz testing essentials without having to make a big investment. Simply measure, analyze and process your individual RF data, on demand and on the go.
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Product
Destructive Physical Analysis & Failure Analysis
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DPACI's component analysis laboratory performs major analytical functions, such as destructive physical analysis, failure analysis, counterfeit analysis, and material analysis on components & devices. Our destructive physical analysis techniques are performed in accordance with standards and methods used in most military and space program requirements. Solutions for difficult production problems are resolved through our failure analysis procedures.
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Product
Sensor Scene Modeling and Analysis Software
INSSITE
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INSSITE is a sensor scene modeling and analysis environment. Different sensor types and modalities, spanning radar (synthetic aperture radar [SAR], ground moving target indicator [GMTI], detection and ranging, radio frequency [RF] communications), visible/infrared (passive electro-optical/infrared [EO/IR], laser radar [ladar], thermal IR), can be evaluated against high fidelity scenarios constructed by the user.
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Signal Analysis
Cross-Correlation Analysis
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The software is used for correlation analysis of signals coming from the input channels of FFT spectrum analyzers in real time or recorded time realization view mode, as well as for viewing various correlation characteristics of signals. Correlation analysis is a set of methods based on the mathematical correlation theory and is used for detecting the correlation dependence between two random attributes or factors. For solving a number of diagnostic tasks, cross-correlation analysis of signals in two or more control points distributed across space is often used.
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Product
Mass Spectrometry Imaging Data Analysis Software
IMAGEREVEAL MS
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Simplifying Routine Analysis Are you worried about wasting time or valuable data? Automatically uncover important information from large amounts of data with IMAGEREVEAL MS.
