Accelerators
increase speed of an object.
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Ozone Test Chamber
EKT-2001OZ-HCSTX
Designed and manufactured in accordance with ASTM D1149, ISO1431 & JIS K6259 standards. Providing precise and accurate ozone (OZ) concentration environment for rubber and polymer test. Widely applied to (1) Accelerated ageing research (2) Quality control and assurance tests and (3) R&D laboratory formula experiments for cracking resistance.
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Lattice SensAI Studio
Graphical interface based tool to help users built accelerated machine learning applications quickly. Select from a range of models pretrained to cover popular use cases, bring in your own data for additional training, validation the quality of training using TensorBoard, compile for Lattice’s FPGAs*Model Zoo with variety of models based on multiple architecture*Easy to use labeling, training, and compilation GUI*Docker container provided for installation on your own machine or server*Free license
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PCIe 4.0 Ethernet Controller
BCM57508
The BCM57508 200G PCIe 4.0 Ethernet Controller builds upon the success of the widely-deployed NetXtreme E-Series architecture by combining a high-bandwidth Ethernet controller with a unique set of highly-optimized hardware acceleration engines to enhance network performance and improve server efficiency.
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Solutions
Discover cutting-edge design prefabrication solutions that streamline construction workflows, enhance modular building efficiency, and accelerate project delivery through advanced digital tools and BIM integration.
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Non-standard Constant Acceleration Tester
KRD32 series
KRD32 series non-standard constant acceleration testing machine is test equipment for military products to simulate dynamic centrifugal motion, dual environmental force centrifugal motion and central high-speed rotating motion.
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Mezzanine System
3560
ECM P/N 3560 provides four independent I2C channels. For ease of development a PCA9564 interface IC converts parallel data to I2C serial communication. Additionally an LTC1694 I2C accelerator IC decreases the rise time of the passively pulled up I2C bus allowing for greater capacitive loading or higher bus speeds. Each channel is comprised of SCL, SDA and two Grounds.
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Pressure Accelerated Aging Test Chamber (HAST)
Guangdong Test EQ Equipment co., Ltd.
- Hyper-Accelerated Aging: Combines high temperature, 100% RH, and pressure to simulate decades of environmental degradation in days.- Precision Control: Triple-redundant PT100 sensors and PID algorithms for<1% pressure fluctuation.- Safety Systems: Auto-pressure release valves, hydrogen gas detection (for battery/polymer tests), and emergency cooling.- Corrosion-Resistant Build: SUS316L stainless steel interior, PTFE-coated seals, and ceramic-coated heaters.- Smart Connectivity: IoT-enabled remote monitoring, predictive maintenance alerts, and compliance with FDA 21 CFR Part 11 data integrity.
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Actuator
MC-G/2.10
Actuator for precise operation of accelerator handle of motor cycles and 3-wheeler.
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FPGA Image Processing (IP) Development Kit
ProcVision
Gidel’s Vision Pro Development Kit is an optimal solution for developing,validating, demonstrating and evaluating Image Processing (IP) andpipeline designs on FPGA.The suite is designed to provide a complete and convenient envelop enablingthe developer to focus strictly on the proprietary image processingdesign. The entire Vision Pro flow is within a single FPGA, independentof the final target application(s). The Vision Pro flow is composedof a pipeline that streams simulated data to the user image processingdesign under test (DUT) and then captures the design’s output streamfor displaying, storing, analysis and/or co-processing on host software.The entire process is performed on a single FPGA without the need foradditional peripheral connectivity or tools.Vision Pro suite is plug-and-play enabling the developer to begin at oncethe IP design development and validation. A simple design example providesthe developer immediate hands-on familiarization with the systemflow and supporting tools. The final design can be ported to any IntelFPGA device or other vendors’ devices (FPGA or ASIC) by replacing basiclibraries. To significantly reduce compilation time, initial design developmentmay be on a small FPGA device and later compiled for the targetdevice(s). The target implementation may use any FPGA board. For a fullImaging/Vision system solution, Gidel offers a number of off-the-shelfgrabbers and FPGA accelerators that are designed to utilize these imageprocessing blocks and Gidel Imaging Library (GIL).
