Debug
See Also: Debuggers
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Product
Debug Fixture
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With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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Product
Multipurpose Debug Board For EC
DB30 x86 Debug Module
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The DB30 x86 Debug Card is designed for debugging of COM Express modules with FFC (FlexFoil Cable) debug connector. It includes an 80 port for Power on and Self-test (POST) via I2C interface, interface to SPI Flash for BIOS update, interface to EC for Embedded Controller (EC) update, Power and Reset buttons, and Status LEDs and Test Point for various debug tests.
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Product
Debug Hardware
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To record your digital and analog signals, just press start. You can fill your entire computer’s memory with data so it is easy to capture lengthy or rare events.
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Product
Debug Adapters
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One thing is sure in the life of an embedded developer - your next microcontroller development board will be fitted with a different debug connector to the one used in your previous design.
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Product
DDR5 Protocol Debug And Analysis Solution
U4970A
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The DDR5 solution bundle provides a systemized hardware, probing, and software solution for DDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Product
DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
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NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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Product
Functional/Protocol Debug and Analysis Reference Solution
DDR4
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Highest confidence in measurement accuracy! Industry’s fastest triggering and data capture for DDR4 analysis, test, and debug.
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Product
Graphical Debugging for Verilog, VHDL, and C++ Simulators
BugHunter Pro
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BugHunter uses the SynaptiCAD graphical environment and supports all major HDL simulators. It has the ability to launch the simulator, provide single step debugging, unit-level test bench generation, streaming of waveform data, project management, and a hierarchy tree. The unit-level test bench generation is unique in that it lets the user draw stimulus waveforms and then generates the stimulus model and wrapper code and launches the code. It is one of the fastest ways to test a model and make sure that everything is working correctly. The debugger also has exceptional support for VCD waveform files.
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Product
ATCA CO1 AC-DC 1 Slot 1U
AdvancedTCA® CO1
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The AdvancedTCA® CO1, 1-slot chassis, DC version is an entry card into the ATCA world. It allows to build dedicated applications based on a single front board or to do bring-up / debugging of a front board in a lab environment.
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Product
Quickly Upgrade RF ATE Testers
MP5800 / MP5806
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*MP5800 Quickly Provides 3380 / 3650 RF ATE Test Capabilities*MP5800 and 3380/3650 hardware and software are fully integrated*Provide complete and user-friendly RF / Digital debug tools*Provide a complete solution for IOT applications*Provide API for production automation software*Integrate Zimmer 3380/3650 to provide RF/Digital comprehensive ATE test solution
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Product
Test RTM with Ethernet SFP
VR300
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Sundance Multiprocessor Technology Ltd.
The VR300 is a Test RTM, typically used during firmware and software development and debugging cycles on the VF360. The rear panel contains two mini-USB connectors, a Dual mini-SAS (SFF-8088) connector and a SFP case.
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Product
JTAG Test Procedures
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Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete “turn-key” service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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Product
Aeroscope
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Wireless Oscilloscope. A wireless, ultra-portable oscilloscope with impressive specs – debug circuits in their natural environment.
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Product
PCI-Express Live Insertion Extender
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The PCIeEXT16HOT enables PCIe x16/x8/x4/x2/x1 boards to be rapidly tested, removed and swapped without having to reboot or power down the host system enabling rapid production testing and engineering debug. The hot insertion, current reporting, overcurrent indication and limiting and voltage margining capabilities make this board the highest performance PCIe bus extender in the industry.
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Product
Oscilloscope
2542C-MSO
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The 2540C Digital Storage and Mixed Signal Oscilloscope (MSO) Series delivers advanced features and debug capabilities for a wide range of applications at an entry-level price point. With up to 200 MHz bandwidth in a 2-channel configuration, each model offers a maximum sample rate of 1 GSa/s, and a maximum memory depth of 14 Mpts. In addition, these oscilloscopes provide an 8” color display with 256 levels of color grading combined with a high waveform update rate up to 60,000 wfms/s, which allows the instruments to capture infrequent glitches with excellent signal fidelity.
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Product
File Import Tool For Importing And Converting STIL, WGL, VCD/EVCD Vectors
DIOEasy-FIT
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Marvin Test Solutions' DIOEasy-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD files to a Marvin Test Solutions' digital instrument file format. DIOEasy-FIT works in conjunction with Marvin Test Solutions' DIOEasy waveform display and editor software which provides an efficient tool set for developing, debugging, and executing digital test vectors for all MTS dynamic digital instruments.
