Integration
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Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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ITA, I2 Micro ICon, 168 Position
410130101
The i2 Micro iCon ITA is capable of holding up to 168 QuadraPaddle contacts. Its sleek, 0.8” footprint increases the horizontal stackability. The 30 degree U-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 0.77 in. The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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Wi-Fi / Bluetooth / GPS Tester
MP5010
*Wi-Fi/Bluetooth/GPS Mobile Phone Tablet Integration Tester
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Integrated Couplers/ Harmonic Mixers
These waveguide bandwidth integrated coupler/mixers are designed to allow phase locking or signal monitoring of compact millimeter wave systems. RF inputs and outputs are on opposite sides of a thin wafer to obtain minimum insertion length. These devices use silicon Schottky barrier beam-lead diodes on a rugged stripline circuit. Nominal coupling value is 10 dB. For coupling values greater than 10 dB, non-directional coupler models are available (consult factory).
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Gas Chromatography
Gas chromatography (GC) helps scientists ensure the safety, quality, and purity of our food, air, water, and pharmaceuticals; determine the composition and consistency of fuels and chemicals; and test for controlled substances in criminal investigations and sporting competitions.Agilent gas chromatography systems combine innovative technology, Instrument Intelligence, and legendary reliability to meet the needs of analytical testing and research laboratories across a broad range of applications, such as environmental, food safety, forensics, energy & chemicals, and more. Integrated Instrument Intelligence helps avoid GC problems before they affect chromatographic performance to optimize uptime, cost of ownership, and confidence in results.
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Switches-SP6T
Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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Integrating Sphere
The simpler way to measure the total luminous flux of lamps and luminaires is to use an integrating sphere photometer system. It is a device to perform spatial integration of flux optically, thus the total luminous flux can be measured with one fixed photometer head and measurement can be instant. An integrating sphere photometer is calibrated with a total luminous flux standard lamp. A test light source is measured by comparison to a standard lamp calibrated for total luminous flux.
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System Integration
Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.
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PCB IMID01, 100 mV/g, IEPE, 2-Pin, Accelerometer, Industrial Vibration Sensor
784175-01
The PCB IMID01 is an industrial Vibration Sensor designed for permanent installations. This sensor helps you acquire sound and movement data with supported PXI Sound and Vibration Modules, C Series Sound and Vibration Input Modules, and USB-based Sound and Vibration Devices. The PCB IMID01 features a sensitivity range of 100 mV/g and uses the Integrated Electronics Piezo-Electric (IEPE) current excitation. The sensor supports the IMI Industrial Accelerometer Cable as well as the MIL2M-Breakout Cable.
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Integrated I-V Test Systems
The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Tunable Wavelength Systems (OPOs)
NT230 Series
Integrated in a single compact housing diode pumped Q-switched laser and OPO system offers hands-free, no-gap tunning from 193 to 2600 nm. Producing high up to 10 mJ energy pulses at 100 Hz pulse repetition rate, tunable over a broad spectral range, NT230 series lasers are realiable solution for many laboratory and OEM applications.
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Pulse Evaluation Systems
*Intuitive, user-friendly handling*Integrated wide-range power supply*Easily programmable output functions*Devices for monitoring standstill, speed, direction, slip, and frequency*Switching relays and transistor outputs, scalable analog output
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PXI - Test System
We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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Modulation Distortion Up To 53 GHz
S95070B
S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Manometric Gas Sorption Analyzer
IMI-FLOW
The IMI-FLOW combines the manometric gas sorption capabilities of all IMI analyzers with flowing mode operation and integrated mass spectrometry. Manometric mode offers high accuracy isotherm determination to 200 bar, while the flowing mode provides complete control of pressure, composition and flow rate. Integrated mass spectrometry allows downstream gas analysis for TPD and advanced methods.
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Vibration Test Chamber Elevator Mechanism System
Guangdong Test EQ Equipment co., Ltd.
- Structural Design: Monolithic construction with seamless TIG welding for durability and aesthetics. Lever-driven door lock mechanism.- Smart Control System: Features a Chinese/English-language color LCD touchscreen HMI + high-performance PLC, powered by TESTEQ's proprietary software for automated, intelligent, and user-friendly operation.- Energy Efficiency: Incorporates TESTEQ's patented "Static Balance" technology, reducing energy consumption by over 30% during low-temperature stabilization.- Vibration Integration: Elevator Mechanism: Wireless remote-controlled for alignment with horizontal/vertical vibration platforms.- Advanced Sealing: Custom flexible connectors ensure airtight integration between temperature/humidity chambers and vibration platforms.
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SoC Integration At RTL
Before logic synthesis, STAR enables full implementation capabilities towards IP and connectivity insertion with a real-time monitoring of the integration progress. This enables SoC creation in minutes and maximize design reuse from existing projects.
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EMP- EMI Solutions
We have spread our business tentacles and are operating smoothly, through our DELHI NCR branches which are having facilities like Mechanical and Electronic Designs, Manufacturing, Integration and Testing for development and production activities. We have the In-house Environmental and EMI pre-compliance test facilities which guarantee better quality products.It is our pledge to serve the society with more efficient and qualitative output through our open mindedness and creative solutions. We continue with ardent hope that our products will definitely gather more and more momentum with the defence, the private industrial bigwigs and international companies as well. Growing the business tentacles in India, Concept Shapers are embarking upon the drive of expansion of the resources at its disposal. Our resources are our strength, be it human or the space. We firmly believe in the doctrine of ‘Engineering Innovative Concepts to configure a better tomorrow’.