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GS1 Acceleration Sensor
AGS11151
Panasonic Industrial Devices Sales Company of America
GS1 Acceleration Sensor
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DRAM Module Test
We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market.
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Evaluation Board
emPower
SEGGER Microcontroller GmbH & Co. KG
The emPower eval board provides a comprehensive set of SEGGER's middleware products, accelerating the start of any embedded project. SEGGER's embOS real-time operating system is at the heart of the evaluation. Furthermore, evaluation versions of the file system emFile, graphics library emWin, emUSB Host & Device, and TCP/IP stack embOS/IP (including web server demo) enable full use of the available emPower peripherals. emPower also features a J-Link OB, an on-board version of SEGGER's market-leading debug probe J-Link, which includes drag & drop programming and COM-Port support. There are three expansion interfaces to easily connect additional modules. Each connector provides I2C, SPI, UART, GPIO/timer, analog input and power. A display adapter connector enables the connection of small TFT displays. The emPower board is powered by USB only. Current consumption drawn strongly depends on the application and connected peripherals. Idle consumption is approx. 85 mA.
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Precision Amplifier
TI Precision Labs is the electronics industry's first comprehensive online classroom for analog engineers. The on-demand curriculum pairs theory and applied lab exercises to deepen the technical expertise of experienced engineers and accelerate the development of those early in their career. This free modular curriculum includes over 30 hands-on trainings and lab videos, covering analog amplifier design considerations with online course work.
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NVIDIA® Jetson Nano™ Edge Inference Platform
DLAP-211-Nano
- Deep learning acceleration with NVIDIA® Jetson Nano™- Compact fanless system 148(W)x120(D)x49.1(H)mm- Wide temperature range from -20°C to 70°C
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Vibration Meter
Shenzhen Graigar Technology Co.,Ltd.
Vibration meter (also called vibration severity) uses Piezoelectric Acceleration Transducer transfer the vibration signal in to electrical signal, analyze the input signals, and show the Acceleration, speed, shift of the vibration. It is widely used in the lines of Power, petrochemical, machinery manufacturing, metallurgy, vehicles, etc.
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Pass-by Noise System
Vehicle Pass-by Noise TestingA very flexible Pass-by noise test system for characterizing the overall acoustic signature of any vehicle. Our solution brings a simpler, more effective and cheaper way to obtain accurate velocity and acceleration results for the Pass-by Noise test.
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Vibration Meters
Dalian Taijia Technology Co.,Ltd
● Acceleration 10Hz-1KHz 0.1-400m/ms² 0.3-1312ft/ms² 10Hz-10KHz 0.1-400m/ms² 0.3-1312ft/ms²● Velocity 10Hz-1K 0.1-400mm/s 0.004-16.0inch● Displacement 10Hz-1KHz 0.001-4.0mm 0.04-160 mil● Accuracy:＜5%● Auto power off● RPM(revolution):5-100000r/min● Frequency:0.1 to 10KHz● Metric/imperial conversion● With RS232C interface● Max hold● Operating conditions:0-+45℃(32℉-104℉),≤90%RH● Power supply:4x1.5V AAA(UM-4)battery● Battery indicator: low battery indicator● Dimension : 124x62x30mm● Weight: 120g(not including battery)● Optional accessories: RS-232C cable & software:●1.USB adaptor for RS-232C● 2.Bluetooth interface
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Fault Simulation
Concurrent Fault Simulator
TurboFault combines high performance, versatility and accuracy. It is highly competitive with hardware accelerators for classical test fault grading. It supports synchronous and asynchronous designs at the gate level, including tri-state gates, latches, flip-flops, single and multi-port RAMs, complex bus resolution functions, and User Defined Primitives (UDPs).
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HALT/HASS Testing
HALT HASS Chamber
AST applies stresses (such as temperature and vibration) to products well beyond its normal use environment. This type of testing is done to determine product operating and destruct limits. These stresses are applied as the product is functionally tested and continuously monitored for failures.Highly Accelerated Stress Testing (HALT) and Highly Accelerated Stress Screening (HASS) are two types of accelerated stress testing. These types of tests are commonly used to eliminate design problems, helping to develop a robust, mature product prior to market introduction. It can also be used to screen out infant mortality issues prior to shipment.
