Test Scripts
are a sequence of executable instructions automating testing.
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Product
Deoxynivalenol Testing Solutions
DON
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Deoxynivalenol (DON) is also known as vomitoxin because of its impact on livestock through interference with animal growth and acceptance of feed. DON has been implicated in moldy corn toxicosis of swine. DON is often present with other mycotoxins and has been isolated from grains and feeds throughout the world at levels as high as 92 ppm. Because of concerns about DON, the United States FDA has instituted advisory levels of 1 ppm for wheat products for human consumption, 5 ppm for grain products for most animal feeds and 10 ppm for grain products for cattle feed. The European Community has regulations for DON levels that range from less than 0.2 ppm in processed cereal based foods for infants and young children to less than 1.75 ppm for unprocessed wheat.
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Product
Aircraft Test Set
CA-2100S-07
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The CA-2100S-07 is a bench mounted, modularized and computer based test set used to service all types of aircraft electronics. It simulates the aircraft environment and replaces a myriad of specialized test fixtures found in the industry.
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Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Manual Material Testing
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Is ideal for tests requiring very small movement, like switch tests. The tester also features a reversible base plate, allowing the tester to be used on uneven or obstructed surfaces. The highly visible EL display and plain language menus in eight languages make programming fast and easy. Both force and displacement values are displayed plus user-selectable data; high/low setpoints, peak, memory data, etc.
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Product
Functional Test Service
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Testing House provides all Software and Hardware needed to implement a complete Functional Test.
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Product
In‐Circuit Test Fixtures
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Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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Product
In-circuit Test
i3070
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The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
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Product
Test Module
FailSim
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FailSim simulates a faulty component and allows the user to quickly and simply improve the actual fault detection of a test program. The result represents a definitive conclusion for tested or untested components.
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Product
EMC Test System
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An electric product might cause the malfunction to other electric appliances by discharging the emission noise from it, or is oppositely caused the malfuction by the emission noise from other electric appliances. The former is checked by the EMI test and the latter is checked by the EMS test. The international standard like the CISPR standard is provided so that such an accident should not happen, and the manufacturer must declare by themselves beforehand that their product meets the standard. The generic name of the EMI test (Electro-Magnetic Interference) of the emission measurement and the EMS test (Electro-Magnetic Susceptibility) of the immunity
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Product
Crack Testing
STATOGRAPH® Product Family
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Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.
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Product
Cannabis Testing
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Sartorius offers a variety of high-quality products that ensure most accurate test results and allow your testing lab to run smoothly at all times. Our products not only support you in performing super-fast determination of your samples’ moisture and weight, but also in the process of safely preparing of your samples for analytical or microbiological analysis. Our software supports your data integrity through enhanced security settings.
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Product
802.11be Test System
IQxel-MX
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Next generation wireless devices Access Points, CPEs and client devices like smartphones or tablets based on the IEEE 802.11be EHT (Extremely High Throughput) standard require stringent RF performance to meet the latest standard requirements.
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Product
DIP Test Clips
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Low-profile fine-pitch chips, desnely populated boards, or vertical boards, Pomona test clips connect you with confidence.
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Product
Test Adapter
cPCI/VME/VME64x
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The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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Testing Aerospace Motors
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Magtrol designed this Custom Motor Test System for the testing of various aerospace motors for both commercial and military applications.
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Product
Test Hook Probe
CX-S11
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Used on enclosures prior to accessibility testing. The test hook is ¨hooked〃 into vents and seams in the enclosure & then pulled with a force (usually 20N).
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Product
CAM/TRAC Test Kits
Series 47
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The VP Series 47 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 47 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those wanting to provide their own ITA Interface.
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Electromagnetic Testing
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Xiamen IDEA Electronic Technology Co., Ltd.
Is the process of inducing electric currents or magnetic fields or both inside a test object and observing the electromagnetic response.
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Temperature & Humidity Testing
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Environment Associates is outfitted with multiple chambers to suit all types of temperature and humidity testing needs, including: table-top, standard-reaching, fixed or portable walk-in chambers, and if needed, drive-in chambers. All Environment Associates test chambers are equipped with separate data-acquisition equipment for temperature and humidity monitoring. Our temperature and humidity chambers can be readily equipped with specialized data acquisition to digitally record chamber conditions and the test article at multiple data points. Many of our temperature and humidity chambers are equipped with high-performance, maximum-size compressors to produce superior ramp rates equal to or greater than 15°C per minute.
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Hardness Testing Devices
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Institut Dr. Foerster GmbH & Co. KG
NewSonic’s hardness testing devices test hardness in a nondestructive way using the UCI method (ultrasonic contact impedance). The testing procedure enables quick and mobile measurements (1-second type) to supplement traditional hardness testing. The devices feature compact measurement probes which can also be used in difficult testing positions and component geometries. The areas of application include incoming goods inspection, mix-up checks, production controls, quality assurance, weld seam inspection, cut edge checks, maintenance of built-in components, as well as the replacement of dynamic hardness testing devices in the case of thin materials (below 50mm, e.g. boilers, pipes)
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PIM Testing
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Rosenberger Hochfrequenztechnik GmbH & Co. KG
Passive Intermodulation (PIM) is a non-linear response of two or more signals of different frequencies mixing together in a passive device, e.g., antenna, cable, con- nector or splitter. Today, PIM has become a very serious, and challenging issue for mobile operators, equipment vendors, and component manufacturers due to frequency planning in modern communication networks, the usage of high-power transmitters and the usage of more sensitive receivers in base stations. If a PIM with sufficient magnitude generated from a transmitter falls within an adjacent receiver channel, it causes serious interfe- rences to the base station receiver and will significantly degrade the network quality of service.
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Product Safety Testing
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Low Voltage and Machinery Directives Product safety is everyone's concern and covers a wide area. It is therefore no surprise that a great number of European Directives are aimed at safety. Kiwa Dare performs tests and measurements in the area of Low Voltage and Machinery Safety for many years now.
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Product
Java Test Platform
JUnit 5
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JUnit 5 is the next generation of JUnit. The goal is to create an up-to-date foundation for developer-side testing on the JVM. This includes focusing on Java 8 and above, as well as enabling many different styles of testing.
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Semiconductor Test Platform
Diamondx DxV
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The Diamondx DxV semiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions that is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop:
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Product
In-Circuit Testing
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If you are looking for in-circuit test applications, equipment or advice, our experienced engineers can help you. Whatever your fixturing requirements or special software features, our long history of work in this field means that we have probably seen and done it before.
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In-Circuit Testing and Test Engineering
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5184 Test NodesHPUX or Windows60 Mhz ASRU Frequency Counter, Timer10 Mhz Clock, 6 Mhz data ratesVector Test for VLSI, PLCC & ASICSTestjet and VTEP Vectorless TestingAdvanced Boundary ScanSilicon Nails AvailableSeries V upgradeable
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Twist Testing
STT
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The STT Shaft Twist Tester is a system designed for quickly testing of twist structures and/or twist-freed condition on shafts in seconds.
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Test Contactor/Probe Head
cBoa
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cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Product
Test Antennas
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Lumistar provides small, lightweight portable fixed antennas for Test applications. They are available in lower L thru S bands for transmit and receive applications.