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Integrating Spheres
Artifex Engineering GmbH & Co. KG
We offer integrating spheres made from a special polymer suitable for the wavelength range 250nm – 2.5 µm. For longer wavelengths in the range 700nm – 20 µm, a gold coating on a rough, metallic surface is used. Since lasers in this spectral range are usually also high power, we use solid copper as a thermally conductive substrate material. By choosing the size of the integrating sphere, the overall sensitivity of the system can be adjusted. In addition, the detector is independent of inhomogeneities in power density and polarization. The detector is also independent of the incidence location and angle of the laser radiation.
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Multiplying Current Output D/A Converters
Analog Devices offers a wide range of high precision, multiplying current output (IOUT) D/A converters (DACs) that feature ±1 LSB INL and DNL specifications, from 12-bit up to an industry-leading 18-bit resolution. Our portfolio includes single and multiple D/A converters in small packages with parallel or serial SPI interfaces. Multiplying current output R-2R D/A converters allow for an external amplifier that’s optimized for specific applications and that does not require reference buffering, which enables high linearity. The SoftSpan™ feature allows software selectable output spans, therefore eliminating the need to add precision gain stages and the associated external jumpers, precision resistors, and amplifier circuitry. Integrated precision resistors allow for reference inversion, bipolar offset, and offset and gain adjustment.
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Integrating Spheres - Luminous Flux Measurement For LEDs And Lamps
Konica Minolta Sensing Americas, Inc
One of the most important tests in light measurement is the assessment of the total radiant power or luminous flux of light sources using integrating spheres. An integrating sphere’s inside surface is coated with a diffusely reflecting material which guarantees complete integration and homogenization of the emitted radiation. The integrated light is then measured at the detector port.
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Integrated Function Tester for Inductance Ballast
UI2001B
• Measure input parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components. V range: 10.0~300.0V, A range: 0.010~2.000A, F range: 45~65Hz • Measure output parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components Lamp voltage range: 10.0~450.0V, Lamp current range: 0.010~2.000A • Accuracy: ± (0.4% reading+0.1% range+1 digit) • Can test every kind of curve, print both data & curve • Communication interface available for PC, running under Windows98/2000/XP/Vista
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Compact OTDR
◇ 5.6-Inch outdoor-enhanced touchscreen, 7.4V/4.4Ah Lithium battery◇ Event Dead zone as lower as 1.5meter◇ Combined multi-dynamic range and wavelengths◇ Muti measurement mode, support Touching LCD and pressing keys◇ Warning function could prevent OTDR module from being damaged by optical signal in fiber.◇ Realtime measuring function, convenient to monitor the splicing process◇ Integrated 10mw Visual Fault Locator◇ Support English/ Chinese input, adopts friendly input interface, totally simulate the computer keyboard input ◇ Integrated with 8GB internal memory, more than 80,000 groups curve storage◇ PC remote access and control function is available, which support the printing work of the measurement report
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500 MHz Active Differential Probe
AP033
Fully Integrated: With the ProBus™ interface, the AP033 becomes an integral part of the oscilloscope. The probe sensitivity and offset can be controlled from the oscilloscope front panel, the probe front panel, or by using remote control commands (GPIB or RS-232). Sensitivity, offset, input capacitance, and common mode voltage range are displayed on the oscilloscope screen. When used with a LeCroy digital oscilloscope, no external power supply is required.
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OpenSpace® OpsCenter™
Kratos Defense & Security Solutions, Inc.
- Unify management across ground station in single product- Monitor and control RF equipment, track health of IP networks and assure RF signal quality- Troubleshoot faster by correlating analytics across the ground- Integrate and automate operations with REST APIs- Store data in a common database using a unified structure
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MIL-STD-1553 LabVIEW SDK
Avionics Interface Technologies
Certified “Compatible with LabVIEW” PnP Driver - Includes high level LabVIEW VI’s for controlling AIT MIL-STD-1553 InstrumentsCompatible with LabVIEW Real-Time (Including NI Linux Real-Time) - Includes documented APIs with source code examples for LabVIEW (VI), C, C++, & C#/.NET - Integrates with AIT’s Flight Simulyzer software (share XML bus configurations between API’s and Flight Simulyzer) - Support provided by AITs industry leading applications engineering team
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Test Solutions For Integrators
Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.
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High DC Breaking Capacity (10A) rYelays
D-BX5 Series
Heavy duty relays for demanding applications. Integrated magnetic arc blow-out function and contact gap 2mm for higher DC breaking capacity.
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Fault Injection and White-Box Testing
VectorCAST/Probe
VectorCAST/Probe is integrated with the full family of VectorCAST tools allowing probes to be inserted during Unit, Integration, or System Testing. The probe insertions are controlled by the same technology that controls our code coverage instrumentation, which ensures that the probes function correctly regardless of the compiler, target processor, or run-time environment.
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ABex Terminal Module with Integrated 32x4 Matrix for NI PCIe-657x DPI Cards
ABex TM-6570 DPI
The ABex TM-6570 is an ABex terminal module to interface with NI PXIe 6570 / 6571 cards.In combination with the NI PXIe 6570/6571 it features a 32 channel Digital Pattern Instrument (DPI) and a 32×4 matrix, which could also be configured as a dual 16×4 matrix.As a DPI in combination with the NI PXIe 657x it offers 32 channels with up to 100Mhz, which can be individually connected and disconnected from the ABex front connector or routed to the ABex analog bus.
