Functional ATE
Automated application specific testing system.
See Also: Functional Test, ATE, Functional Test Systems
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Arbitrary Function Generator
FGX-2220
FGX-2220 is a full two-channel function generator of 20MHz by the DDS system. Each channel separately can set all of the functions, such as waveform, frequency and amplitude.
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Function Generators
Scientific Mes-Technik Private Ltd
Scientific offer wide range of function generators from 3 MHz to 10 MHz in general purpose and multifunction. Selection of waveform shapes apart from standard sine, triangle , square to ramp, pulse are available. SM5071 , SM5074 , SM5061 & SM5075 have built-in auto ranging frequency counter. The outputs are protected against short circuits and overload.
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Functional Tester
ESF-2003
The functional tester developed on the basis of our experiences in electric parameters testing technique.Accumulated with 30 years of experiences in electronic testing, Shindenshi Corporation develops this ESF-2003.Shindenshi will provide suitable products to customer for their need.
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Arbitrary / Function Generators
Today's designs are often complex, demanding a variety of stimulus signals during test. With standard waveforms, arbitrary waveform capability and signal impairment options, a Tektronix Function Generator supports a wide range of application needs with one instrument. Best-in-class Function Generator performance from Tektronix AFGs ensures signals are accurately reproduced.
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Flash Programming for Functional Test Systems
Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Actuation Methods for Functional Test Systems
Functional test typically applies full operational power to a final product or a loaded printed circuit board in order to determine if the Product/ PCB performs functions as designed. This type of test often involves custom built test equipment and custom test fixturing. Circuit Check supports all forms of functional test strategies within its Signature Series functional test fixtures.
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Earbud Function Button Tester
BK2121
The BaKo Type BK2121 was developed in response to Apple’s need to maintain quality control in earbuds which contain function controls and an internal microphone, designed to be used with newer IPods. It is a compact, easy to setup, easy to use machine with a short test time that you can use to functionally validate each earbud unit as it comes off the product line.
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16-Channel DAC Function Card
ProDAQ 3510
The ProDAQ 3510 DAC function card is a ProDAQ high-density card that fits into ProDAQ VXIbus motherboards and LXI function card carriers. This high-density card contains 16 independent, 16-bit DAC channels, and each channel is equipped with its own DAC. The ProDAQ 3510 DAC function card is specially designed for DC, low-frequency, and current loop applications.
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Multiplexed Amplifier-per-Channel Function Card
Multiplexed amplifier-per-channel systems have a dedicated pre-amplifier for every channel and a single Analog to Digital Converter, ADC, for the system. Amplified and filtered analog signals are multiplexed to a post-amplifier and then presented to the ADC to be digitized. Significant benefits of the multiplexed amplifier-per-channel system are: Higher Throughput Rates, Improved Filtering, Higher Per Channel Sampling Rate, Sensor Isolation, Improved Channel-To-Channel Isolation
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Arbitrary Function Generator
AFG31000
The AFG31000 series with InstaView™ technology is the first high-performance AFG with built-in waveform generation applications, patented real-time wave monitoring, and a modern user interface.
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Arbitrary Function Generators
PXI Arbitrary Waveform and Programmable Function Generators as well as DC source cards and a precision standards module.
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Semiconductor Functional Verification Tools
Trek5
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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Function Test and In-Circuit Test
CT350
ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Modular In-Circuit & Functional Test System
Our testing systems are based on established industry standards and can be individually configured to meet your requirements. In addition, our systems can be easily and efficiently adapted to changing and new challenges.
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Function Generator
FG-32
*6 FUNCTION,6RANGE.*LINEAR/LOG SWEEP*AUTORANGE COUNTER*0.001Hz RESOLUTION.*AUTO GATETIME.*COUNTER TRIGGER DETECT.
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SparkFun MicroMod Ethernet Function Board
W5500
Integrate your MicroMod project into an Ethernet network including Power-over-Ethernet with the SparkFun MicroMod Ethernet Function Board. This specialized Function Board uses the W5500 Ethernet control module from WIZnet and a DC/DC converter to configure a MicroMod assembly as a connected and powered device into an Ethernet network with a Power-over-Ethernet (PoE) system.
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Function Tester
Test device for functional testing of defibrillators, external pacemakers and ECG simulation.
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PathWave BenchVue Function Generator App
BV0002B
The PathWave BenchVue function generator app helps control function generators intuitively, load/design arbitrary waveforms, and build automated tests quickly.
