Filter Results By:
Products
Applications
Manufacturers
X-ray Fluorescence
measure of irradated sample's fluorescence radiation revealing it's elemental composition.
See Also: XRF, X-ray Fluorescence Spectrometers
-
product
X-Ray Fluorescence Analyzer
MESA-50
HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
-
product
Continuous Particulate Monitor with X-ray Fluorescence
PX-375
There has been a growing concern regarding particulate matter (PM) pollution and its effects on health. For effective preventative measures, the determination of source PM concentration is extremely important. Therefore, indication of PM and elemental concentrations is critical. The PX-375 analyzer employs automatic sampling, continuous on-line PM quantitative and qualitative analysis for rapid air pollution measurements.
-
product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
-
product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
-
product
Energy Dispersive X-ray Fluorescence Spectroscopy Systems
Energy Dispersive X-ray Fluorescence Spectroscopy Systems
-
product
Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
-
product
Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
-
product
Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
-
product
X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-6000
HORIBA Scientific, a market leader in sulfur-in-oil analysis, announces the launch of the new SLFA-6100/6800 Energy Dispersive X-ray Fluorescence Analyzer, which measures sulfur in oil ranging from 5 ppm to 9.9999%. This new, compact, and accurate analyzer meets the needs of anyone wishing to conform to ASTM D4294, ISO 8754 or JIS K2541/B7995.
-
product
Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer
XEPOS
SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
-
product
Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
-
product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
-
product
Energy Dispersive X-ray Fluorescence Spectrometer
EDX-7000/8000/8100
One EDX over all others The EDX-7000/8000/8100 offers a high level af accuracy and speed in analyzing elements contained in various samples.
-
product
X-ray Fluorescence Sulfur/Chlorine-in-oil Analyzer
MESA-7220V2
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method. A monochromatic X-ray source is used in order to obtain an ultra-low noise background which affords the best detection limits for both sulfur and chlorine.The detector window size was increased to collect more fluorescent X-rays and thus achieve lower level ppm values. This provides excellent, repeatable performance at both low and high concentrations of both elements.By adjusting the angle of the graphite crystal, the excitation beam can be measured to excite sulfur in the sample, increasing sensitivity.
-
product
X-ray Fluorescence
XRF is an elemental analysis technique with unique capabilities including (1) highly accurate determinations for major elements and (2) a broad elemental survey of the sample composition without standards. For example, XRF is used in analysis of rocks and metals with an accuracy of ~0.1% of the major elements.
-
product
X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-60
HORIBA introduces the new standard of transportable sulfur-in-oil analyzers, the SLFA-60. This instrument introduces new software and hardware features to meet the growing changes in the petroleum industry. The instrument has expanded storage of calibration curves and data can be exported using USB output. The measurement range has increased to 0-9.9999 wt% to cover high sulfur crudes and shale oil markets.
-
product
X-ray Fluorescence Spectrometer
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
-
product
Energy Dispersive X-ray Fluorescence Analyzer
X-5000
HORIBA continues it's innovation in the petroleum market by proudly teaming with Olympus Innov-X to promote the X-5000 Mobile XRF Analyzer. The X-5000 is a rugged, fully integrated closed beam portable EDXRF system that offers the power and performance of a traditional benchtop XRF, but is designed for transportable operation. Using a Silicone Drift Detector, low PPM detection limits can be achieved for many elements in a variety of sample types and matrices. Applications include fuels, additives, and wear metal oils to crude oils, water, coke, and coal allow this easy to use analyzer to be a fast, flexible solution to traditional testing methods.Detectable elements to concentrations of 100% are: Aluminum, Antimony, Barium, Cadmium, Calcium, Chlorine, Chromium, Copper, Iron, Manganese, Molybdenum, Nickel, Phosphorous, Potassium, Silicon, Silver, Sulfur, Tin, Titanium, Vanadium, and Zinc.
-
product
X-ray fluorescence spectrometers
SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
-
product
X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
-
product
Wavelength Dispersive X-ray Fluorescence Spectroscopy
Wavelength Dispersive X-ray Fluorescence Spectroscopy
-
product
Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
-
product
Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
-
product
X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
-
product
Energy Dispersive X-ray Fluorescence Spectroscopy
Energy Dispersive X-ray Fluorescence Spectroscopy
-
product
X-ray Fluorescence, XRF Analysis Services
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
-
product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
-
product
X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
-
product
Simultaneous Wavelength Dispersive X-ray Fluorescence Spectrometer
Simultix 15
Multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity.
-
product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
