Scanning Probe Microscopes
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: SPM
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Boundary Scan Test
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Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72T1-7
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Microscope Software
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Only with the right microscope software you can unleash all features of your imaging station. Our modular software platforms are easy to learn and enable you to acquire, process and analyze images in multiple dimensions and over various timepoints. Non-destructive image handling and file formats developed specially for microscopy are just two benefits that guarantee reproducible results for your experiments.
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Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Product
Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe
CSP-40B-012
High Frequency Probe
Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24
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STM Microscope
NaioSTM
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The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
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Product
Line Scan Camera
8M Series
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The USB Line Camera 8M is an easy-to-use cost-effective board-level line scan camera. It consists of two circuit boards, the main circuit board and the sensor circuit board.
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Product
Standard 1.00 (28.00) - 3.20 (91.00) General Purpose Probe
P2550-0
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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Product
SIP-90-2 Test System Interface Probe
SIP-90-2
ICT/FCT Probe
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Sapphire 3D Microscope
WDI-2000
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The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
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Product
Differential Scanning Calorimeters
MicroCal DSC Range
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The "Gold Standard" for structural stability analysis of biotherapeutics, biological macromolecules and polymers in solution. Are microcalorimeters are powerful tools which enable characterization of the thermal stability of proteins and other biomolecules, primarily for biopharmaceutical development and manufacture. They are used for general stability studies, for biosimilarity and batch-to-batch comparability assessment, and for the optimization of purification and manufacturing conditions. MicroCal PEAQ-DSC systems are simple to use, requiring little assay development, and no labelling or immobilization.
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Product
BMP-1-S Board Marker Probe
BMP-1-S
ICT/FCT Probe
Current Rating (Amps): .05Voltage Rating (VDC): 15Recommended Duty Cycle: 1 sec. On (min.), 5 sec. OffTest Center (mil): 1,000Test Center (mm): 25.40Full Travel (mil): 62Full Travel (mm): 1.57Recommended Travel (mil): 50Recommended Travel (mm): 1.27Full Marker Travel (mil): 62Full Marker Travel (mm): 1.57Direction of Rotation: CCWScribed Diameter (mil): 50Scribed Diameter (mm): 1.27Rec. Mounting Hole Size (mil): 468Rec. Mounting Hole Size (mm): 11.89Recommended Drill Size: 15/32 (in) or 11.90 mm
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Product
Line Scan Camera
Linea SWIR
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Teledyne DALSA’s short-wave infrared (SWIR) GigE line scan camera features a cutting-edge InGaAs sensor in a compact package for a wide variety of machine vision applications.This high speed, high resolution camera is the first product in DALSA’s SWIR family. Linea SWIR features a cutting-edge InGaAs sensor in a compact package that is suitable for a wide variety of applications. With exceptional responsivity and low noise, this camera allows customers to see their products like never before. Linea SWIR is available as a 1k resolution camera with highly responsive 12.5 µm pixels, or a 512 resolution camera with larger 25 µm pixels
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Nanomechanical Test Instruments for Microscopes
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1UN-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 0.75 (21.00) - 8.00 (227.00) Long Travel Bead Probe
BPLT-25HF-8
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Product
Spectro UV-Vis Auto Scanning Spectrophotometer
UV-2602
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The new 2 way communication system allows the user, to give instructions right from your computer and gives you the ability to print and record results in an easy to use interface.A 2nm bandwidth gives you the accuracy needed in today's laboratories and its auto adjustment feature makes it easy to work with, providing more answers to scientific problems in less time.
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High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25L-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Radar Scan Conversion Package
SoftScan
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Curtiss-Wright Defense Solutions
This embedded computing radar product portfolio provides ultra-high radar scan-conversion performance using unique graphics processor unit (GPU)-accelerated algorithms. Utilizing the power and performance of today's modern COTS graphics offerings, SoftScan provides unrivalled scan conversion performance with minimal CPU utilization.
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High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1V-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Microscope Cameras
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In contrast to digital cameras for normal photography, microscope cameras are built to meet the demands of high-end science- and research applications. For maximum light sensitivity they use large CCD or CMOS sensors for image acquisition. Color reproduction is often critical, why features like Microscanning or Color-Co-Site Sampling ensure optimal image quality. Due to the lack of a light absorbing color filter monochrome microscope cameras for fluorescence imaging are even more sensitive.
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Product
Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50L-QG-75R
High Frequency Probe
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,637Overall Length (mm): 41.58
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Line Scan Camera
Linea
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Introducing Linea, a CMOS line scan camera that can help you improve your imaging and lower your costs. Linea starts with an advanced CMOS sensor with high quantum efficiency and low noise for better images. Linea is also packed with advanced features to make your machine vision job almost effortless.
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Alternate 0.50 (14.00) - 2.50 (71.00) General Purpose Probe
P2662BG-1R2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
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MEP General Purpose Probes
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm
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Product
Alternate 0.50 (14.00) - 2.50 (71.00) General Purpose Probe
P2662BG-1Q2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1B-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.50 (14.00) - 2.00 (57.00) Non Replaceable General Purpose Probe
A-A-S-R
General Purpose Probe
Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 310Overall Length (mm): 7.87Rec. Mounting Hole Size (mil): 31.5Rec. Mounting Hole Size (mm): 0.80Recommended Drill Size: #68 or 0.79 mm
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Microscope Imaging Software
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Microscope imaging software from Leica Microsystems combines microscope, digital camera and accessories into one fully integrated solution.





