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EasyEXPERT Group+ Software (for B150x Mainframe)
Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Personal Dose Alarm Meter
DP802i
DP802i type X - gamma radiation detector - as a super humanized design and enhanced personal dose monitoring is mainly used for X, gamma rays and hard beta rays of radiation protection monitoring, suitable for nuclear power station, the accelerator, isotope applications, industrial X, gamma NDT, radiation source treatment, medical treatment, cobalt gamma irradiation, radioactive laboratory, nuclear facilities around environmental monitoring field, timely, ensure to my warning safety of staff; The instrument can be also measured dose rate and cumulative dose. It USES reactive new single chip microcomputer, the compensation for the probe, the instrument GM counting pipe has a wide measurement range, better energy response characteristics, and with overload directives and protection function.
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Infiniium EXR-Series Oscilloscope: 2 GHz, 8 Channels
EXR208A
2 GHz on all 8 channels, 8 instruments integrated in one, hardware accelerated plotting, and fully upgradeable to 2.5 GHz
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Embedded Motherboard supporting MXM Graphics Module with 8th/9th Generation Intel® Core™ i7/i5/i3 in LGA1151 Socket
AMSTX-CF Series
Embedded graphics enables system developers to boost the performance of a wide range of workloads, including medical imaging, image analysis, compute acceleration, and artificial intelligence (AI). Leveraging graphics processing units (GPUs), embedded graphics can be used to increase application speed and accuracy, as well as decrease latency. Many embedded system developers are using embedded graphics solutions in real-world applications, such as medical, manufacturing, and traffic management, along with other embedded segments.
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SSD Test Dystems
MPT3000HES / MPT3000HES2
Compact, highly efficient SSD test solution allows customers to accelerate time to qualification for their new designs and time to market for their latest storage products.
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Vacuum UV Testing Services
The system consists of a high-vacuum chamber, multi-ported,equipped with deuterium and xenon sources for accelerated ageing. The specimen to be irradiated is mounted on a temperature-controlled platen, which, in turn is mounted on a XYZ J manipulator. Provision is made for the measurement of emissivity and absorptance without breaking vacuum and at the operating temperature.
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Ozone Test Chamber
EKT-2001OZ-HCLSX
Designed and manufactured in accordance with ASTM D1149, ISO1431 & JIS K6259 standards. Providing precise and accurate ozone (OZ) concentration environment for rubber and polymer test. Widely applied to (1) Accelerated ageing research (2) Quality control and assurance tests and (3) R&D laboratory formula experiments for cracking resistance.
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Ethernet to CAN Bus Gateway
YAV90090
• High-performance Arm Cortex-M3 MCU with 512 Kbytes Flash, 120 MHz CPU, ART Accelerator, Ethernet P/N STM32F207IEH6• USB 2.0 connector for serial data transfer (reserved for factory use)• Connections for CAN, and power supply via 4-pole Weidmüller connector• Reboot and reset of the device to factory defaults with a reset button• Plastic casing for benchtop operation• LEDs for device status and power supply• Voltage supply from 8 to 30 V
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Testing & Measurement Services
Delserro Engineering Solutions
Delserro Engineering Solutions is your complete source forHALT/HASS, Accelerated Life Testing, Environmental Testing, Lead Free Solder Joint Reliability Testing, Linear andNon-Linear FEA, Computational Fluid Dynamics (CFD)
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ALD Research
Veeco’s ALD Research page is a hub for the latest thinking in atomic layer deposition. It brings together experimental data, modeling insights and collaborative breakthroughs that help engineers stay ahead of the curve. Whether exploring new chemistries or solving complex process challenges, this resource is designed to inform, inspire and accelerate thin-film innovation.
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Digital Accelerometer
ZET 7052-N
Digital accelerometer ZET 7052-N is equipped with a compact sensing element and is designed for linear acceleration and vibration acceleration variable constituent measurement via three mutually perpendicular planes. Small weight of sensing element (1,5 g) considerably reduces self-mass load and compact dimensions (8,5×8,5×8,5 mm) enable use of the digital accelerometer ZET 7052-N for vibration measurements in systems with small active area.
