Highly Accelerated Life Test
Processes a product through extreme temperature, vibration and product tailored stresses to expose design limits.
See Also: HALT
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Product
Accelerated Mobile Pages (AMP) Testing Tool
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Accelerated Mobile Pages (AMP) is a great way to make content on your website accessible in an extremely fast way. To help ensure that your AMP implementation is working as expected , Search Console now has an enhanced AMP testing tool. This testing tool is mobile-friendly and uses Google's live web-search infrastructure to analyze the AMP page with the real Googlebot. The tool tests the validity of the AMP markup as well as any structured data on the page. If issues are found, click on them to see details, and to have the line in the source-code highlighted. For valid AMP pages, we may also provide a link to a live preview of how this page may appear in Google's search results.
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Product
Photodiode Burn-in Reliability Test System
58606
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The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Automotive Test Platform
ETS-800
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Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Product
Electronics Functional Test
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Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
End of Line Test System for Automotive Seats
AS519
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AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Product
Automated Aerospace and Defense Test
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Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Deep Learning Accelerators
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ADLINK’s Deep Learning Accelerators provide GPU- and VPU-accelerated inferencing with embedded, small, and standard form factors. ADLINK’s Deep Learning Accelerators offer high performance, power efficiency and longevity support required of AI applications at the edge, delivering actionable insights at the right place at the right time for industrial automation, transportation, smart city, military and aerospace applications and more.
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Product
Test System
BMS HIL
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The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
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Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Headlamp Test Platform
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Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Product
Highly Sensitive Silica Monitor
SLIA-300
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Highly sensitive silica monitor for ultrapure water management in semiconductor/FPD processes
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Product
UV Accelerated Weathering Tester
TF424
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TESTEX Testing Equipment Systems Ltd.
UV Accelerated Weathering Tester, age tester, to simulate the testing environment of sunlight, rain, and dew to reproduce the effect of sunlight with fluorescent ultraviolet lamps, providing rain and dew with condensing humidity. The aging of the specimens is accelerated by exposing the samples to alternating cycles of light and moisture at a certain temperature.
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Product
Highly Flexible Miniature Cable Assemblies
FlexFit
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Does your application require:- Low resistance to flexure? - Continual movement?- Low weight?- Does it have tight space constraints?Whether you're facing one or more of these issues, FlexFit™ assemblies can provide your solution. The FlexFit™ cable has a stranded center conductor that offers ultra flexibility (>500,000 flexures) with electrical and physical stability.And, its small size (0.052"/1.32 mm OD) satisfies weight and space constraints that can impact ease of installation.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
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The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Product
In-Line RF Test Station
AP770
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ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Rotary Switch Life Tester
CX-1
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Shenzhen Chuangxin Instruments Co., Ltd.
1: The CX-1 Rotary Switch Life Tester is strictly designed according to IEC60669-1, IEC61058-1, GB15092-1-2003 and GB15092.1 Standard. It's mainly used to test the service life of household and similar switch equipment products. 2: This rotary switch life tester connected to the power load cabinet and conduct electrical life test, normal operation and breaking capacity test of the rotary switch. 3: The rotary switch life tester is mainly used to test the all kinds switch
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Product
Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
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AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Product
Advanced SoC/Analog Test System
3650-EX
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Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Accelerate Semiconductor Development With IP-Centric Design
MethodicsIPLM
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Methodics IPLM provides a scalable IP lifecycle management platform that tracks IP and its metadata across projects, providing end-to-end traceability and enabling effortless IP reuse. Learn more by connecting with an IP expert today.
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Product
Acceleration Recorders
SnapShock Plus Series
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Instrumented Sensor Technology, Inc.
The SnapShock Plus (SSP) series data recorders are compact, battery powered acceleration event recorders. The new generation devices offer several improved capabilities over the standard Snap Shock model
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Product
Spectrophotometer For Life Science
BioSpec-nano
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Capable of performing quantitation and purity checking of nucleic acids, quantitation of proteins, and photometric measurements (OD values displayed and printed for specified wavelengths, up to 8 wavelengths). Simply drop 1 to 2 μL of the sample onto the measurement window and press the instrument's Start button (or click the Start Measurement button in the software window), and all steps in the process, from setting the optical path length, measurement, up until the task of wiping off the sample from the measurement window, are all carried out automatically. Troublesome work of moving arm up and down and wiping the sample from the measurement window now unnecessary. Moreover, when using the specialized software, all it takes to perform a measurement, output a report, export data, or carry out other common tasks is to click buttons on the toolbar.
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Product
Communications Test System for Frontline Diagnostics
ATS3000P
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The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
Audio and Acoustic Functional Test Solution
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With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
Power Cycling Semiconductor Life Test System
ITC52300
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The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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Product
Die Test Handler
3112
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Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
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Product
In-Circuit Test Systems For Sale
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Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
Non-standard Constant Acceleration Tester
KRD32 series
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KRD32 series non-standard constant acceleration testing machine is test equipment for military products to simulate dynamic centrifugal motion, dual environmental force centrifugal motion and central high-speed rotating motion.
