Measuring Microscopes
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD W-Series
The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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3D Measurement Arm
FaroArm
The FARO Focus3D is a high-speed 3D laser scanner used for generating point clouds and capturing detailed 3D images for documentation purposes.
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Testing & Measuring Meters
Bionic Scientific Technologies
Coming with sturdy construction, user-friendly features and high quality sound and noise measurement.
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Tactile Measuring Devices
You want precise results easily, quickly and flexibly? We have the right tool for you with our tactile measuring devices. Benefit from the broadest probe portfolio on the market and get efficient software solutions for data transmission, data evaluation and data export with the Tactile Suite® and the Fischer DataCenter. Whether coating thickness measurement or materials testing: Discover the right solution for your application and your industry.
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NanoModeScan M² Measuring System
This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Scanning Electron Microscope
E5620
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Manual Vision Measuring Machine with Probe
SVM II P
Product development, 2D scanning, quality inspection, such as watch, electronic connector, hardware, stamping, quality inspection, such as watch, electronic connector, hardware, stamping, spring and circuit board, etc.
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Analog And Digital Sensor Measurement Data For CAN Applications.
K- AN8 KIT
This K-AN8 (8 analog + 4 digital input) kit contains everything needed to get the K-AN8 set up and tested on a work bench.To help with connecting sensors to the analog and digital ports the K-BoB enables easy connection with BNC connectors.Influx K-Cal is easily connected via the Kvaser LeafLight interface and Kvaser T-CANnector. (Using the Kvaser T-CANnector to power up the K-AN8 (at the desk) and terminate the CAN bus).
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Super high temperature hall effect measurement system
Super high temperature hall effect measurement system that is useful to flow gas into chamber with sample. - Newly developed furnace that makes it possible to increase over 800 and use for measuring hall effect. - Gas flow control system in order to flow various gas. - Sample holder for high temperature. (keep the good contact on 800) - High Temperature control system (DC power) On condition of specific temperature with gas flow , new semiconductor materials have been developed to see electrical property's change.
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Additional Test & Measurement Hardware
Additional Test & Measurement Hardware by electro-PJP
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PORTABLE COORDINATE MEASURING MACHINE
CMM
The HandyPROBE arm-free probing system generates high-accuracy measurements (accuracy of up to 22 µm), and outperforms traditional portable CMMs on the shop floor. The HandyPROBE portable CMM is currently used on the production lines of major players from the automotive, aerospace and manufacturing industries.
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Measurement Solutions
Accurate performance measurement is vital in module production. Final quality control with an IV tester is the last step in the production process before a solar module leaves the factory. halm offers module testers that are able to measure all available module technologies and cater to various factory layout requirements.
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3D Measuring Systems
Measurement systems for mobile, laptops, tablets and other specific electronic equipment, can be achieved using hi-tech materials, such as Rohacell (as used in Aerospace Industry). innco systems 2D and 3D positioning systems are custom designed to meet each new challenge, for mobile phones to wireless network equipment.
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Measurement
Encoder
Encoder is used for measuring the relative position (displacement), displacement velocity and direction by means of optical angular or linear displacement sensors (encoders) connected to the ADC input channels.
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System for Linear and Angular Displacement Measurements
System for linear and angular displacement measurements based on digital sensors of ZETSENSOR series can be used for vessel parameters control in the case of roll impact.
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Scienlab Measurement And Control Module
SL1064B
The Measurement & Control Module SL1064B is a rack-mount gateway for CAN- and LIN-buses with up to 6 channels. It can be used as a configurable communication interface between Scienlab Battery Test Systems and devices under test (especially their BMS) as well as additional components using CAN communication.
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Atomic Force Microscope
3DM Serirs
Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Spectral Light And Color Meter w/ Flicker measurement
BTS256-EF
Spectroradiometer for the illuminance (photopic, scotopic, melanopic), spectrum, light color, color rendering index, and flicker. Cosine field of view illuminance measurement for accurate evaluation of extended illumination. Flicker measurement. Spectral measurement technology, required for LED light, color, color rendering, color effects. Photodiode for synchronization to pulse width modulated light and flicker measurement.
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Coordinate Measuring Machines
StentCheck®
High performance multisensor CMM with Integrated Werth Zoom® optic with magnification 0.7x – 6.8xRotary/Tilt Axis with high speed air bearing rotary axisRotary OnTheFly for fast measurementsContour image processing for fully automatic measurements of complex geometrical elements with sub-micron repeatabilityIntegrated goniometer (tilting axis) allows for the measurement of non-cylindrical geometriesUnique lighting design optimized for measurement of stentsTemperature compensation included
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Non-Contact (Pulse-Voltage Excitation Method) Ultra-Low Sheet Resistance Measurement System
PVE-80
*No damage measurement by non-contact Pulse-Voltage excitation method*Easy to measure & carry around, Removable stage plate*Easy operation and data processing by PC with Software*Measurement result can shown by 3 types of measurement unit (Sheet resistance[Ohm/Sq], Electric conductivity[S/cm], Electrical conduction[S])*Pulse-Voltage excitation method : Pat. No.5386394 Joint development with Chiba Univ.
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Measurement, Communications & Testing
Process & Analytical Instruments division of AMETEK
Measurement Communications & Testing provides the design, integration and installation of critical communication systems, workflow, life-safety solutions and calibration instruments for temperature, pressure and process control. It also is a leader in level measurement devices, continuous position sensors, hardness testers, force measurement devices and retractable cord reels. In addition, it offers a line of weathering test instrumentation along with laboratory and outdoor testing services.
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Open Air Radar Level Measurement
Drexelbrook’s line of open air radar products offer superb resolution and accuracy for the demanding applications. This line of instruments features FMCW (Frequency Modulated Continuous Wave) technology to provide the strongest signal at the measurement surface providing the best return signals even with agitated liquids.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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Universal 3D Measurement Software
Metrolog
Get a real performance accelerator for your 3D measuring devices and more.Not only does Metrolog X4 architecture benefit from current computer and OS technologies significantly increasing the performances and metrology software throughput, but it also simplifies your day-to-day measurement workflow.
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Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Measurement Sensors For Network Analyzers And Recorders
Measurement sensors for network analyzers and recorders
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Measuring Devices For Nanoindentation
With our measuring devices, you can determine the mechanical properties of thin coatings reliably and accurately. From protective paint coatings to hardness of PVD coatings: We have the right solution for you. We offer you powerful and easy-to-use measuring instruments for the laboratory and production. You can choose from a wide range of accessories to adapt your device to your individual requirements.
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Surface Profiler Measurement System
SP series
SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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Total Flux Measurement Systems
LED’s and Luminaires must be characterized and tested for brightness and color, for production quality control and also for R&D. The Gamma Scientific Total Flux Measurement System combines our accurate Radoma Spectrometer and an integrating sphere for total flux (total power) and color measurements of LED, micro LED and Luminaires. Measurement parameters include spectrum, lumens, total power, peak and dominant wavelength, CRI, CCT, FWHM and other optical properties.
