Functional Test Systems
See Also: Functional Test, Functional ATE
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Product
Curved Needle Test Systems
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Instron’s Curved Needle Testing System is designed for evaluating surgical and wound closure needles through two specialized testing methods: curved needle puncture testing (per ASTM F3014) and cantilever bend testing. These fixtures assess key performance attributes such as sharpness, coating integrity, and flexural strength. Compact and efficient, the tabletop system conserves bench space while delivering robust functionality. Powered by Bluehill® Universal software, it offers comprehensive control over test execution, data collection, and reporting, along with access to a wide range of built-in calculations.
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Product
Automatic Hardness Testing System
AMH55
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Maximize your productivity and easily measure impressions on various surface conditions for a wide number of applications with LECO’s new AMH55. The AMH55 introduces LECO’s innovative Cornerstone® brand software to our hardness testing platforms, for increased usability, simplified reporting, and streamlined analysis times. Supporting accurate and efficient microindentation and Macro/Vickers hardness testing in fully automatic, semi-automatic, and lite configurations, the AMH55 is a valuable resource for users needing precise and productive hardness testing while tailoring the data and results to their needs.
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Product
Engine Test Systems
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Today''s engines and components require testing in a repeatable manner over a wide variety of conditions, ensuring that the final manufactured product consistently meets customer demands for performance and durability. The need for engines to be both economical and - above all - environmentally friendly, places fresh challenges on developers.
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Product
Meter Test Systems
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We offer a huge variety of products for meter testing. From the smallest device with the size of a single-phase meter up to customized semi-automatic systems with more than 40 test positions.
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Product
Full-Featured Life Cycle Test System
LCV
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Configurations for testing to industry standards: IEC, SAE, BCILife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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Product
Battery Test System
WBCS3000Ls / WBCS3000Le
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Low current model8 channel battery cycler (expandable up to 128 channels)max. voltage range : ±5Vmax. current range : - Model WBCS3000Ls : ±10mA - Model WBCS3000Le : ±100mACustomized specification is available.
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Product
LST-2000 Laser Safety Test System
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Hangzhou Everfine Photo-E-Info Co., LTD
The system can measure the spectral power distribution, radiant power, radiant energy, apparent light source size, pulse energy and other parameters of the laser light source, and classify the laser light source according to the standard IEC 60825.1. Because laser measurement involves more condition parameters, limit calculation and judgment process is complex, so this system adopts systematic design, the measurement complexity is simplified, the hardware adopts componentization module, users only need to follow the software prompts, carry out the corresponding steps of operation can accurately measure the effective radiation value under the corresponding conditions. The software calculates the relevant reachable emission limits and automatically classifies the laser product's safety level.
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Product
Chloride Test System
C-CL-2000
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The C-CL-2000 produces results on-site, within minutes that are accurate and comparable to expensive laboratory tests. It measures the electrochemical reaction of a weighted sample placed in an extraction liquid. It automatically shows a temperature compensated reading of percent of chlorides on its digital display. A wide range - from 0.002 to 2% chloride by weight - is covered.
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Product
PCIe® Gen5 NVMe SBExpress Test System
SBExpress-RM5
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The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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Product
Fiber Optic Test System
OPTOWERE-S100 (Fiber Optic Test System)
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The frame of FOTS system consists of the Main control part and the Slot mounting part. The Main control part is in charge of control and interface of the system and the Slot mounting part can hold up to maximum 8 slots, which are modularized according to each function and come out in five kinds. This integrated test system is designed to help manage the test and measurement related to optical communication and component. And the modular architecture of FOTS allows for customized configuration so that the slot of LD Driver, 2 channel VOA, 1 X 4 switch, WDM EDFA and C + L – Band ASE Source can be chosen according to user’s necessities. Main control part and each function module are run by effective and multi-functioned system control program in the base of high speed remote interface, GUI display and the discriminative high speed driving of module and system. This system can provide variety manufacturing and laboratory applications such as general quality test and reliability test of optical component and optical signal transmission test through efficient linkage with other system.
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Product
Engine Emission Test System
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By adding transient operation functions (self-learning/predictive driving + each test mode performing) to measurement•control panel, Ono Sokki can build up engine test system that can perform transient mode tests supporting worldwide gas emission controls including TRIAS, FTP, EURO, and ISO. (e.g. WHDC, NRTC).This system provides good reproducibility for Transient mode test. Delay compensation and rotation inertia compensation function have greatly improved as well as self-learning / predictive driving function.Automatically processes from measurement to data output of test result, in conjunction with gas emission analyzer, tunnels, gas emission particle measurement system, smoke meter, etc.
