Breaker Test Systems
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Product
System Instruments
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bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Product
Electronic System Design
ESD
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Smart connected devices are everywhere, in homes, in transportation, and at work. This means electronic system design (ESD) is having a greater influence on almost every type of product requiring new simulation tools to help achieve electronic, electrical, mechanical, thermal, and connectivity goals. Altair’s simulation-driven design tools enable your team of specialized engineers to collaborate across all aspects of printed circuit board development from concept to manufacturing. Our products streamline your process, eliminate design iterations, and reduce time-to-market.
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Product
Collaboration Systems
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Solutions for small meeting, huddle, or collaboration spaces that foster group sharing using technology.
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Product
Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
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* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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Product
Laser Repair System
LCD-4400
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The LCD4400 offers an economical, precision instruments designed to repair short, remove excess material (ITO, Cr, Al…) on panel before or after assembly. Featuring lightweight, state of the art technology, the LCD4400 focuses a Nd:YAG laser directly through microscope objective.
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Product
Hub of the System
Net-ESVR
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The Enterprise Server NET-ESVR is a hub of the system. Its central role is to receive every 5 seconds the alarm status of each probe NET-XXX and to store the status and update system alarm matrix. It also provides communication with the multiple Clients NET-NMSC.
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Product
Capacitor Test
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Delta United Instrument Co., Ltd.
Specialized, high-efficiency automatic testing systems for electrolytic capacitors.
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Product
Directed Energy Systems
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Honeywell Aerospace Technologies
Reliable and Innovative Technology for Directed Energy Systems
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Product
Bypass Diode Thermal Test System
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King Design Industrial Co., Ltd.
* Power: the heating board control panel uses 220V single-phase power.* Power consumption: 1.0KVA, 1000W(Max)* Volt: 220VAC* Current: 4.5A* Heating board: one controller per board* Power rate: room temperature raise to 75°C± 5°C within one minute.* Heating board dimension: 500mm x 1,000mm* 6-sheet electrical heating boards test: used to test the 2,200mm x 2,600mm module. It can be customer-designed.* The length of board power cable and thermal sensor cable shall exceed 3,000mm.* To get uniform heating effect, the electrical board is sandwiched by 2mm aluminum sheets at both sides of board.
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Product
Strength Testing
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Sataton Instruments Technology CO., Ltd
Air permeability tester is professional designed to determine the permeability of materials to air. By testing the rate of flow of air passing perpendicularly through a given area of tested sample under a given pressure over a given time period, the tester can provide results of air permeability performance by calculation the indices. The air permeability testing instrument is applicable to many type of materials, including industrial fabrics, nonwovens, made-up textiles, paper and board, foam and other materials.
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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
AOI/SPI Inspection Systems
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises AOI/SPI Inspection Systems
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Product
Unit Testing
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Hitex offers a unit testing service for C/C++ application source code using the well-known test tool TESSY. For this service, the customer provides their source code of the C/C++ functions to be tested, ideally along with the specifications of the functionality and comprehensive comments in the source code.
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Product
Direction Finding System
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Direction finding systems can detect the direction from which the RF signal is being received and can detect, and direction find multiple targets simultaneously.
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Product
Time & Frequency System
TM-4M
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The TM-4M Time & Frequency System features a larger, easier to use form-factor. It was designed for mobile applications that require uninterruptible power, and for applications that require multiple front panel connections. The six BNC jacks on the front panel are user-assignable to output any signal the user chooses.
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Product
Electronic Inspection Systems
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Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of chips by means of lock-in thermography, which visually represents the IR radiation intensity signal of electronics. Special lasers and flash lamps generate a very short heat impulse (10 ms) on the chip, which generates a measurable heat flow. In most cases, a resolution of < 1 μm can be achieved.
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Product
Automated Inspection Systems
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Our systems utilize phased array and eddy current array to inspect the full volume and surface of various products and profiles in many manufacturing industries, such as metal, aerospace, transportation, power generation, and oil & gas.
