Test Fixtures
UUT interconnect interchangeable with tester.
See Also: Fixtures, Mechanical Fixtures, Vacuum Fixtures, ATE Fixtures, PCB Test Fixtures, Board Test Fixtures, Bed of Nails, Spring Probes, Test Jigs, Test Probes
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PXI 12x8 RF Matrix 300MHz 50 SMB
40-726A-511
The 40-726A is a 12x8 RF Matrix Module suitable for switching frequencies up to 300MHz (50Ω version). The 40-726A is available in either 50Ω or 75Ω versions with a choice of coaxial connectors. The module is designed to provide a simple and scalable bidirectional matrix for RF frequencies. Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture. This maximizes isolation and RF performance.
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C68-C68-D4 Unshielded Cable, 2X68-Position VHDCI Offset, 1 m
195949-01
68-Pin, Male VHDCI to 68-Pin, Male VHDCI, 50 Ω, Unshielded Digital Cable - The C68-C68-D4 Digital Cable connects NI 6535/6/7, 654x, 655x, and 657x digital instruments with other NI accessories like the CB-2162 Connector Block or SMB-2163 Terminal Block. You can also use it with certain Digital I/O Adapter Modules for FlexRIO, Digitizer Adapter Modules for FlexRIO, Signal Generator Adapter Modules for FlexRIO, and high-speed serial instruments. It is flexible and easily fits around custom test fixtures and other equipment. It is an unshielded, 50 Ω cable.
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Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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Fixture Design
TestEdge offers quick, cost effective test fixture design services for low-speed, full-speed, and high-speed devices. Based on our experience in developing high performance test fixtures for a wide variety of devices, test sockets, and tester platforms, we provide a premium quality test and engineering validation environment for everything from high power (40W) to high pin count to high speed ECL to high speed SerDes (3.25Gb) devices.
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Dedicated Testers
Dedicated Testers are often inexpensive due to their low test point requirements, which allow for a reduction in switch cards, especially when compared with a Universal Tester. Ease of setup is accomplished through the utilization of transfer connectors between the fixture and the machine. However, this can contribute to a higher fixture cost than typically seen with a Universal Test Fixture due to the nature of their construction which is labor intensive.
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Inbuilt External Controller ATE with Touch Screen Features
QT 200NXT
Qmax Test Technologies Pvt. Ltd.
QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software. The vast library support helps you to functionally test host of different IC families. Other features like user-friendly Windows based software, add-on utilities like oscilloscope, RCV meter circuit tracer, etc. makes it a favorite and makes very effective for repairing PCBs without schematic/ circuit diagrams. All these tests are carried out using simple BUT Interface like multipin test clips, probes or custom test fixture
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SHC68-C68-D4, 68-Pin, Male VHDCI to 68-Pin, Male VHDCI, 50 Ω, Shielded Digital Cable - 1m
196275-01
The SHC68-C68-D4, 1m, Digital Cable connects NI 6535/6/7, 654x, 655x, and 657x digital instruments with other NI accessories like the CB-2162 Connector Block or SMB-2163 Terminal Block. You can also use it with certain Digital I/O Adapter Modules for FlexRIO, Digitizer Adapter Modules for FlexRIO, Signal Generator Adapter Modules for FlexRIO, and high-speed serial instruments. It is flexible and easily fits around custom test fixtures and other equipment. It is a shielded, 50 Ω cable and is offered in different lengths.
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Structural Durability Products
Instron offers a wide range of Durability Testing Products such as Controller and Software modules, Hydropuls actuators (linear & rotary), Servo valves, Sensors, Power Packs & Accessories and Test frames & fixtures.
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Brake Test Systems
Giant 8000 Series
Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Non-Destructive Resonant Inspection Drop Test Fixture
RAM-DROP
The Drop Test Fixture, Model RAM-DROP, Resonant Inspection System, allows automated sorting and quality testing of small metal injection molded (MIM), powder injection molded (PIM), additively manufactured, and other small parts by using the Resonant Acoustic Method (NDT-RAM).
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Special leak test, pressure testing machines and systems from TQC
Leak Testing
TQC have supplied automatic leak test / pressure test equipment for over 25 years. The supply has included simple manually connected leak test fixtures to fully automatic, high speed production leak test facility. TQC supply leak testing equipment to meet the customers requirements.