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Product
Universal Test System
LS6601A
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LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Product
Test System
NFC Xplorer
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The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Product
Functional Verification Platform
Riviera-PRO
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Riviera-PRO™ addresses verification needs of engineers crafting tomorrow’s cutting-edge FPGA and SoC devices. Riviera-PRO enables the ultimate testbench productivity, reusability, and automation by combining the high-performance simulation engine, advanced debugging capabilities at different levels of abstraction, and support for the latest Language and Verification Library Standards.
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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Product
Microtester Test Systems
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With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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Product
Resistivity Test System
RMS-1000
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Accurate and powerful performance. - Possible to get much accurate resistivity value by taking 8 raw data. - Good to check ohmic contact by flowing forward and reverse current.2. We provide various sample mounting board and probe head and tips.3. We have an optional item which can measure in variable temperature. - Room Temperature ~ 300dC.
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Product
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
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High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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Product
Three-phase Fully Automatic Test System
TS33
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Calmet Smart Calibration Devices
The Calmet TS33 portable test system consists of a three-phase reference meter of accuracy class 0.02%, 0.04% or 0.1% and an integrated three-phase current and voltage source up to 3x120A/600V. The TS33 is designed for analysis of complete metering installations and local mains conditions.
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Product
Functional Test Fixtures
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Test Head Engineering's Custom Functional Test Fixtures range from simple to extremely complex. Typically, our customers do their own wiring and programming, but we will complete the job right up to the customer's requirements, including offering turn-key control and test programming through our partners.
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Product
CMOS/CCD Production Test System
System 1828
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The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Product
Pneumatic Horizontal Shock Test System
KRD12 series
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The KRD12 series shock test system is used to measure and determine the horizontal impact resistance of a product or package, and to evaluate the reliability and structural integrity of the test unit in a horizontal impact environment. The system can perform conventional half-sine wave, post-peak sawtooth wave, or trapezoid wave shock test to realize the shock energy that the product is subjected to in the actual environment, thereby improving the product or packaging structure.
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Product
Mechanical Shock Test System
BW-MST-E5000
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The Mechanical Shock Tower develops the kinetic energy electromagnetically. An iron core "bullet" is attracted to the magnetic core of the solenoid by the dense magnetic field that is created as current flows through the field coil of the shock tower. As the bullet is drawn into the center of the magnetic field the acceleration increases exponentially as the gap reduces to zero on impact causing the high impact shock
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Product
Functional test
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Maschinenbau Haldenwang GmbH & Co. KG.
Test bench for small vehicles with 2 wheelsRoad load simulationDetermination of maximum speedMeasurement and evaluation of speed, speed, distance traveledDisplay of wheel power at test speedDisplay on your PC monitorExpression of test resultsCustomer and vehicle databaseEuro system console MCD 2000 with switching elements for roller setPort for external devices
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Product
Suspension Component Test Systems
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Acoustic quality, vehicle dynamics and stability, and driver comfort play an increasingly important role in the development of new chassis and suspension systems – both passive and active. Noises in suspension components can cause customer dissatisfaction and lead to high warranty costs and are difficult to diagnose especially on historically-used, noisy hydraulic test rigs. The MB Suspension Component Test Rig (SCTR) enables dynamic simulation of real road excitations and synthesized waveforms, performing industry-standard Force-Velocity and Force-Displacement tests and low speed friction tests, and assessing other NVH and structure-borne noises for comprehensive performance characterization and sound and vibration analyses on a wide variety of chassis components.
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Product
AC Resonance Test System
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KV Hipot Power Test Equipment Co.,Ltd
KVXZ-270kVA/270kV Variable Frequency AC Resonance Test System is applied for AC dielectric test for electric equipment.
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Product
Special Function I/O Expansion
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This add-in module is 40 times faster than USB 1.x implementations and supports signaling up to 480 Megabits per second (Mbps). It is based upon the NEC uPD720101 USB 2.0 host controller that is supported by a wide range of operating systems including Windows and Linux.
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Product
System Level Test
SLT
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As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.





























