Primary Current Injection Test
-
Product
VLSI Test System
3380D
-
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
-
Product
NI-9265, 4-Channel C Series Current Output Module
779334-02
-
4-Channel C Series Current Output Module - The NI‑9265 is ideal for interfacing and controlling industrial current-driven actuators at high rates. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing outputs to ensure safety and avoid driving actuators at system power on. The NI‑9265 requires an external power supply and includes a channel‑to‑earth ground double isolation barrier for safety and noise immunity.
-
Product
Desktop PCB Test System
BOARDWALKER 9627
-
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
-
Product
High Current Probes
-
*Low internal resistance to minimize arching*PogoPlus bias ball design*High current optimized base material and plating*Higher temperature spring design*Specialized high current tip geometry
-
Product
NI Real-Time Test Cell Reference System
780590-35
-
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
-
Product
Primary & Secondary Current Injection Testing Sets
-
Primary current injection kits are used to test and commission Circuit Breakers, Bus Bars, CTs, Relays, MCCs, PCCs etc. These are also used for high current injection and simultaneously measuring voltage drops and hot spots in bus-bar joints, Circuit Breaker Contacts etc.
-
Product
Photodiode Burn-in Reliability Test System
58606
-
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
-
Product
Test System
BMS HIL
-
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
-
Product
NI-9203, 200 kS/s, ±20 mA, 8-Channel C Series Current Input Module
779516-01
-
200 kS/s, ±20 mA, 8-Channel C Series Current Input Module - The NI‑9203 is intended for high-performance control and monitoring applications. It features programmable input ranges and variable connectivity options. To protect against signal transients, the NI‑9203 includes a channel‑to‑earth ground double‑isolation barrier (250 Vrms isolation) for safety and noise immunity.
-
Product
Environmental Control System Test Platform
-
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
-
Product
Bottom Electrode SMD Test Fixture
16197A
-
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
-
Product
Test Fixture Kits
-
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
-
Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
-
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
-
Product
Automotive Electronics Functional Test System
TS-5020
-
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
-
Product
High-Voltage Differential Probe, 100 MHz
N2790A
-
Use the N2790A 100-MHz high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2790A probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to 1,400 V of differential voltage and 1,000 V of common mode voltage.
-
Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
-
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
-
Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131C
-
The Keysight 85131C is an 81 cm (32 in) long1 semi-rigid cable with a 3.5 mm female2-to-PSC-3.5 mm female connector. Cable frequency range is DC to 26.5 GHz with a return loss of 17 dB or better. Insertion loss is 0.43 * sqrt(f) + 0.3, where f is frequency in gigahertz, for the test port connector and 2.5 dB at maximum frequency for the device connector. Phase stability of the semi-rigid / flexible cables is specified with a 90-degree bend using a 4 to 3-inch radius. Stability1 of the 85131C is less than 0.06 dB, and phase is 0.16 * f + 0.5, where f is frequency in gigahertz.
-
Product
Primary Injection Test Systems
-
Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
-
Product
Wireless Test Standards Software
-
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
-
Product
High Current Probes for EV Battery Packs
-
Up to 500Amps - customized connections - battery pack charging.
-
Product
Standard -1.44 ( 41.00) - 4.50 (128.00)High Current Probe
HCP-13B
-
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Communications Test System for Frontline Diagnostics
ATS3000P
-
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
-
Product
High Voltage Probe, 100:1, 3.7 KVpk, 500 MHz
10076C
-
The Keysight 10076C 3.7 kVpk, 100:1 passive probe gives you the voltage and bandwidth you need for making high-voltage measurements. Its compact design makes it easier to probe today's small power electronics components, and its rugged construction means it can withstand rough handling without breaking.
-
Product
NI-9253, 50 kS/s/ch, ±20 mA, 24-Bit, 8-Channel C Series Current Input Module
785989-02
-
50 kS/s/ch, ±20 mA, 24-Bit, 8-Channel C Series Current Input Module - The NI-9253 is an 8-channel analog input module for ComapctDAQ and CompactRIO systems. Each channel provides a ±20 mA input range and 24 bits of resolution at a 50 kS/s sample rate. The NI-9253 has several diagnostic features to ensure your system is operating nominally at all times with open channel detection, power supply detection, and configurable thresholds. The NI-9253 has eight LEDs to indicate the status of each channel and the power supply so that a user in the field can easily validate that the system is operating normally. The NI-9253 also features a number of programmable hardware filters. By choosing the specific Butterworth and comb filters for your application, you can significantly reduce the noise in your system.
-
Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
-
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
-
Product
Dielectric Material Test Fixture
16453A
-
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
-
Product
Memory Test System
T5230
-
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
-
Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
-
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
Flash Memory Test System
T5830
-
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
-
Product
Modular Functional Testing Platform
OTP2
-
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
