X-ray Diffractometers
Measure the intensity of diffracted rays.
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X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
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- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
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Reject Station for X-Ray Image Analyser
IV-110I
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IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
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TEL-X-Ometer X-ray System
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X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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X-Ray Line Camera
X-Scan C
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Slim, plug-and-play-type, water-resistant X-ray line cameras for harsh industrial environments.
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X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
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Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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Diffractometers & Scattering Systems
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Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
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X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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X-ray Microscopy
ZEISS Xradia Ultra
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Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications.
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X-Ray Transmittance
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In x-ray transmission (XRT), a sample is irradiated with high-energy x-rays, which are absorbed by sulfur atoms. Measuring the x-rays that pass through the sample provides a measurement of sulfur concentration.
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Dynamic X-Ray Detector
Shad-o-Box HS
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The Shad-o-Box HS family of x-ray detectors are high-performance, high-resolution x-ray imaging devices designed for high speed digital radiography applications. Each model combines our x-ray sensor modules with appropriate readout electronics and a 14-bit digital interface for easy connection to a PC. The high-speed digital connection allows real-time imaging at frame rates up to 66 fps, while the state-of-the-art CMOS technology offers superb contrast, dynamic range, and resolution.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
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Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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Real-time X-ray Inspection Systems
Ultra-Compact™
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Glenbrook Technologies redefines X-ray Inspection with our smallest JewelBox Micro focus x-ray system yet. With dimensions of just 22”W x 26”L, it’s small enough to fit on a standard desk, in an office or small lab. But it’s big in capabilities with >500x magnification , 5 axis manipulator and advanced image processing. To view our product video, please click below the product image to the right.
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X-RAY Cameras Based On CCD
XiRAY
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*High resolution direct phosphor imaging, ideal for Micro CT*Ultra-low readout noise with CCD and especially the new sCMOS sensors*Crystal clear 14 bit/pixel images*Partial readout and binning modes for enhanced sensitivity and higher speed*Non-linearity over full dynamic range <2% (of full scale) to 95% of full scale*External triggering, LVTTL*Low power consumption 6 Watt with Cooling or 2W without*Antiblooming, Enhanced Statistical Extra-Mural Absorption*Radiation hardened, Support of Energy levels 7 to 100keV*Measures just 63 x 63 x 46 mm*Peltier TE Cooled with Heatsink and optional fan
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Advanced 3D Automatic X-Ray Inspection
V810 S2EX
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V810 is "3D Automatic X-ray inspection System" that corresponds to the double side mounting SMT-PCB that is not able to be checked by a transmission-type X-ray machine. It has the ability to detect a wide range of defects, and It have 100% complete defect detection capability in the Hip-defective.And, it is the inspection machine of world's highest level that combines the ability of the ultra-fast test speed and the lowest false call positives further.
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X-ray Inspection System
JewelBox-90T/100T/110T™
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All JewelBoxes deliver precision x-ray images of ultra-high resolution and grey scale accuracy without the aberrations of voltage blooming and image distortion prevalent in other systems.
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Inline 3D-CT Automated X-ray Inspection Systems (3D-AXI)
3Xi Series
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Saki's 3D-AXI (X-Ray) series adds significant inspection capability. The system utilizes Planar Computed Tomography (PCT) providing high precision CT imaging at high speed.
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Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
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SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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X-ray Fluorescence Spectrometers
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Is a non-destructive analytical technique used to determine the elemental composition of materials.
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Energy Dispersive X-ray Spectroscopy
EDS
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Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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X-Ray Flaw Detectors
XXQ/XXG/XXGH Series
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XXQ series are suitable for the material directional of thin iron plate, aluminum, rubber and so on, may get very good picture quality and clarity.
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Material Discrimination X-ray Technology
MDX
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Eagle’s Material Discrimination X-ray (MDX) technology enhances traditional x-ray inspection, providing food processors with unprecedented contaminant detection capabilities.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
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Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
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High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
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Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