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Product
Conformance Testing
Clarinet-TTCN ATM ETS
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Protocol: UNI 3.1 ATM Layer Conformance Test Suite for End SystemsIUT: ATM Equipment UNI 3.0ATS: ATM-FORUM standards af-test-0060.000 covers the test of UNI 3.0 ATM Layer of End Systems
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Accessibility Testing
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More than a compliance requirement, accessibility of your applications to ensure inclusivity of differently abled populations is a societal responsibility. As a socially responsible organization, you would like your applications and products to be accessible for one and all, including people with visual, hearing, cognitive and motor limitations. It also helps your brand image and increases the number of happy users.
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Product
200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
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Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
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Product
Integrating Sphere Systems
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An optical device for various purposes such as. measuring the radiant flux (optical power) from a laser diode, light-emitting diode (LED) or bulb.
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Product
MMIs for Test and System Integration
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Laying out a custom PCB is too time consuming and costly for most rush projects. Pulse Research Lab has developed Mini Modular Instruments ™ to provide cost effective solutions to the most common engineering challenges.
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Product
Test Module
MTC
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The measuring channels can be connected depending on the application to the pins on the system interface or to the six internal bus lines.Four measuring channels per module on 8:1 multiplexer = 32 InputsUp to 4 parallel measurements per MTC (4 parallel counters)Intelligent algorithms for fast measurements even at low frequenciesFrequency, period, pulse width, rise- and falling time as well as event counting on each channelTime measuring range: 10 ns - 42 s, resolution 10 nsFrequency measuring range: 0.015 - 100 MHzEvent counting: 0 - 232, maximum 100 MHzMax. input level/trigger voltage: +/-100 VSynchronization with external trigger possible
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Product
Data Acquisition System
Synergy Qb
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The Synergy Qb offers the same Synergy input capabilities in a field rugged product offering IP51 environmental resistance against dust and water. This DC-operated system can acquire standalone to its internal low-power PC with solid state drive, or to an external PC via Ethernet.
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Product
Lamp Cap Temperature Rise Test System
TMP-L
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TMP-L is according to IEC60360-1998 and GB2512-2001 (Standard method of measurement of lamp cap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards.
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Product
HV High Performance Circuit Breaker Analyzer
CBV-32
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We conceived the CBV-32 to provide the best range of testing for electrical facilities such as circuit breakers (using gaz, oil, air, vacuum…) or synchronous condensers all the way up to 800kV and more. It combines Timing, Motion Dynamic Resistance Measurements, and Vibration, all in a single test.
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Product
QE Systems
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Abet Technologies offers a range of standard EQE and IQE measurement systems. Model QE-1100 is configured with the most useful components for single junction devices. It has a 350 – 1100 nm range. The QE-1800 is configured with components most useful for components for triple junction cells. Beyond the standard systems offered systems can be custom configured to meet a customer’s metrology needs.
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Product
Test Engines
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Verified Systems International GMBH
The test system cluster architecture is based on dual CPU or 4-CPU PCs acting as cluster nodes. The nodes communicate and synchronise over a high-speed network (Myrinet or InfiniBand). A modification of the Linux operating system allows to run the test execution and evaluation algorithms in hard real-time on reserved CPUs, where scheduling is non-preemptive and controlled by the test system itself. The interrupts caused by interfaces to the system under test may be relayed to CPUs designated explicitly for their handling. This approach offers the opportunity to utilise high-performance standard hardware and the services provided by the widely accepted Linux operating system in combination with all mechanisms required for hard real-time computing. The cluster architecture presents an opportunity to distribute interfaces with high data throughput on different nodes, so that PCI bus overload can be avoided. In addition, the CPU load can be balanced by allocating test data generators, environment simulations and checkers for the behaviour of the system under test ("test oracles") on dedicated CPUs.
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Product
Test Fixtures
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REINHARDT System- und Messelectronic GmbH
Is a fixed state of a set of objects used as a baseline for running tests. The purpose of a test fixture is to ensure that there is a well known and fixed environment in which tests are run so that results are repeatable.
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Product
Continuity Testing
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The checking of an electric circuit to see if current flows (that it is in fact a complete circuit).