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Efficient And Effective Physical Layer (PHY) Testing Of 10/100/1000Base-T Interfaces
Explore Sifos Technologies’ highly unique, plug’n play 10/100/1000Base-T Ethernet Physical Layer Testing Solutions. Cost Effective and Comprehensive PHY Testing without Scopes, Fixtures, Probes, and Test Signals.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Life Cyclic Durability Testing
Environment Associates can provide everything you need for cyclic durability testing and performance fixturing. Services include mechanical cycling to a position or load, fatigue cycling to a fixed load, rotational torque cycling, and simple push/pull cycling. EA can design your fixture with electro-dynamic, air, or hydraulic assistance to mechanically move your part. All of our fixtures can be manufactured to withstand a wide range of temperature, humidity and vibration inputs. If required, forces can be monitored electronically, using a wide variety of inputs (i.e. strain gages, load cells, rotational transducers, thermocouples, shunts, and more). EA can create holding and check fixtures to perform “pre” and “post” evaluation for dimensional issues that may occur during testing. EA can provide fixtures for single tests run internally for EA test labs and can manufacture fixtures to be purchased directly by the customer for their internal use.
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Custom Vibration Testing Fixtures
Paragon Systems is unique in being able to not only perform your vibration test, but also to design, fabricate and qualify your vibration testing fixtures. Usually all we need from a client is their vibration test profile, a CAD model and the GD&T of the DUT.
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Universal Breakout Test Fixture
CA-323
The CA-323 Universal Breakout test fixture was designed to provide, as the name suggests, a universal test solution for aircraft trouble-shooting. The unit gives the technician the ability to monitor (100) different conductors or open an individual conductor for simulation or measurement. Any avionics component can be extended and in many cases with only a voltmeter and oscilloscope the operation in question of the Unit Under Test can be determined.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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2m BNC Test Cable
16048D
The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
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Power Cord Bending Tester
SW-6
SW-6 Power cord bending tester is fully designed according to the IEC standard, and can also be costumer-sized depends on the samples’ type and the costumer’s requirement. Specifications: • Power supply：AC220V 50/60HZ 12KVA • Control mode: PLC with touch screen and Servo motor. • Test Speed: 10~60times/min (Adjustable) • Test Degree: 0~540° (Adjustable) • Counter: 0~999999 (Can be pre-set) • Weight: 5N,10N,20N. 2Sets. (6Position type will have 6 Sets) • Position: 2/6 • Load Current: 0~20A (Adjustable) • Angle plate: Can check the test situation • Sample fixture: Can be costumer-sized. • Can do power line bending test (The User need prepare sample and power supply ), Can record the number of the sample’s work with load.
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Mach Airspeed Test Fixture
TA-6055A
The TA-6055A is a Mach Airspeed Test Fixture built to support the testing and repair of the 2082 and 2083 series of Servoed Mach Airspeed Indicators (SMASI) used in some Boeing aircraft. These mach airspeeds are synchro driven and require a coarse and fine input for altitude and a third input for airspeed. This test fixture was designed around the test procedure and is interfaced with our TA-1001 panel which provides for two of the synchro sources and two Angle Position Indicators (API).
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PXI Fault Insertion Switch, 6-channel, Two Fault Buses, 10 A
40-192A-012
The 40-192A-012 is a PXI fault insertion switch using solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test
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USB-C® Short Channel Rx Precet. Test Fixture
AUT20098
*Easy swap between CC1 and CC2RP & RD Mode: In the older version of the USB-C full breakout board, users had to manually set the jumper with a short pin. But now users can easily swap between the two by just moving the switch.*In the previous version, the soldering joint of Test Fixture Host Fixture 1A gets worn out quickly from repetitive plug and pull. This newly designed fixture is more durable and users can easily replace the worn out SMA connectors with new ones.*DC-in Jack is upgraded to +5V USB C portA boost in user experience as it makes setting up easier.
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Large Format - Step & Repeat Tester
GATS-8300
The GATS-8300 Tester is one in a series of Test Systems designed for testing multiple-image panel using a Step & Repeat process. Rather than fixture the entire panel for electrical test, you simply fixture for one (or more) images. The GATS-8300 will Step the fixture across the entire panel and Repeat the electrical test at each step.
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