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Special Function I/O Expansion
This add-in module is 40 times faster than USB 1.x implementations and supports signaling up to 480 Megabits per second (Mbps). It is based upon the NEC uPD720101 USB 2.0 host controller that is supported by a wide range of operating systems including Windows and Linux.
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Function Test Systems & Equipment
Cincinnati Test Systems (CTS) provides our customers with turnkey systems that include the design, manufacture and support of custom built lean cell and automated functional equipment testing solutions. We are a recognized global leader for providing test solutions integrated with advanced technology, precision instrumentation, information software written by CTS engineers with proven experience, and supported by a team of technical application specialist.
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Digital Hygro-thermometer With Clock Alarm Function
KM 918A
Kusam Electrical Industries Limited
• Temperature range : -10 ~ 60°C / (14 ~ 140°F)• Temperature accuracy : ± 1°C / (± 1.8°F)• Temperature resolution : 0.1°C / °F• Humidity range : 20% RH ~ 95 % RH• Humidity resolution : 1 % RH• Humidity Accuracy : 8% RH• Clock, temperature and humidity display• Room temperature• Room Humidity display• Maximum or minimum memorization function• Alarm clock function at a desired hour• Power : Single 1.5V DC AAA battery
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Function Test Fixtures
Modulized UUT BFT Test Fixture, Multilevel BFT Fixture, Over Clamp Test Fixture, Rack Mount Test Fixture, Self Contained Pogopin Test Fixture, Simple Low Cost PCBA Test Fixture, Tight Seal Required RF F/T Fixture, and more from IST Engineering
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LXI Function Card Carriers
ProDAQ 6100 Series
Ethernet-based LXI is changing the way engineers and scientists perform test and measurement and data acquisition. As more and more PCs ship without expansion slots, customers are faced with the problem of replacing their test and measurement and data acquisition equipment. Bustec believes in the power of distributed systems and the use of IEEE standards.
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SBE Waveform And Function Generators
EDU33210 Series
The Keysight EDU33210 Series function / arbitrary waveform generator is part of the Keysight Smart Bench Essentials (SBE) Series of four unique instruments that harness one powerful graphical interface to connect, control, and capture measurement data. Get all the standard functions and waveforms with the most stable, lowest-distortion function generator in its class. It offers the following features:
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Multiplexed- Low-Level Function Card
Low-level multiplexed systems have a single programmable gain, wide-band amplifier following the input multiplexer. To accommodate low-level signal signals such as those from strain gauges or thermocouples and at the same time high level signals from other sources, the throughput rate must be limited to enable the high bandwidth amplifier to settle to the correct value after switching to a new channel. This results in a relatively low aggregate throughput rate when compared to an amplifier-per-channel system. A major benefit of a well designed low-level multiplexed system is the extremely high performance/cost relationship.
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Integrated Function Tester for Inductance Ballast
UI2001B
• Measure input parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components. V range: 10.0~300.0V, A range: 0.010~2.000A, F range: 45~65Hz • Measure output parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components Lamp voltage range: 10.0~450.0V, Lamp current range: 0.010~2.000A • Accuracy: ± (0.4% reading+0.1% range+1 digit) • Can test every kind of curve, print both data & curve • Communication interface available for PC, running under Windows98/2000/XP/Vista
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Function Generators
Respective dual channels function/arbitrary waveform generator. Sine wave output up to 160MHz, full-band resolution of 1μHz. Pulse waveform up to 50MHz (or 40MHz), adjustable time of rising, falling and duty ratio. Sampling rate of 500MSa/s and vertical resolution of 16bit. 6-bit high-precision frequency meter compatible with TTL level signal. Arbitrary wave storage of 8~32M points, 7GB non-volatile waveform storage. Multi modulation function::AM,FM,PM, ASK,FSK,PSK, BPSK, QPSK,OSK,PWM, QAM, SUM . 16bit digital arbitrary wave (TTL level) DARB. 16th Harmonic Generation Function. Protocol output: I2C, SPI, UART (TTL level). 8 Inch high-resolution TFT color LCD,WVGA(800×480). Standard interface: USB Host, USB Device, LAN, 10MHz clock source input/output. Frequency sweep and burst output. Easy-to-use multi-functional knob and numeric keypad
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LVDT With Pneumatic Function
INELTA Sensorsysteme GmbH & Co. KG
2-3 bar compressed air moves the strings out the integrated return spring pulls the output back into the housing