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Product
3U Rackmount Appliance for PCI Express® Gen5
R300-G5 Pro
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Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols.
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Product
Resistive & Capacitive AC Load Bank
RCD
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RCD AC load banks are used to test the REAL working condition of UPS, rectifier, inverter and etc who are loaded by non-linear or electronic load with non-constant resistance such as computer, networking equipments and etc. Through the accurate detection of its output and power quality, users could avoid the inadequate loading capacity or cause pollution to power grid, so as to guarantee supply security. JUNXY RCD load banks leading power factor loads are created to debug power supply system parameters such as its crest factor test.
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Product
Debug Probes
J-Link and J-Trace
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SEGGER Microcontroller GmbH & Co. KG
SEGGER J-Links are the most widely used line of debug probes available today. They've been proven for more than 10 years with over 250,000 units sold, including OEM versions and on-board solutions. This popularity stems from the unparalleled performance, extensive feature set, large number of supported CPUs, and compatibility with all popular development environments.
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Product
ESPI Analysis Application
TP601010
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First released by Intel in June 2013, the Enhanced Serial Peripheral Interface (“eSPI”) is designed as a replacement for the Low Pin Count (“LPC”) bus. eSPI supports communication between Embedded Controller (EC), Baseboard Management Controller (BMC), Super-I/O (SIO) and Port-80 debug cards. eSPI was available in the Sky Lake chipset (2015) and is available in the Kaby Lake [current] chipset. Cannonlake will support eSPI and is slated for release the second half of 2017. Icelake is scheduled for release in 2019 and it will mark the first chipset when eSPI becomes mandatory.
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Product
Thermal Testing And Analysis
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Response Dynamics Vibration Engineering, Inc.
We have consulted on thermal issues ranging from conduction issues in TECs, thermal radiation modeling, and countless air cooled system issues relating to system performance, vibration, and acoustics noise. We use a wide array of thermocouple instrumentation, thermal imaging, flow measurements, as well as finite element analysis and analytic modeling to measure, design, and debug thermal and related issues. We often work on customer products in our Response Dynamics lab where we characterize the system, engineer solution options, and prototype solutions. We then work with the customer to work the winning solution into their quality control and manufacturing process.
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Product
Multipurpose Debug Board
DB40-HPC Debug Module
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The DB40-HPC Debug Card is designed for debugging of COM-HPC modules with FFC (FlexFoil Cable) debug connector. It includes an 80 port for Power on and Self-test (POST) via I2C interface, interface to SPI Flash for BIOS update, interface to EC for Embedded Controller (EC) update, Power and Reset buttons, and Status LEDs and Test Point for various debug tests.
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Product
Fifo Serial Analyzer
FSA32
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FSA32 is a Windows based protocol analyzer for debugging serial asynchronous communication. FSA32 uses the standard COM ports of a PC and does not require any other hardware except for the physical connection to the line.
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Product
BMC Card
SOM-RM10
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ASPEED 7th Gen AST2600 BMC Card, OCP RunBMCv1.5 ASPEED 7th Gen AST2600 Server Management Processor. Up to 2GB DDR4 on-board, 128MB SPI flash on-board, 1GbE LAN for mainly connectivity & VGA 800x600 for easier on-site debug.
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Product
Graphical Circuit Interaction
XJAnalyser
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XJAnalyser is a powerful tool for circuit visualisation and debugging. It provides a graphical view of JTAG chains, giving you complete control, on a pin-by-pin basis, of both pin state (either driven as an output or tristated as an input) and pin value (either high or low when driven), and it has the facility to run SVF and STAPL / JAM files.
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Product
Trace Extensions
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Trace based debugging adds a powerful set of features to complement and enhance your existing debug tools. Many modern devices include a trace port which is capable of providing real-time, non-intrusive information about program flow and data operations. This can be used to work out where code has been, how long things took, to analyze task switches, interrupts, and to generate code coverage reports. If you think of traditional debugging as a series of snapshots, then trace-based debugging is a video with timestamps.
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Product
VPX Interposer
VPX850
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The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Product
CCIX
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The CCIX® Consortium was founded to enable a new class of interconnect focused on emerging acceleration applications such as machine learning, network processing, storage off-load, in-memory data base and 4G/5G wireless technology. CCIX is a high performance, low latency interface that is based on PCIe Physical layer, up to speeds of 32GT/s. Teledyne LeCroy provides a range of Protocol Analysis tools to support development and debug of CCIX based devices.
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Product
68 Pin Breakout Interface
VSI-Breakout-68
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The VSI-Breakout-68 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
