Laser Systems
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Product
Monitoring Systems
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Sensors alone do not provide the complete answer to measuring vibration and using the data to better understand machine health. Monitran offers a short range of monitoring systems that can be used not only to measure vibration but to display values, constantly watch the levels and take action in case of excess and dangerous vibrations.
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Product
Saturable Spectroscopy Laser Lock Module
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A compact, mechanically-robust laser frequency reference.
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Product
Test System
DA-1 ATS
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The DA-1 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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Product
FPGA Test System
DO-254/CTS
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DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.
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Product
Inspection System
Pixie
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3-D Metrology for automation. Pixie is a standard system for automated optical quality inspection. Pixie can be configured with 2 to 5 servo driven axis movement and the high-speed measurement capabilities make it suitable for inline and stand-alone solutions.
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Product
Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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Product
Lithography System
JetStep X500
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The JetStep X500 panel lithography system is optimized for volume manufacturing of high-end AICS and advanced packaging panels. The system incorporates a large field exposure system with advanced features to meet the challenging requirements encountered in production of AICS or panel level packaging, such as; fine resolution to 3µm with large depth of focus (DOF), high overlay accuracy of ±1µm, automatic magnification compensation with independent x and y magnification adjustment of ±100 ppm, and automatic handling of panel substrates of various dimensions, thicknesses, and levels of warp.
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Product
Portable Security System
Sensor-1
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The portable security system that fits in the palm of your hand. Sensor-1 detects real-time changes in motion and alerts you when your important items move. Operates independent of the mobile app. Communicates with smartphones, tablets, laptops and desktops.
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Product
External Cavity Diode Lasers
ECDLs
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High-performance ECDLs and injection-locked optical amplifier.
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Product
Laser Distance Measurer
NT-8580
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Ideal for measuring factory layout, facilities safety area, trench depth, roof area for solar, building maintenance, ceilings maintenance, road works, water level, sheet rock measurement.
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Product
Uninterruptible Power Systems
CMN Series
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The Clary CMN Series Uninterruptible Power Systems are built specifically for fixed and mobile military applications.
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Product
AI Inference System
MIC-743-AT
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AI Inference System Accelerated by NVIDIA® Jetson Thor™. Embedded with NVIDIA® Jetson T5000™ / Jetson T4000™ up to 2070 TFLOPS (FP4). Supports 1 x QSFP28 (T5000: 4 x 25GbE / T4000: 3 x 25GbE).
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Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Product
Power Supply System
PL516
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The PL516 is a high sophisticated, high density, programmable 16-channel with full redundancy low-voltage power supply system. Using the remote monitoring and control features it can be used to supply a large numbers of external load- channels with high power consumption also over long distances.
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Product
Enhanced Vision Systems
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Elbit Systems of America’s Degraded Visual Environment (DVE) solution uses intuitive 3D grid symbology along with a helmet tracker to provide critical helicopter/tilt-rotor cues during brownout operations. This system, which is an upgrade to the head-up display installed on many military helicopters, removes weight or drag penalties by eliminating nose-mounted sensors. The helmet tracker provides numerous ancillary benefits such as depicting the other pilot’s Line of Sight (LOS) for improved crew coordination, as well as providing the ability to slew weapons or optical payloads to the pilot’s LOS, hands-free and heads-up.
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Product
UV Aging System
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King Design Industrial Co., Ltd.
*Comply with IEC 61215, IEC 61646 UV Preconditioning Test Specification *Radiation intensity is linear adjustable; the intensity deviation is guaranteed within ±15% on the testing surface *Test cabinet is equipped with timer controller in a time range of 0～9999 hr, as well as time accumulating and power-shutdown data-saving ability * Using the standard PT-100 membrane thermo-transmitter to accurately control temperature in testing process
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Product
Pump Test System
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This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Product
Vison Inspection System
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High Speed stroboscopic 2D vision inspection system for die attached and wirebond quality in back-end semiconductor processes. User friendly HMI for easy recipe creation and management. Able to configure with various defect identification module. (Strip Mapping, Inker, Scriber, Pucher, Bristle, Laser wire cutter and Laser clip bonding cutter.)
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Product
Concrete Inspection System
StructureScan Pro
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Geophysical Survey Systems, Inc.
StructureScan Pro is a versatile concrete inspection system offering a wide variety of antenna options for concrete and other applications. Based on the SIR 4000 controller, the StructureScan Pro provides the GPR professional with solutions to any scanning situation.
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Chamber Simulator System
BroadSim Anechoic
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Built on our proven BroadSim platform, BroadSim Anechoic allows users to accurately simulate real-world GNSS environments in their Anechoic Chambers. BroadSim Anechoic has 32 individual RF outputs enabling the system to drive 16 dual-frequency antennas. Revolutionary features like automatic antenna mapping, automatic time delay calibration, and automatic power loss calibration are what make BroadSim Anechoic the most advanced Anechoic Chamber simulator on the market today.
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Process Systems & Sensors
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WTW offers a wide range of instruments for process control – from digital to analog, from wastewater to drinking water.
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Probe System for Life
PS4L
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The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Product
Supported Test Systems
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TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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System Solutions
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The modular and flexibly expandable system solutions from aixACCT Systems ensure that you always measure the characteristics of your samples independently of the operator and according to the specifications of the entire system.
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Product
MXI X-Plane System
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X-Plane technology provides high resolution, high magnification CT functionality anywhere on the board - without cutting the board.
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Product
Laser Distance Meter with Compass
TRUPULSE 360(B)
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F. W. Breithaupt & Sohn GmbH & Co.KG
*Scope magnification 7-times*Field of view 100m/915m distance*LCD Display*Range to non-reflecting targets 1.000m*Range to reflecting targets 2.000m*Accuracy in range ± 30cm (± 1m to weak targets; shown in display)*Accuracy in slope ± 0,25°*TruVector Compass Technology*Accuracy of compass ± 1° typical*RS 232/Serial interface (Model B: with Bluetooth)*IP protection IP54
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Product
Laser Trimmer PAL
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MicroContact's unique passive matching technology allows fast matching of all resistors in a single trimming pass, making it much more economical and faster than conventional solutions.
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Product
Dilution-Extractive System
ML675
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The Teledyne ML®675 dilution-extractive system can be used in 40CFR75, 40CFR60, 40CFR63, and process control applications. In this system, sample is prepared for analysis by diluting stack gas with clean, dry instrument air at the probe location. Since no moisture is removed with dilution, measurements for SO2, NOx, CO, THC and CO2 are made on a wet basis.
